HR001123S0047_ASSERT_Proposers_Day_Slides.pdf
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- Solicitation number
- HR001123S0047
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This briefing document outlines the Advanced Sources for Single-event Effects Radiation Testing (ASSERT) program, a Broad Agency Announcement (BAA) from the Defense Advanced Research Projects Agency (DARPA). The program seeks proposals to develop advanced radiation sources capable of deep penetration depths with space-relevant linear energy transfers for testing increasingly complex 3D heterogeneous integrated electronics. Proposals are due by September 15, 2023 and contracts are expected to be awarded in February 2024. The program includes three phases - design, fabrication, and predictive testing approach development - and supplemental testing options, to be completed over 5 years. Multiple awards are anticipated as procurement contracts, cooperative agreements or other transactions. Proposals must address two technical challenges: deep penetration testing and fine-scale charge tracking capabilities.
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Advanced Sources for Single-event Effects Radiation Testing
(ASSERT)
Proposer’s Day Mark Rosker, MTO Director
Briefing prepared for ASSERT Proposer’s Day
13 July 2023
Approved For Public Release; Distribution Unlimited
Our mission
C4ISR: Command, Control, Communications, Computers, Intelligence, Surveillance, and Reconnaissance PNT: Positioning, Navigation, and Timing
High-performance, intelligent microsystems and next-generation components
Electronics Resurgence Initiative (ERI) 2.0 timeline
Original ERI ERI 2.0: Reinventing microsystems manufacturing for a new age
FY27FY26FY25FY24FY23FY22
NGMM: Next-Generation Microelectronics Manufacturing program
NGMM Phase 0 BAA August 2022
ERI Summit 2023 August 22-24 / Seattle, WA
Progress in microelectronics Monolithic Disaggregation
3DHI
4Approved For Public Release; Distribution Unlimited
3DHI is across our current programs
A-PhI ELGAR FENCE FOCII GRYPHON H6
JUMP / JUMP 2.0 LUMOS MIDAS Minitherms3D NGMM PIPES
ReImagine SPCE THREADS 3DSoC T-MUSIC
Approved For Public Release; Distribution Unlimited3DHI: Three-dimensional heterogeneous integration
Why 3DHI?
SWaP: Size, weight, and power
Supply chain
New approaches to incorporate 3D design and assembly
Security SWaP
Domestic-based processes can be used for assembly
Minimum footprint with maximum efficiency
Source: National Association of Manufacturers
Performance
Optimized devices
Source: Adobe Stock
Disaggregation offers performance advantages
Surpasses monolithic designs in performance, cost, and time-to-market
Source: Intel
Common Heterogeneous Integration and IP Reuse Strategies (CHIPS) program Photonics in the Package for Extreme Scalability (PIPES) program
Component-level IP with AIB interface…
Standard interface (Intel’s AIB) enables modular chiplet ecosystem
…integrated into high-performance System-in-a-
Package (SiP) Assembled MCMs
SERDES
(Intel)
Optical I/O (Ayar Labs)
FPGA Core (Intel S10)
RF A/D
(Jariet or Texas
Instruments)
Integrated chiplets
A/D: Analog / digital AIB: Advanced interface bus
IP: Intellectual Property MCM: Multi-chip module
Source: Intel
NRE: Non-recurring engineering SERDES: Serializer / de-serializer
FPGA: Field-programmable gate array I/O: Input / Output
Assembled PCIe demo platform
Source: Intel / Ayar Labs
FPGA capable of over 1 Tbps and extendable to over 100 Tbps in total
3DHI enables new applications
Demonstrated millimeter wave digital beam forming and integrated arrays from 18-50 GHz
Raytheon 16 element, dual polarized 18-50 GHz scalable tile building block
Heterogeneous integration of compound semiconductors and 3D printed notch antenna array (left) cross-section of array stack (right) by Northrop Grumman
CMOS: Complementary metal-oxide semiconductor GHz: Gigahertz
Millimeter Wave Digital Arrays (MIDAS) program
Making 3DHI electronics real
3DHI technical challenges
• Multi-chip, multi-technology assembly / packaging
• 3DHI interconnects
• Thermal and power
• Tools for design, simulation, and test
• “MOSIS-like” 3DHI prototyping services
Saha et al., Science, Vol. 366, Issue 6461, pp. 105-109, 2019
