Attachment 01 - Minimum Required Specifications.pdf
PDF 159 KB Posted
- Attached to
- Benchtop/Tabletop Scanning Electron Microscope Federal contract opportunity
- Solicitation number
- 12805B23Q0420
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| File | Type | Posted |
|---|---|---|
| RFQ - 12805B23Q0420 Benchtop Scanning Electron Microscope.pdf |
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A achment 01 – Required Minimum Specifica ons
One (1) Bench top/tabletop Scanning Electron Microscope complete
SEM will provide vital informa on on nanopes cides that we are formula ng. This informa on includes but not limited to the quan fica on of the amount of ac ve ingredient on the nano‐ core, or encapsulated by nanomaterials through high resolu on pictures and images.
The SEM must have the following included:
SEM
Secondary and Backsca er Electron Imaging Detectors
5nm (SE) / 8nm (BSE) resolu on
“Live” Magnifica on Up to 150,000x
5 Axis (XYZTR) Motorized Stage
Naviga on Camera with Tilt Assist
Stage travel: ±20mm x ±20mm x 40mm (XYZ)
Maximum Sample Size (full coverage): 80x80x35mm
Variable Apertures (30 / 50 / 50 / 100 μm)
Beam Shi – 50μm
High and Low Vacuum Opera on
Auto start, focus and brightness
Image format BMP, TIF, JPG
Image Capture Sizes up to 5120x3840 pixels
Image Video Recording
Built‐in Image Annota on and Feature Dimensioning
Par cle size analysis, 3D rendering and Image s tching so ware
User Serviceable Filament, Column and Apertures
Turbo Molecular pump
Roughing RV pump with Vibra on Dampener included
Spu er coater with Au target
Coats samples with a conduc ve layer of gold, allowing non‐conduc ve samples to be imaged at high resolu ons.
Fully automa c cri cal point dryer
Energy Dispersive X‐ray Spectrometer
Scanning Control Unit (SCU)
Electron beam control and high output count rates
Image acquisi on so ware
You must include delivery/shipping costs in your quote
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