Atch_3_-_Statement_of_Need.pdf

STATEMENT OF NEED

FOR

DENTAL EVALUATIONS AND CONSULTATION SERVICE

1.0. PURPOSE: The Dental Evaluations and Consultation Services (DECS) has a requirement of one time integration of one fully functional Low Vacuum Scanning Electron Microscope. The Contractor shall provide all management tools, supplies, equipment, and labor necessary to provide, deliver, and install one fully functional, stand-alone Low Vacuum Scanning Electron Microscope for USAF Dental Evaluation & Consultation Services (DECS), 3650 Chambers Pass, Joint Base San Antonio (JBSA) Fort Sam Houston, TX 78234. This is for a turnkey project; to include all cabling, connectors, hardware, software, and installation. All equipment shall be delivered at time of install. No drop shipping is permitted.

2.0. REQUIREMENT:

2.1.0. The contractor shall provide the Low Vacuum Scanning Electron Microscope with associated maintenance services. This requirement has been reviewed and contains no services that are inherently governmental functions. All services are strictly non-personal in nature. All equipment is required to be new equipment. The Low Vacuum Scanning Electron Microscope shall include:

2.1.1. The contractor shall provide one fully functional Low Vacuum Scanning Electron Microscope, P/N JSM-IT500LA or equal.

2.1.1.1. The contractor shall provide the Low Vacuum Scanning Electron Microscope with Computer Controlled Analytical Scanning Electron.

2.1.1.2. The contractor shall provide the Low Vacuum Scanning Electron Microscope with Low vacuum and high vacuum modes of operation at resolutions: 4.0nm at 30kV (LV); 3.0nm at 30kV (HV); 5X to 300,000X.

2.1.1.3. The contractor shall provide the Low Vacuum Scanning Electron Microscope with Imaging System: High resolution digital acquisition up to 5120 x 3840 pixels; Advanced scan modes for charge reduction; and Software includes: multiple live imaging modes, live image capture as AVI file, measurement & annotation, image processing, pseudo color image, eco mode.

2.1.1.4. The contractor shall provide the Low Vacuum Scanning Electron Microscope with Electron Optics: Tungsten Thermionic Electron gun and pre-centered filament; Automated gun alignment and auto-bias with manual override; Advanced, two-stage zoom condenser lens; and Electromagnetic beam blanking, automatic after image acquisition.

2.1.1.5. The contractor shall provide the Low Vacuum Scanning Electron Microscope with Electron Detectors: For secondary electron imaging; and solid state backscattered electron detector.

2.1.1.6. The contractor shall provide the Low Vacuum Scanning Electron Microscope with X-Ray Analysis/EDS: JEOL brand or equivalent Energy Dispersive Microanalysis System with Peltier cooled Silicon Drift Detector (SDD) and EDS Software.

ITEMS: QUANTITY

Low Vacuum Scanning Electron Microscope. JEOL Ltd. model JSM-IT500LA or equal 1 Each

2.1.1.7. The contractor shall provide the Low Vacuum Scanning Electron Microscope with specimen chamber: Large analytical chamber with 5+ ports; and Maximum sample size, 200 mm diameter X 75 mm.

2.1.1.8. The contractor shall provide the Low Vacuum Scanning Electron Microscope with vacuum system: Fully automated vacuum sequencing; Turbo molecular Pump and roughing pump; and 10 to 650 Pa.

2.1.1.9. The contractor shall provide the Low Vacuum Scanning Electron Microscope with Software:

JSM-IT500LA or equal software; Smile View Premium; and Microsoft Office, Home and Office 2010.

2.1.1.10. WARRANTY: The contractor shall provide the Low Vacuum Scanning Electron Microscope with one year parts and labor warranty. Warranty period shall begin from completion of delivery and installation and the Government acceptance date.

2.1.1.11. The contractor shall provide the Low Vacuum Scanning Electron Microscope with user training course, including tuition and supplies for one person. Valid for attendance within one year from date of new instrument installation.

2.1.1.12. The contractor shall provide the Low Vacuum Scanning Electron Microscope with one set of operator's manuals.

2.1.2. The contractor shall provide the Low Vacuum Scanning Electron Microscope with one Eucentric Large Goniometer Stage: 1) Five axis, mechanically, eucentric goniometer stage. Enables full coverage of a sample that is up to 125mm in diameter; 2) Sample movement: Control with the following travel:

X=125mm, Y=100mm, Z=80mm, continuous, T= -10° to +90°, R=360°; 3) Motor control options available; 4) Sample exchange: Draw out Type; and 5) Specimen Holder kit.

2.1.3. The contractor shall provide the Low Vacuum Scanning Electron Microscope with one Objective Lens Aperture: 3 Stage, with XY fine adjustment function.

2.1.4. The contractor shall provide the Low Vacuum Scanning Electron Microscope with one Backscattered Electron Detector: Multi-segment solid state backscattered electron detector for composition, topographic and variable shadow imaging.

2.1.5. The contractor shall provide the Low Vacuum Scanning Electron Microscope with one Energy Dispersive Microanalysis System with Peltier cooled silicon Drift Detector (SDD) and EDS software.

This system includes all of the hardware and software components for multi-point analysis, image capture, hyper spectral mapping, line scan, drift correction, elemental quantification and reporting.

2.1.5.1. The contractor shall provide Energy Dispersive Microanalysis System with equipment hardware:

1) Dry SDD, Peltier cooled, and silicon nitride window for detection from Be to U; 2) Digital pulse processor and power supply; and 3) an EDS integration kit for connecting to SEM.

2.1.5.2. The contractor shall provide the Energy Dispersive Microanalysis System with Software:

Integrated and embedded software (same software interface as SEM); Full area, partial area, multi-point/area, line scan collection; Automatic qualitative and quantitative with manual override; Active, hyper spectral mapping (up to 4096 x 3072 pixels), quantitative mapping, map overlays up to 3 elements (RGB); Reconstruction of element distribution during live acquisition or stored data; Drift correction;

Chemical Typing – classification of data according to user defined ranges in chemical type; Export data as EMSA, BMP, or JPG format; and Report generation with Smile View Premium, Microsoft® Word or PowerPoint.

2.2. This is a one-time system integration project at DECS, Bldg. 3610, Room No. 168-3 with one (1) each stand-alone Low Vacuum Scanning Electron Microscope. All pathways and power will be provided by the Government. The government will provide power supply: 120v wall outlet. The contactor shall provide on (1) schematic drawings for the location with their quote to ensure it meets the intent and scope of the project. The solution shall fit within the provided room dimensions with no alterations. No water connections are provided.

Schematic drawings should be for Low vacuum Scanning Electron Microscope System connections, see location/drawing in paragraph 6.0. No equipment shall be drop shipped to the customer. The contractor shall deliver and install all equipment at time of installation. The Government will not provide storage.

3.0. GOVERNMENT REPRESENTATIVES: (Primary) MSgt. Roberto A. Gonzalez, 59 MLRS, 210-292-6398 and (Alternate) TSgt. Cari L. Torrez, USAF DECS, 210-539-4115.

4.0. DELIVERY: The Government requires FOB destination with delivery and installation no later than 5 months after receipt of order (ARO).

5.0. INSTALLATION AND ADDITIONAL SERVICES: The contractor shall coordinate delivery to the Government Representatives at the following address: USAF Dental Evaluation & Consultation Services (DECS), 3650 Chambers Pass, JBSA Fort Sam Houston, TX 78234.

6.0. Drawings: Bldg. 3660 – Room 168-3

SEM