FE-SEM_Technical_Capabilities_Declaration.docx

FE-SEM TECHNICAL CAPABILITIES DECLARATION

SOLICITATION NUMBER: FA860117R0063

COMPANY: ________________________________________________________________

PRODUCT: Field Emission Scanning Electron Microscope (FE-SEM)

The FE-SEM system must adhere to the specifications listed below. Please check either “Meets” or “Does Not Meet” for each item listed below for your company’s proposed FE-SEM. Please provide a note describing the capabilities and/or a reference to your FE-SEM manual showing that the requirement is met.

1. Must have low voltage capabilities, capable of going less than 1kV, as well as 1 nm resolution at 1kV.

Notes/Ref:

2. Must be able to install metallic samples.

3. FE-SEM must have fully-automated column alignments.

4. Must have a large chamber and must be able to accommodate Deben Microtest 300N. Must have 3 external ports or greater.

5. Must have plasma cleaner and CCD camera.

6. Must have a beam blanker to preserve delicate specimens.

7. FE-SEM must also enable drift corrected frame integration.

8. Must have a fully motorized 5 axis stage as well as 360 degree rotation ability with repeatability of axial movements.

9. Must have a minimum of 2048 pixels.

10. Must be compatible with Win 10 if not operating already with Win 10.

11. Must be compatible with EDAX brand Pegasus model, Energy-Dispersive X-ray Spectoscopy (EDS)-Elector Backscatter Diffraction (EBSD) system.

12. Must have variable pressure capability.

13. Total area for system must not exceed 9’L and 6’W.

14. Must be able to fit through 6’W door.

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