3D Microelectronics: 3D Self‐Assembled Microelectronic Devices: Concepts, Materials, Applications (Adv. Mater. 15/2020)
Source: Intel
Source: Intel
Source: Gorodenkoff
• Only low-power silicon chips
• No embedded thermal management
Today
MTO thrust areas Electronics Resurgence Initiative (ERI)
3D: Three-dimensional AI: Artificial Intelligence
AC
T Increasing the effectiveness of radiation on target
NA
VI
GA
TE
Embedding accurate positioning and timing
SE
E Gaining an advantage in sensing the physical world
TA
LK Securing communications
SE
CU
RE Overcoming security threats across the entire hardware lifecycle
HA
RD
EN Developing electronics for extreme environments
BU
IL
D Manufacturing complex 3D microsystems
CO
M
PO
SE
Optimizing design and test for complex circuits
CO
M
PU
TE Increasing information processing efficiency at the edge
DE
CI
DE Accelerating innovation in AI hardware https://www.darpa.mil/about-us/offices/mto 10Approved For Public Release; Distribution Unlimited
Approved For Public Release; Distribution Unlimited 11
Single event radiation and 3DHI electronics
Testing at the Speed of Light, National Academies of Sciences, Engineering and Medicine, 2018
Single-event Effects (SEE) 3DHI electronics
Can advanced 3DHI electronics survive
SEE radiation?
Approved For Public Release; Distribution Unlimited 12
ASSERT provides the SEE testing for 3DHI
Reduce the time to design, test, and deploy radiation-qualified 3DHI components
ASSERT insight:
Recent technology breakthroughs enable the use of electron beam and X-ray approaches to achieve:
• Deep penetration
• High linear energy transfers
• Sub-micron scale focusing www.darpa.mil
Advanced Sources for Single-event Effects Radiation Testing (ASSERT)
HR001123S0047
Proposers Day July 13, 2023
Brian D. Nuckols Contracting Officer
DARPA Contracts Management Office
Distribution Statement A. Approved for Public Release; Distribution Unlimited.
Proposers Day Disclaimer
A copious amount of information is made available to potential proposers to clarify program goals/objectives and proposal preparation instructions.
However:
• Only the information/instructions in the BAA counts
• Proposals will only be evaluated in accordance with the instructions provided in the BAA
• Any response provided by the Government in the FAQ that’s different than what is provided in the BAA will be made formal by an amendment to the BAA
• Such responses will make note of an impending BAA amendment
Only a duly authorized Contracting Officer may obligate the Government
BAA Overview
Described in Federal Acquisition Regulation Part 35:
– For the acquisition of basic and applied research
– FAR 35.016 (a): Shall only be used when “meaningful proposals with varying technical/scientific approaches can be reasonably anticipated.”
– BAAs allow for a variety of technical solutions
– The BAA defines the problem set, the proposer defines the solution (and SOW)
DARPA Scientific Review Process
– Proposals are evaluated on individual merit and relevance as it relates to the stated research goals/objectives rather than against one another
– Selections will be made to proposers whose proposals are determined to be most advantageous to the Government, all factors considered, including potential contributions to research program and availability of funding
Government may select for negotiation all, some, one, or none of the proposals received Government may accept proposals in their entirety or select only portions thereof Government may elect to establish portions of proposal as options
BAA Overview, Cont’d
Multiple Awards Anticipated Multiple award instrument types:
– Procurement contract
– Cooperative Agreement
– Other Transaction
Phase 1 (Base Period)
– Design a high energy particle source for SEE testing and to demonstrate that the approach is capable of meeting ASSERT program requirements and metrics.
– 18 months
Phase 2 (Option Period)
– Fabricate and experimentally demonstrate the source concept developed in Phase 1.
– 24 months
Phase 3 (Option Period)
– Develop a predictive SEE testing approach where ASSERT source parameters can be tuned to produce an Equivalent LET that can accurately reproduce the radiation response in a DUT without the need for pre-existing heavy-ion data.
