T.O._33B-1-2_Reference.pdf
Air Force Technical Order PDF 175 KB Posted
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T.O. 33B-1-2 Reference
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Other versions and copies of T.O. 33B-1-2
| File | Revision | Posted | Attached to |
|---|---|---|---|
| PD_Atch 2 - TO 33B-1-2 May 2021.pdf | May 2, 2021 | Non-Destructive Testing (NDT) Processor | |
| TO_33B-1-2_Table_4_CR_Systems_Qualified_for_Crack_Detection.pdf | Revision not stated | Computed Radiography X-Ray System |
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| T.O._0-25-252_Reference.pdf | ||
| NOTICE_OF_INTENT_TO_AWARD_SOLE_SOURCE_F3N6117355A001.pdf |
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T.O. 33B-1-2
SWP 106 01
e. Acceptance Criteria/Corrective Action. If any of the test patterns discussed in steps a-d are not verified, the display monitor should be repaired or replaced before further use.
f. Documentation. Document pass/fail of the test and any corrective actions taken IAW the process control documentation requirements listed in T.O. 33B-1-1.
NOTE
Display brightness is monitored by internal software. If display brightness is inadequate, the software will alert the user that corrective action is required.
4.2 Initial Test Setup/Data Capture Procedure for System Tests.
NOTE
If x-ray tubes or CR Scanners other than those listed in the appropriate table are available, each must be qualified before being used for crack detection or welder certification. Contact the appropriate cognizant engineering authority for approval.
a. Crack Detection systems SHALL use CR system components and settings listed in Table 4.
NOTE
Welder Certification systems often use IPs that are not available in 14x17 size. When this is the case, spatial resolution (4.6), contrast sensitivity (4.7), and EPS (4.9) SHALL be performed separately using the appropriate 8x10 IP and system settings for Welder Certification systems. All other tests SHALL be performed using the CR system components and settings from Table 4.
b. Welder Certification systems SHALL use CR system components and settings listed in T.O. 00-25-252, WP 005 04, Table 3A, ‘CR Systems Qualified for Welder Certification’
c. General Use systems SHALL use CR system components and settings listed in Table 4 if applicable. Otherwise, the manufacturer’s recommended IP and CR system settings may be used.
NOTE
• The first time this test is performed on the system is considered the baseline test. Once a baseline test has been performed, subsequent tests shall use the same type of IP, cassette, parameters, and CR reader settings.
• The time elapsed between exposures and processing of the IP for process control tests shall be less than 60 minutes to ensure repeatable data.
• Evaluation procedures assume the operator has had adequate training on their specific CR software to be able to perform common post-processing functions such as image optimization using contrast/brightness or equivalent, and magnification. Additional software functions that may not be used often by the operator are referred to as special software tools and guidance is provided in paragraph 2 through paragraph 8 where necessary.
• Evaluation of all images shall be performed using the raw data (no software filters). Some vendor’s software may provide ‘area adjust’ or ‘region-of-interest’ (ROI) type tools which set the contract and brightness automatically for a given area of the image as selected by the operator. These tools are permitted for image evaluation.
d. Record the date of the test, model and serial number(s) of CR reader, IP, and cassette if applicable.
e. Select a 14-inch x 17-inch IP and cassette. For Crack Detection systems, the same IP type identified in Table 4 SHALL be used. For Welder Certification systems, the same IP type identified in T.O. 00-25-252, WP 005 04, Table
Crack Detection systems SHALL use CR system components and settings listed in Table 4.
Welder Certification systems SHALL use CR system components and settings listed in T.O. 00-25-252, WP 005 04,y y p Table 3A, ‘CR Systems Qualified for Welder Certification’
General Use systems SHALL use CR system components and settings listed in Table 4 if applicable. Otherwise, they y p g manufacturer’s recommended IP and CR system settings may be used.
