SEM Salient Characteristics - amended.pdf

This document is a Scanning Electron Microscope (SEM) Requirements List specifying technical and service specifications for a federal equipment procurement.

The SEM must feature a Schottky (hot) field emission gun with high vacuum operation, a battery backup power supply capable of maintaining system operation for a minimum of eight hours, and three lenses consisting of two condensers and one objective lens. Magnification requirements include a lower bound of 50X or greater with resolution of 10 nm or less at 0.5kV, with no upper magnification limit specified. All microscope functions must be controlled through a Windows PC-based interface with user-friendly graphical user interface (GUI) and computer-assisted optics operation, and the system must operate without requiring network connectivity for operation, maintenance, or repair. The SEM must include a goniometer sample stage with tilt capability, stage camera with visible spectrum live-imaging, large area Energy Dispersive X-ray (EDS) mapping with minimum detector size greater than 60mm², live mapping capabilities that update during sample navigation, 3D mapping and reconstruction functionality, and EDS overlay display showing individual elements. All EDS operations must be managed through SEM software and serviced by SEM manufacturer technicians. The vendor must provide on-site training for both hardware and software, furnish a minimum one-year warranty covering all parts and labor, and fulfill warranty service calls within twenty business days of the requested service call date.