– 12 months Supplemental Testing Options (concurrent to Phase 3 if exercised)
BAA Process/Timeline
1. BAA published: July 5, 2023
2. Proposers Day: July 13, 2023
3. Abstracts Due: August 4, 2023, 4PM EDT
4. Government Abstract Responses: mid-late August 2023
5. FAQ Submission Deadline: August 31, 2023, 4PM EDT
6. Proposals Due: September 15, 2023, 4PM EDT
7. Proposals are checked for BAA compliance
Non-conforming proposals are not reviewed (and cannot be selected)
8. Government conducts Scientific Review Process
Clarification requests may be sent to various proposers
8. Government sends out notification letters: ~ October/November 2023
9. Contracts negotiated & awarded (performance start): ~ February 2024
(can assume 1 Feb 2024 for Pricing)
See BAA for complete date/time information Monitor SAM.gov for any BAA amendment(s)
Eligibility Issues
All interested/qualified sources may respond subject to the parameters outlined in
BAA
Foreign participants/resources may participate to the extent allowed by applicable Security Regulations, Export Control Laws, Non-Disclosure Agreements, etc.
FFRDCs and Government entities:
- Are not prohibited by the BAA from proposing
- Are, however, subject to applicable direct competition limitations
- Are, however, required to demonstrate eligibility (sponsor letter)
The burden to prove eligibility for all such team members rests with the proposer
All elements of a proposal (tech and cost, prime and subs – even FFRDC team members) must be included in the prime’s submission
Real and/or Perceived Conflicts of Interest:
- Identify any conflict/s
- If any are identified, a mitigation plan must be included
Abstracts (1 of 2)
Abstracts are strongly encouraged:
1. They minimize unnecessary effort in proposal preparation and review
2. They reduce the potential expense of preparing an out of scope proposal
The abstract provides a synopsis of the proposed project (tech and budget)
Government will reply by letter with one of two possible responses:
1. Encourage full proposal, and may provide feedback
2. Discourage full proposal, and will provide feedback
Regardless of DARPA’s response to an abstract, proposers may submit a full proposal
DARPA will review all full proposals submitted without regard to abstract recommendation/feedback
Distribution Statement A. Approved for Public Release; Distribution Unlimited. 8
Abstracts must include the following components:
• Cover Sheet
• Innovative Claims
• Technical Approach
• Deliverables
• Cost and Schedule
Submit UNCLASS submissions to the DARPA BAA Website (https://baa.darpa.mil) per the instructions in Section IV.C.2, “Abstract Submission Information,” of the BAA.
Abstracts (2 of 2)
Max of 5 pages
The total page limit does not include the cover sheet (required) or a submission letter (optional) https://baa.darpa.mil/
Full Proposal Ground Rules
KEY POINTS:
Two Technical Challenges: TC1 and TC2 Both technical challenges must be addressed in the proposal
All 3 Phases (Base and two priced Options) and supplemental options must be proposed
An organization/company/individual can be on multiple proposals
Submit unclassified proposals ONLY to the DARPA BAA Website (https://baa.darpa.mil)
Click “Finalize Full Proposal” button (otherwise you have not submitted)
Do not submit classified proposals/information to the DARPA BAA Website
If unsure, please follow the instructions in the BAA for inquiring
Propose to the program (goals, objectives, metrics, schedule, deliverables) the BAA has defined, not to the program you desire https://baa.darpa.mil/
Volume 1: Technical/Management Proposal
– Be mindful of the page limitations (20 pages)
– Be sure to respond to all 12 of the required “Detailed Proposal Information” items
• Technical Approach – is the centerpiece of the technical proposal
• Statement of Work – Organize by Phase/Option, then by Tasks. Define all tasks (what you are doing, not how you are doing it) and deliverables (data, software, and material items, as applicable).