T ab le
C
R S ys te m s
Q ua lif ie d fo r C ra ck
D et ec tio n
C R
S ys te m
C om po ne nt m an uf ac tu re r
G E
G E
G E
C ar es tre am /K od ak m od el n um be r C
R x
To w er C
R
N D
T C
R
P C
R F le x
H
PX
-1 or
5N
D T in te rn al s of tw ar e (f irm w ar e) c2 5_ o r c2 5_ ga in ga in lo w
0V pm t G A
IN
la se r po w er la se r po w er de fa ul
t) la se r po w er
H
IG
H ot he r
(s pe ci fy
C
R S ca nn er eq ui pm en t ot he r (s pe ci fy
(R ea de r) se tti ng s ot he r (s pe ci fy ot he r (s pe ci fy sp ee d ot he r
(s pe ci fy sa m pl in g re so lu tio n m ic ro n m ic ro n m ic ro n m ic ro n m ax im um p ix el v al ue
Im ag in g
Pl at es m an uf ac tu re r/t yp e
G
EI
PS
G
EI
PS
o r
C ar es tre am G
EI
PS
G
EI
PS
o r C ar es tre am
(I P)
(K od ak
H R
(K od ak
H R m an uf ac tu re r G
E n/ a n/ a n/ a Pr oc es si ng
C as ty pe ha rd n/ a n/ a n/ a se tte m od el ve ry h ig h re so lu tio n n/ a n/ a n/ a
N O
TE
1) A ll sy st em s sh al l u se a o r
M P m on ito r, w ith a m in im um in ch d ia go na l v ie w in g sc re en
2) A lly s ys te m s sh al l u se a L or ad
K V
P x-ra y tu be o r a tu be w ith a f oc al s po t l es s th an o r eq ua l t o
1.
5m m
C ar es tre am /K od ak
H
PX
-1 pm t G
A
IN
la se r po w er
H
IG
H m ic ro n
G
EI
PS
o r
C ar es tre am (K od ak
H
R
C R
S ca nn er
(R ea de r)
Im ag in g
Pl at es (I
P) g
T ab le
C
R S ys te m s
Q ua lif ie d fo r C ra ck
D et ec tio n
C on tin ue d
C R
S ys te m
C om po ne nt m an uf ac tu re r
Fu ji
V M
I D ur r
D ur r m od el n um be r
D yn am ix
H R
M
S H
D -C
R
H D
-C R in te rn al s of tw ar e
(f irm w ar
e) V
1-ga in
PM
T ga in
=4 .2
PM
T ga in
PM
T ga in la se r po w er
LD
p ow er m
W La se r po w er =1
La se r po w er
La se r po w er ot he r
(s pe ci fy
ER
D m od e=
Fi x;
S =4
C R
S ca nn er eq ui pm en t ot he r
(s pe ci fy
S-sh ift
=1 .0
; C -s hi ft=
1.
(R ea de r) se tti ng s ot he r (s pe ci fy
G T=
E;
G
C =1
.2 ot he r (s pe ci fy
R E=
0;
B ea m
D ef le ct
S pd
B ea m
D ef le ct
S pd
D
R C
=u nc he ck ed ot he r
(s pe ci fy
Sc an I
P Ty pe
U R sa m pl in g re so lu tio n m ic ro n (N
S) m ic ro n m ic ro n m ic ro n m ax im um p ix el v al ue
Im ag in g
Pl at es m an uf ac tu re r/t yp e
Fu ji
ST
-V
I G
EI
PS
o r
C ar es tre am
G
EI
PS
G
EI
PS
o r
C ar es tre am (I
P) (K od ak
H
R (K od ak
H
R m an uf ac tu re r
Fu ji n/ a n/ a n/ a
Pr oc es si ng C as ty pe
C C o r
U R n/ a n/ a n/ a se tte
(if a pp lic ab le m od el n/ a n/ a n/ a n/ a
N O
TE
1) A ll sy st em s sh al l u se a o r
M P m on ito r, w ith a m in im um in ch d ia go na l v ie w in g sc re en
2) A lly s ys te m s sh al l u se a L or ad
K V
P x-ra y tu be o r a tu be w ith a f oc al s po t l es s th an o r eq ua l t o
1.
