Attachment B- RFP462081 Technical Specifications.pdf
PDF 85 KB Posted
- Attached to
- Low Voltage Compact Electron Microscope System
- Solicitation number
- PR462081
- Issued by
-
Department of Energy
About this file
This is a Technical Specifications document for RFP462081, dated 04/15/2026, outlining ten line items for a Low Voltage Electron Microscope (LVEM) 25E system and associated equipment.
The base system (Item 1) includes a fully portable, self-contained LVEM 25E with Schottky type Field Emission Gun, integrated ion getter and turbomolecular pumps, motorized aperture and stage systems, dual 24-inch LCD monitors, ergonomic work table, toolkit, certified installation and customer training, and one-year standard warranty. Items 2 and 3 specify Scanning Transmission Electron Microscope (STEM) imaging modes at 15kV and 10kV with respective resolutions of 1.3nm and 1.0nm, and Scanning Electron Microscope (SEM) imaging mode at 15kV with 4nm resolution. Item 1 also includes Transmission Electron Microscope (TEM) imaging capability at 25kV with 1.0nm resolution and maximum magnification of 1,300,000x, featuring a 2048x2048 pixel backside illuminated sCMOS camera. Item 4 specifies Bruker Energy Dispersive X-Ray Spectroscopy (EDS) with Silicon Drift Detector and 129eV energy resolution, requiring tilt capability. Additional items include an offline Bruker Espirit license (Item 5), standard and tilt sample holders (Items 6-7 with ±20° rotation on one axis), a 1500W backup power supply with approximately 43 hours ion pump backup time (Item 8), and two extended warranty options: Standard Warranty covering parts, labor, shipping, and technician travel (Item 9), and Saver Warranty covering parts and labor only (Item 10).
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Text version
Attachment B RFP462081- Technical Specifications
04/15/2026
ITEM 1
LVEM 25E Base System:
• Fully self-contained and portable system on castors
• Schottky type Field Emission Gun (FEG) with automated alignment
• Integrated Ion Getter (imaging column) & enhanced Turbomolecular (airlock) Pumps
• Fully motorized aperture system
• Fully motorized stage (x, y, z) with automated coarse focus
• Computer configured with software for LVEM25E operations
• Two table mounted 24” flat panel high contrast LCD widescreen monitors
• New ergonomic work table with drawers
• Toolkit
• Certified Installation & Customer-site training
• One year standard warranty
Transmission Electron Microscope (TEM) imaging mode (25kV)
• Includes Electron Diffraction (ED)
• 1.0nm resolution; 1,300,000 x maximum magnification
• 2048 x 2048 pixel 16 bit backside illuminated sCMOS (6.5 um2 pixel size) with 1.0 e-read noise
ITEM 2
Scanning Transmission Electron Microscope (STEM) imaging modes
• Includes brightfield and Dark-Field imaging modes
• 15kV STEM (1.3nm resolution; 750,000 x maximum magnification)
• 10kV STEM (1.0nm resolution; 940,000 x maximum magnification)
ITEM 3
Scanning Electron Microscope (SEM) imaging mode
• Includes beam current measurement
• 15kV STEM (4nm resolution; 750,000 x maximum magnification)
Attachment B
04/15/2026
ITEM 4
Bruker Energy Dispersive X-Ray Spectroscopy (EDS) (Requires Tilt)
• Bruker Espirit software and online license
• Silicon Drift Detector (SDD)
• Energy Resolution Mn Ka ≤ 129eV
ITEM 5
Additional Bruker Espirit Offline License
ITEM 6
Additional Standard Sample Holder
ITEM 7
Tilt Sample Holder
• ± 20° of rotation on 1 axis
ITEM 8
Backup power supply 1500W
• Ion pump backup time ~43 hours
ITEM 9
Extended Warranty- Standard Warranty
• Including all parts and labor, shipping and technician travel
ITEM 10
Extended Warranty- Saver Warranty
• Including all parts and labor only
File details come from the government source that posted it. Updated .