– Pay attention to key technical elements in the “Funding Opportunity Description” that must be addressed in all proposals
Volume 2: Cost Proposal
– No page limitations
– DARPA Standard Cost Proposal Spreadsheet (required for all instrument types)
– Fully detailed cost build-ups/estimates (Prime & Subcontractors)(All instrument types)
• Summary Cost Build-up: By phase and performer fiscal year
• Detailed Cost Build-up: By phase, technical task, and month
– Subcontractor proposals are required (to include SOW)
– No Rough Order of Magnitudes (ROMs)
– Certificate of Current Cost/Pricing Data will be required for any procurement contract award meeting the prescribed threshold (i.e., the adequate price competition exemption does not apply to BAAs)
Full Proposal Preparation
Volume 2: Cost Proposal
– DARPA Standard Cost Proposal Spreadsheet The Government requires that proposers use the provided MS ExcelTM DARPA Standard Cost Proposal Spreadsheet in the development of their cost proposals. A customized cost proposal spreadsheet may be an attachment to this solicitation. If not, the spreadsheet can be found on the DARPA website at http://www.darpa.mil/work-with-us/contract-management (under “Resources” on the right-hand side of the webpage). All tabs and tables in the cost proposal spreadsheet should be developed in an editable format with calculation formulas intact to allow traceability of the cost proposal. This cost proposal spreadsheet should be used by the prime organization and all subcontractors. In addition to using the cost proposal spreadsheet, the cost proposal still must include all other items required in this announcement that are not covered by the editable spreadsheet. Subcontractor cost proposal spreadsheets may be submitted directly to the Government by the proposed subcontractor via e-mail to the address in Part I of this solicitation. Using the provided cost proposal spreadsheet will assist the Government in a rapid analysis of your proposed costs and, if your proposal is selected for a potential award, speed up the negotiation and award execution process.
Use the single TA spreadsheet Do not make changes that are specifically prohibited by the instructions Questions are welcomed. Please direct them to costproposal@darpa.mil
Distribution Statement A. Approved for Public Release; Distribution Unlimited.
Full Proposal Preparation, cont’d http://www.darpa.mil/work-with-us/contract-management
Data Rights
Government desires as few restrictions as possible
If asserting less than Unlimited Rights (e.g., Restrictions):
– Provide and justify basis of assertions using the prescribed format
– Explain how each item will be used to support the proposed research project
– Explain how the Government will be able to reach its program goals (including technology transition)
The proposer (prime) must submit a Data Rights Cert covering the entire team (prime and subcontractors), as applicable
Provide a Data Rights Cert no matter the instrument type being proposed
This information is assessed during evaluations (barriers to transition)
Non-Conforming Proposal Determinations
Failure to submit proposal on time – non-conforming!
– Proposal due date and BAA closing date are the same – so, late is late!
Failure to submit using the correct mechanism – non-conforming!
– Unclassified proposals ONLY to DARPA BAA website
– Classified proposals/information ONLY per “Security Information” section of the BAA
Failure to submit both proposal volumes – non-conforming!
– OT proposals must also include a full cost volume (Cost Realism is an evaluation criterion for all proposals)
– OT proposals must also include a detailed list of payment milestones (Milestone Plan)
Pages beyond the page limitation (tech prop) – additional pages will not be reviewed
ROM/s instead of full subcontract cost proposal/s – non-conforming!
– “I didn’t have time to get the subcontract proposal(s)” will not change the outcome
– “My subcontractor/s would not give me a proposal” will not change the outcome
Missing FFRDC or Government Entity cost proposal – non-conforming!
Communications
Prior to Receipt of Proposals (Solicitation Phase): Follow instructions in
BAA
Typically handled through the FAQ, but see BAA exceptions (e.g., security)
After Receipt of Proposals/Prior to Selections (Scientific Review Phase):
Limited to Contracting Officer or BAA Coordinator (with approval) to address clarifications requested by the review team Proposal cannot be changed in response to clarification requests
After Selection/Prior to Award (Negotiation Phase): Negotiations are conducted by the Contracting Officer PM and/or COR typically tasked with finalizing the SOW (with PI) PM and/or COR typically involved in any technical discussions (i.e., partial selection discussions) Pre-award costs will not be reimbursed unless a pre-award cost agreement is negotiated prior to award
Informal Feedback Sessions (Post Selection): May be requested/provided once the selection(s) are made
– If made on a timely basis (~2 wks after letter), all requests will be accepted
Referenced Links http://www.darpa.mil/work-with-us/contract-management#SolicitationContracting (General DARPA contract management information) (DARPA Standard Cost Proposal Spreadsheet) http://www.darpa.mil/work-with-us/additional-baa (general BAA info pertaining to all instrument types) http://www.darpa.mil/work-with-us/procurementcontracts (info pertaining to contracts) https://acquisitioninnovation.darpa.mil/ (info pertaining to OTs) http://www.darpa.mil/work-with-us/reps-certs (DARPA-specific reps and certs for all instrument types)
Distribution Statement A. Approved for Public Release; Distribution Unlimited.
