Att 11- Base Spt Eqmt List-Facilities.pdf

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Attached to
Materials for Integrated Nano-electronic and Optoelectronic Structures (MINOS)- AMENDMENT 2 Federal contract opportunity
Solicitation number
FA865023S5012AMD02
Issued by
Department of the Air Force Materiel Command Research Laboratory

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Base Support Equipment List & Available Base Facilities for

(MINOS)

Clause 5352.242-90001 entitled, “Common Access Cards (CAC) for Contractor Personnel (NOV 2012)” will be required for contractor personnel who will be working on-site and will require access to base e-mail and computer networks. The following base support at Wright Patterson AFB, OH will be available upon request:

Office Space Bldg 651: Rooms: 236, 239, 252, 254, 262A.

Bldg 652: Rooms: 129, 133.

Bldg 654: Rooms: 114, 118, 129.

Office space along with phone, computer access, desks, chairs, and file storage for up to 12 people.

Laboratory/Research Space Bldg. 651:

Room 076 (Low Temp High Field Electronic Transport) Room 192 (Ultrafast Flat Optics) Room 224 (Electronic Transport) Room 226 (Multiferroics) Room 234 (Quantum/Magnetics) Room 244 (Metalization/Deposition) Room 245 (Photonics Characterization) Room 247 (Electro Optics) Room 259 (Physical Vapor Deposition) Room 260 (Clean Room) Room 260 (Electronics & Thermal Characterization) Room 262 (Integrated Photonics)

Bldg 652:

Room 127A (TEM Sample Prep) Room 127D (Spectral Ellipsometry / Field Emission) Room 128 (Nanocharacterization) Room 135/136/137 (MBE) Room 138 (XPS)

Bldg 654:

Room 101 (Electronics Wet Chemistry) Room 131 (PLD/Magnetron) Room 132 (GaOx MBE) Room 119/120/121/122/123/124/147/147A/147B/148/149/150/151/152 (Flex 4)

FA8650-23-S-5012 Attachment 11

Base Support Equipment List

Equipment Name Model Number Manufacturer inductively-coupled plasma reactive ion etcher

(ICP/RIE)

Takachi Plasmatherm

Maskless Lithography System DWL 66+ Heidelberg Magneto-Optic Kerr Effect (MOKE) microscope N/A Evico Magnetics surface acoustic wave mapping interferometer N/A Home-built scanned Brillouin Light Scattering (BLS) microscope with integrated magnet

N/A Home-built

Pulsed laser deposition and sputter system with automated feedback

N/A Home-built high throughput pulse laser deposition system N/A Home-built dual-beam pulsed laser deposition system N/A Home-built 2x magnetic-field focused magnetron sputtering N/A Home-built Photoemission Microscope NanoESCA MkIII ScientaOmicron MBE GENxcel MBE System Veeco Time of Flight Secondary Mass Spectrometer IONTOF V IONTC Atomic Force & Confocal Microscope Atto CFMI AttoCube Systems Imaging XPS AX1SULTRA KRATOS X-Ray Defractometer System Smartlab Rigaku/USA Inc Molecular Beam Epitaxy System (MBE) GENII Varian Associates

Inc

MOLECULAR BEAM EPITAXY SYSTEM V80H-F MKII FISON

SPECTROSCOPY SYSTEM E3704 FISONS/SURFACE

SCIENCE IN

Thin Film Deposition Fiji G2 Ultratech Inc.

SIGNAL ANALYZER N9041B KEYSIGHT

TECHNOLOGIES

SCANNING PROBE MICROSCOPE 5600LS AGILENT

TECHNOLOGIES

SCANNING PROBE MICROSCOPE CYPHER SPM ASYLUM RESEARCH

CORPORATION

Vapor Deposition Platform EvoVac026 A ANGSTROM

ENGINEERING

Spectrometer Power Supply and attachments ESCA2703 Surface Science Infrascope TM-HST MWIR-512 QFI Fluorescence Lifetime Imaging Microscope 91090 ISS OPTICAL PARAMETRIC OSCILLATOR 1204643 Coherent Inc FTIR Spectrometer Vertex 80V Bruker Optics Inc.

