Attachment 01 - Minimum Required Specifications.pdf

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Attached to
Benchtop/Tabletop Scanning Electron Microscope Federal contract opportunity
Solicitation number
12805B23Q0420
Issued by
Department of Agriculture Agricultural Research Service Field Research Implementation and Information Delivery Plains Area

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RFQ - 12805B23Q0420 Benchtop Scanning Electron Microscope.pdf PDF

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A achment 01 – Required Minimum Specifica ons

One (1) Bench top/tabletop Scanning Electron Microscope complete

SEM will provide vital informa on on nanopes cides that we are formula ng. This informa on includes but not limited to the quan fica on of the amount of ac ve ingredient on the nano‐ core, or encapsulated by nanomaterials through high resolu on pictures and images.

The SEM must have the following included:

SEM

Secondary and Backsca er Electron Imaging Detectors

5nm (SE) / 8nm (BSE) resolu on

“Live” Magnifica on Up to 150,000x

5 Axis (XYZTR) Motorized Stage

Naviga on Camera with Tilt Assist

Stage travel: ±20mm x ±20mm x 40mm (XYZ)

Maximum Sample Size (full coverage): 80x80x35mm

Variable Apertures (30 / 50 / 50 / 100 μm)

Beam Shi – 50μm

High and Low Vacuum Opera on

Auto start, focus and brightness

Image format BMP, TIF, JPG

Image Capture Sizes up to 5120x3840 pixels

Image Video Recording

Built‐in Image Annota on and Feature Dimensioning

Par cle size analysis, 3D rendering and Image s tching so ware

User Serviceable Filament, Column and Apertures

Turbo Molecular pump

Roughing RV pump with Vibra on Dampener included

Spu er coater with Au target

Coats samples with a conduc ve layer of gold, allowing non‐conduc ve samples to be imaged at high resolu ons.

Fully automa c cri cal point dryer

Energy Dispersive X‐ray Spectrometer

Scanning Control Unit (SCU)

Electron beam control and high output count rates

Image acquisi on so ware

You must include delivery/shipping costs in your quote

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