http://www.darpa.mil/work-with-us/contract-management#SolicitationContracting http://www.darpa.mil/work-with-us/additional-baa http://www.darpa.mil/work-with-us/procurementcontracts https://acquisitioninnovation.darpa.mil/ http://www.darpa.mil/work-with-us/reps-certs
Advanced Sources for Single-event Effects Radiation Testing
(ASSERT)
David K. Abe, Program Manager DARPA MTO
ASSERT Proposers’ Day
07/13/2023
Accelerating the deployment of radiation-hardened electronics for space and strategic missions
Distribution Statement A - Approved for Public Release, Distribution Unlimited
ASSERT Proposers’ Day agenda
Background: Radiation effects in electronics
High energy particles
Coronal mass ejection event https://soho.nascom.nasa.gov/home.html Testing at the Speed of Light, National Academies of Sciences, Engineering and Medicine, 2018
Single-event Effects (SEE)
Single-event effect testing today
Lawrence Berkeley National Laboratory
Texas A&M University
Michigan State University Facility for Rare Isotope Beams
Brookhaven National Laboratory:
NASA Space Radiation Laboratory
• Current SEE testing infrastructure is fragile and oversubscribed
• Heavy ions can achieve high LET or long range in Si, but not both
• Impending capacity and capability gaps for testing 3D heterogeneously integrated (3DHI) electronics
Microsystems
Today Future 2D 3D with dense interconnects
Monolithic integration Disaggregation Silicon Multi-process / multi-material
Packaged after fabrication Packaging no longer distinct
Electronics Resurgence Initiative (ERI) 2.0 timeline
Original ERI ERI 2.0: Reinventing microsystems manufacturing for a new age
FY27FY26FY25FY24FY23FY22
NGMM: Next-Generation Microelectronics Manufacturing program
TA
LK Securing communications
CO
M
PU
TE Increasing information processing efficiency at the edge
DE
CI
DE Accelerating innovation in AI hardware
BU
IL
D Manufacturing complex 3D microsystems
CO
M
PO
SE
Optimizing design and test for complex circuits
SE
CU
RE Overcoming security threats across the entire hardware lifecycle
HA
RD
EN Developing electronics for extreme environments
NGMM Phase 0 BAA August 2022
ERI Summit 2023 August 22-24 / Seattle, WA
ASSERT goals and technical approaches
TC1: Deep penetration depths with space-radiation-relevant linear energy transfers
TC2: Charge tracks with fine spatial resolution
Single Technical Area
Key insight:
Recent technology breakthroughs enable the use of electron beam and X-ray approaches to achieve:
• Deep penetration
• High linear energy transfers
• Sub-micron scale focusing
Program goal: Reduce the time to design, test, and deploy radiation-qualified components by a factor of ten
• 5 mm range
• LETs up to 100 MeV-cm2/mg (worst case space environment)
• Penetration through metallization and packaging
3DHI testing goals
State-of-the-art System-in-Package
Range / Linear Energy Transfer
0.1 mm / 90 MeV-cm2/mg
0.6 mm / 41 MeV-cm2/mg
1.8 mm / 35 MeV-cm2/mg
5 mm / 100 MeV-cm2/mg
(strategic environment)
ASSERT
Ion Beam
2.7 mm
Multiple layers, materials, and complex packaging present challenges for range and high LETs
Active Device 1
Active Device 2
Active Device 3
Shielding
Printed Circuit Board
Technical Challenge 1 (TC1):
Deep penetration depths with space-radiation-relevant linear energy transfers
Technical Challenge 2 (TC2):
Charge tracks with fine spatial resolution
New 3D devices have complex topologies and small feature sizes requiring precise spatial control
J. Chang et al, IEEE Electron Dev. Lett. 40(7), 2019
Super-lattice castellated field-effect transistor
• <0.2 µm diameter beams
• Beam placement with linear and angular precision to selectively probe sensitive areas and isolate faults
3DHI testing goals
A predictive SEE testing approach
Empirical correlation approach Predictive approach
• An alternative source is tuned to reproduce known heavy-ion response in the DUT
• Requires pre-existing heavy-ion data
• Time consuming due to large parameter space