5m m
Table 6. Technique and PV Range for EPS Test
EPS PARAMETERS FOR CRACK DETECTION
allowable pixelSDD
Time (in-min max CR Scanner IP kV mA (sec) ches)
GE CR Tower GE IPS 65 5 70 48 12000 62000 GE CR50P (50 mi- GE IPS or 65 5 70 48 8000 46000 cron) Carestream/Kodak HR VMI 5100 MS GE IPS or 65 5 70 48 15000 62000
Carestream/Kodak HR Carestream/Kodak GE IPS or 65 5 70 48 2500 3900 HPX-1 Carestream/Kodak HR Durr HD-CR35 Carestream/Kodak HR 65 5 70 48 10000 62000 Durr HD-CR35 GE IPS 65 5 70 48 15000 62000 Fuji Dynamix HR2 Fuji IPS 65 5 100 48 7600 15560 GE CR Flex GE IPS 65 5 70 48 10000 62000
EPS PARAMETERS FOR WELD CERTIFICATIONS
allowable pixel
Time SDD CR Scanner IP kV mA (sec) (inches) min max GE CR Tower GE IPU or Carestream XL 70 5 180 48 12000 62000
Blue GE CR Flex GE IPU 75 5 180 48 10000 62000 Carestream HPX-1 Carestream XL Blue 70 5 180 48 2500 3900 Durr HD CR-35 Carestream XL Blue 75 5 180 48 10000 62000 VMI 5100MS Carestream XL Blue 65 5 180 48 13000 62000 Fuji Dynamix HR2 Fuji UR-1 (25 micron) 65 5 180 48 3000 15560
Carestream/Kodak GE IPS or 65 5 70 48 2500 3900 HPX-1 Carestream/Kodak HR min max allowable pixelSDD Time (in-
CR ScannerCR Scanner IPIP kVkV mAmA (sec)(sec)( ) ches))
EPS PARAMETERS FOR CRACK DETECTION
EPS PARAMETERS FOR WELD CERTIFICATIONS
Carestream HPX-1 Carestream XL Blue 70 5 180 48 2500 3900
TO 00-25-252J
Ta bl e 3A
C
R S ys te m s Q ua lif ie d fo r W el de r C er tif ic at io n
C R
S ys te m
C om po ne nt C om po ne nt
In fo rm at io n
C R
S ys te m
C R
S ca nn er
(R ea de r) m an uf ac tu re r G
E G
E C ar es tre am
/K od ak D ur r
VM
I m od el n um be r C
R x
To w er
C R
N
D T or
C R
N
D T
C R
F le x H
PX
-1
H D
-C R
M
S eq ui pm en t se tti ng s ga in
PM
T ga in
PM
T ga in
PM
T ga in
.5 la se r po w er la se r p ow er
H
IG
H la se r p ow er la se r p ow er ot he r (s pe ci fy sp ee d
Be am D ef le ct S pd ot he r (s pe ci fy sa m pl in g re so lu tio n m ic ro n m ic ro n m ic ro n m ic ro n m ic ro n m ax im um p ix el v al ue
Im ag in g
Pl at es (I
P) m an uf ac tu re r/t yp e
G E
IP
U o r
C ar es tre am X
L Bl ue
G E
IP
U
C ar es tre am X
L Bl ue C ar es tre am
X L
Bl ue
C ar es tre am X
L Bl ue
Pr oc es si ng C as se tte (i f ap pl ic ab le m an uf ac tu re r
G E n/ a n/ a n/ a n/ a ty pe ha rd n/ a n/ a n/ a n/ a m od el ve ry h ig h re so lu tio n n/ a n/ a n/ a n/ a
Vi ew in g
M on ito r di sp la y si ze
(i nc he s, di ag on al re so lu tio n (m eg ap ix el s, M P) or
C R s ys te m s sh al l p as s
U
SA
F C
R P ro ce ss C on tro ls fo r c ra ck d et ec tio n sy st em s pe r T
O
3B -1
-2 W
P w ith tw o ex ce pt io ns
1) S pa tia l r es ol ut io n sh al l b e lp
/m m in b ot h or ie nt at io ns
(T O
3B
-1 -2
W P p ar a
4.
6) w he n vi ew ed a t 2
X ab so lu te m ag ni fic at io n
2) T ab le
B sh al l b e us ed in li eu o f T O
3B
-1 -2
W P
T ab le
Te ch ni qu e an d
PV
R an ge fo r E
PS
T es t”
N O
TE
C R
S ys te m s Q ua lif ie d fo r W el de r C er tif ic at io n
C ar es tre am /K od ak
H
PX
-1
PM
T ga in la se r p ow er
H
IG
H m ic ro n
C ar es tre am X
L Bl ue or
Vi ew in g
M on ito r
Pr oc es si ng C as se tte (i f ap pl ic ab le
Im ag in g
Pl at es (I
P)
C R
S ca nn er
(R ea de r)
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