• Source parameters are selected to produce a specified carrier distribution within the DUT
• Does not require pre-existing heavy-ion data
• Requires the ability to compute Equivalent LET (LETE) from the source parameters
ASSERT will require the accurate prediction of heavy-ion responses across a range of electronic devices
DUT: device under test
SEE sources for testing and qualification must produce effects that are comparable to those resulting from high radiation environments
ASSERT program metrics
Metric Units Phase 1 Phase 2 Phase 3
Range(1) mm 5(3) 0.5 5
Maximum Equivalent LET(2) MeV-cm2/mg 100(3) 50 100
Minimum Equivalent LET(2) MeV-cm2/mg 0.1(3) 1 0.1
Spot diameter µm < 1(3) < 1(4) < 0.2(5)
Analog correlation accuracy % -- 80 95
Digital correlation accuracy % -- 70 90
(1) In silicon
(2) At the depth specified by the phase Range metric
(3) Simulation or proof-of-concept experimental data
(4) At device surface
(5) At 5 mm penetration depth
ASSERT program structure and schedule
FY23 FY24 FY25 FY26 FY27 FY28
Final Demo Metrics Eval
Phase 2 Demo Metrics Eval
Phase 1 Demo Metrics Eval
Kickoff Design Review
Proof-of-Concept
• Source design (simulation)
• Feasibility demonstration
Fabrication and Experimental Demonstrations
• Source fabrication
• Initial correlations with heavy-ion data
Predictive Capability
• Expanded correlation studies to include more complex devices
• Develop predictive capability to achieve heavy-ion-equivalent LETs
Interim Review
Interim Review
Phase 1 (18 months)
Phase 2 (24 months)
Phase 3 (12 months)
Technical Goals Charge Penetration Depths (5 mm) Beam diameter (<0.2 µm)
IV&V: Naval Research Laboratory Code 6816 (Optoelectronics and Radiation Effects) Missile Defense Agency (Radiation Hardness Assurance for Parts and Materials)
12Distribution Statement A - Approved for Public Release, Distribution Unlimited
ASSERT program proposal guidelines
• Proposals shall consist of two volumes: Volume I – Technical and Management Proposal (3 sections), and Volume II – Cost Proposal (4 sections).
• A summary slide of the proposed effort, in PowerPoint format using the provided Proposal Summary Chart template, should be submitted with the proposal.
• Proposers should provide a technical and programmatic strategy that conforms to the entire program schedule and presents an aggressive plan to fully address all program goals, metrics, milestones, and deliverables.
• Proposers are strongly encouraged to provide the proposal cost breakdown as an editable MS Excel spreadsheet, inclusive of calculations formulae, with tabs (material, travel, ODC’s) provided as necessary.
• Proposers shall identify in their proposal any pre-existing technical data or commercial/non-commercial software that they will deliver to the Government with less than unlimited rights. Proposers should indicate in their proposal whether they believe the scope of the research included in their proposal is fundamental or not.
• To avoid missing deadlines, proposers should submit their abstracts and proposals in advance of the deadlines with sufficient time to receive confirmations and correct any errors in the submission process.
Some Reflections on Proposal Preparation
Breakthrough technologies and capabilities for national security
Create breakthrough, paradigm-shifting solutions
Accept and manage significant technology risk
Disrupt or massively accelerate technology roadmaps
1960s 1970s 1980s 1990s 2000s 2010s 2020s 2030s
UAVs
IR Night Vision
Precision Guidance & Navigation
Stealth
M ili ta ry
C ap ab ili tie s
Investing today for the next generation
Communications/Networking
En ab lin g
Te ch no lo gi es
Materials Science Information Technology
ARPAnet/Internet Microelectronics
Nucleic Acid-Based VaccinesPAL/Siri
Artificial Intelligence Self-Driving Cars
DARPA’s Role: Pivotal early investments that change what’s possible
The Heilmeier Catechism
H1: What problem are you trying to solve?
H2: What are the key technical challenges that prevent that problem from being solved today?
H3: What is the new approach and how can it overcome these technical challenges?
H4: Why would solving that problem have a large impact (to the DoD)?
H5: What is the program plan to solve the problem?
George H. Heilmeier, Director of ARPA (1975-1977) IEEE Spectrum, June 1997
• Follow the instructions (the BAA is your friend)
• Address each of the technical challenges (TCs)
• Clearly articulate the innovation of your approach applied to the TCs
• Provide evidence of assertions within the proposal
• Use cost realism
• Use the DARPA Standard Cost Proposal Spreadsheet, provide traceability, and supporting documentation
• Develop a compliance matrix to ensure completeness and responsiveness
Proposal tips the…
• “a la carte”
• “miracle-multiplied”
• “unassociated favorite topic”
• “just believe me”
• “know better”
• “explorer”
• “buzzword bingo”
• “reflection”
Classic proposal missteps
Key Dates
July 05, 2023 ASSERT BAA publication
July 13, 2023 0800 - 1600 ET ASSERT Proposers’ Day
August 04, 2023 1600 ET Abstract due date
August 31, 2023 1600 ET Frequently Asked Questions deadline
September 15, 2023 1600 ET Proposal due date
August 22-24, 2023 | Seattle, WA https://eri-summit.darpa.mil
Join us in person as we focus on reinventing microelectronics manufacturing
Registration closes at 11:59 PM ET on July 31 Distribution Statement A - Approved For Public Release, Distribution Unlimited https://eri-summit.darpa.mil/ www.darpa.mil
22Distribution Statement A - Approved for Public Release, Distribution Unlimited
DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited.DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited.
Advanced Sources for Single-event Effects Radiation Testing (ASSERT)
Verification and Validation
Adrian Ildefonso1, Joel M. Hales2, and Dale McMorrow1
1U.S. Naval Research Laboratory, Code 6816, Washington, DC 20375 USA 2Jacobs, Inc., Herndon, VA 20171 USA
DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited. 2
• Role of Independent Verification and Validation (IV&V) Team ‒ Serve as technical advisors to the DARPA Program Manager (PM) ‒ Evaluate technical reports and data to provide feedback to DARPA PM ‒ Select target DUTs that have a range of complexity and SEE types, and provide information to performers ‒ Acquire benchmark SEE data that will be provided as Government Furnished
Information to verify correlation metrics
• Performers will be expected to ‒ Deliver designs, simulation results, experimental demonstrations and test data (if applicable) to the IV&V team
Introduction – IV&V
DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited. 3
The NRL Team has extensive experience developing experiments and analysis techniques to determine the ability for pulsed-laser sources to serve as surrogates for traditional accelerator testing
Meet the Team
Dr. Adrian Ildefonso Dr. Joel M. Hales Dr. Dale McMorrow
DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited. 4
• Pulsed-Laser SEE (PL-SEE) testing techniques have been in use for decades ‒ Both qualitative and quantitative data have contributed to the field ‒ Decades-long history of source development (beam delivery, characterization, testing requirements, etc.)
‒ Correlation and Predictive capabilities have been relevant topics from the start
PL-SEE as an Alternative to HI Testing
But!... We can leverage lessons learned over decades of developing correlation and predictive testing approaches using PL to develop new sources better equipped to characterize 3DHI technologies
Lasers cannot penetrate metal layers, limiting their utility for 3DHI technologies
DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited. 5
• Correlation approaches ‒ Relies on existing accelerator data on a given DUT to inform test conditions ‒ Parameters are chosen to reproduce the known heavy-ion responses ‒ Depending on the source, this parameter space can be large ‒ Much more difficult to achieve for emerging 3DHI technologies
• Predictive Approaches ‒ Does NOT rely on pre-existing accelerator data ‒ Parameters are chosen to produce specified charge generation within the DUT ‒ Requires an assigned equivalent LET
Correlation vs Predictive Approaches
DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited. 6
Example from Pulsed-Laser Testing - Correlation
Functional Correlation
LET Prediction
Threshold Laser Energy
Threshold Ion LET
𝐿𝐿𝐿𝐿𝐿𝐿 = 3 × 𝐿𝐿
Correlation Approach
D. McMorrow, et al., TNS, vol. 47, Jun, 2000.
Use for Measurements
DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited. 7
Example from Pulsed-Laser Testing - Prediction
LET Calculation
Use laser focusing that resembles charge profile of an ion
Predictive Approach
J. M. Hales, et al., TNS, vol. 70, Apr, 2023.
Use for Measurements
(Laser)
Measured SETs for LM124
DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited. 8
• The ASSERT Program metrics include specifications for source characteristics and DUT response agreement ‒ There are many ways to verify source characteristics, and proposals are encouraged to develop dosimetry capabilities for their own sources
ASSERT Program Metrics
DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited. 9
• The ASSERT Program includes two response agreement metrics that will be used to evaluate the efficacy of the developed source to predict the SEE response of DUTs
ASSERT Program Metrics – Response Agreement
DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited. 10
• There are many types of SEE, and more have been identified through the years
• Typically classified into destructive and non-destructive
Types of SEE
D. Kobayashi, NSREC 2019 Short Course
DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited. 11
This program classifies SEEs into analog and digital
Alternative Classification of SEEs
Analog SEEs
• Effects with responses that have continuous characteristics
• Examples: SET (amplitude, duration) and SELC (magnitude)
• Difficult to correlate and predict because response depends highly on excitation conditions
Digital SEEs
• Effects are binary in nature, i.e., they are either induced or not for a particular experiment
• Examples: SEU, SEL, and most others
• Simpler to correlate empirically, but prediction difficulty can vary depending on technology
DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited. 12
• Accurate reproducibility of analog SEEs will be assessed and validated by performing quantitative correlation with ion data ‒ Will focus on time-domain waveforms (very sensitive to charge profiles)
Metrics for Analog SEEs
0 200 400 600 800 1000 1200 1400
A m pl itu de (m
V)
Time (ns)
Peak Amplitude
Duration
FWHM
Rise Time
Collected Charge
Fall Time
0 200 400 600 800
A m pl itu de [m
V]
Time [ns]
QBB (Laser) 100x (Laser) Heavy ion
Example from Laser Testing
DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited. 13
• Accurate reproducibility of digital SEEs will be assessed and validated by performing quantitative correlation with ion data ‒ Will focus on SEE thresholds in specific DUTs
Metrics for Digital SEEs
Example from Laser Testing
S. C. Moss, et al., TNS, vol. 42, Dec, 1995.
Empirical Correlation
DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited. 14
• Accurate reproducibility of digital SEEs will be assessed and validated by performing quantitative correlation with ion data ‒ Will focus on SEE thresholds in specific DUTs
Metrics for Digital SEEs
Expected Measurement from ASSERT Source
Threshold Prediction
SEE
No SEE
Equivalent LET
LE
T
Th re sh ol d
DUT 1 DUT 2 …
ASSERT Source Heavy Ion
DUTs specified at program kick-off
DISTRIBUTION STATEMENT A. Approved for public release. Distribution is unlimited. 15
• The IV&V will aid + advise DARPA PM during the assessment of proposed sources and developed solutions
• Performance of ASSERT sources will be validated against program metrics ‒ Source characteristics: performers are encouraged to develop their own dosimetry ‒ Response agreement: analog and digital correlation metrics will be used
• The government will specify target devices and provide heavy-ion data as GFI for comparison with ASSERT source data.
‒ In the spirit of verifying “prediction” capabilities, list of DUTs will be made available at program kickoff, and data will be made available during later phases
Summary
| Advanced Sources for Single-event Effects Radiation Testing (ASSERT)� Proposer’s Day |
| Our mission |
| Electronics Resurgence Initiative (ERI) 2.0 timeline |
| Progress in microelectronics |
| 3DHI is across our current programs |
| Why 3DHI? |
| Disaggregation offers performance advantages |
| 3DHI enables new applications |
| Making 3DHI electronics real |
| MTO thrust areas |
| Single event radiation and 3DHI electronics |
| ASSERT provides the SEE testing for 3DHI |
| Slide Number 13 |
File details come from the government source that posted it. Updated .