Laser, Excimer LPXPro 305 Coherent Inc Near-Field Scanning Optical Microscope Multiview 4000 Nanonics Imaging Ellipsometer IR-VASE J.A. WOOLLAM

COMPANY

WAVE NETWORK ANALYZER N5251A KEYSIGHT

TECHNOLOGIES

CRYOSTAT CryoAdvance-100 Montana Instruments

CRYOSTAT SVT 400T JANIS RESEARCH CO

MBE DEPOSITED CHAMBER SYS, EPI 930-223300 EPI CHROUS

Laser, KRF Excimer, class 4 LPX305 Lambda Physik MBE Gen II 981-3360 Varian Associates

Inc LASER, TOPAS PRIME TP805N3 Light Conversion ELECTROMAGNET SYSTEM 3474-140 GMW Magnet

Systems Ellipsometer M2000 J.A. WOOLLAM

COMPANY

Magnetic Probing Station MPS-C-350 MicroXact

OPTICAL VECTOR ANALYZER OVA5000 LUNA

TECHNOLOGIES

Atomic Force Microscope AFM NX10 Park Systems

SPECTROMETER TRIPLE GRATING 500I ACTION

Spectral Ellipsometer DET 450 J.A. WOOLLAM

COMPANY

Ion Mill 04-0001 Fischione

Instruments Hot Disk Thermal Constants Analyser TPS2500S Thermphysical

Measurements Ins INTERFEROMETER TFP-II JRS Scientific

Instruments TI: SAPPHIRE LASER SolsTiS M Squared Interferometer Tandem TFP-1 JRS Scientific

Instruments Laser, Ti:Sapphire, Class Griffin-5 KMLabs Laser, KrF Gas, Class 3B LPX2201 Lambda Physik

MULTIBEAM OPTICAL SENSOR (MOS) MOS K-SPACE

ASSOCIATES

Scanning Auger Spectrometer None CUSTOM Plasma Analysis System EQP Hiden Analytical Precision Dicing System 7122 Advanced Dicing

Technologies Spectroscopic Ellipsometer M-2000VI J.A. WOOLLAM

COMPANY

Spectroscopic Ellipsometer EC400 J.A. WOOLLAM

COMPANY

Optical Spectrum Analyzer AP2043B Apex Multifunctional Epitaxial Growth Sys NA Locally

Manufactured

PROFILOMETER Dektak 8 Veeco

ULTRASCAN/THERMALSCAN MOS-US K-SPACE

ASSOCIATES, INC.

AMPLIFIED TI: SAPPHIRE LASER L-USP-1K-HE COHERENT INC.

VECTOR SIGNAL GENERATOR E8267D KEYSIGHT

TECHNOLOGIES

NETWORK ANALYZER 8722COPT001,006,010 HEWLETT-PACKARD

CO CORPORATE

NETWORK ANALYZER E5071C KEYSIGHT

TECHNOLOGIES

ENA SERIES VECTOR NETWORK ANALYZ E5080B KEYSIGHT

TECHNOLOGIES

UHV MICROSCOPE, SCANNING UHV635STM RHK TECH

PUMP SOURCE Equinox M Squared

SIGNAL GENERATOR MG3697C ANRITSU CO

Ion Mill 1010 Fischione

Instruments Tabletop Microscope TM3000 Hitachi Spectograph DM320i Dongwoo Optron FTIR Spectrometer Vertex 70 Bruker Helmholtz Coil HC1-3 Bartington Plasma Generator AXIA Zpulser Spectrograph SCT320 PRINCETON

INSTRUMENTS INC

Spectrograph SCT320 PRINCETON

INSTRUMENTS INC

Prism Coupler System 2010/M METRICON

ARBITRARY WAVEFORM GENERATOR AWG5202-250 TEKTRONIX INC

UV/VIS/NIR Spectrometer Cary 5000 Varian Associates

Inc FTIR Spectrometer/Microscope Hypersion 1000 Bruker AccuThermo AW610 Allwin21 Corp EM Sample Preparation Tool EM TXP LEICA

ELECTROMAGNET SYSTEM 3474 GMW

RF GENERATOR N5183B MXG KEYSIGHT

TECHNOLOGIES

DIGITAL PHOSPHOR OSCILLOSCOPE TDS7404 TEKTRONIX INC.

NETWORK ANALYZER PNA-L AGILENT

TECHNOLOGIES

VACUUM CHAMBER N/A Locally

Manufactured OpticalMultichannel Analyzer OMA 7564-0011 PRINCETON

INSTRUMENTS INC

Intensified CCD Camera DH734-18F-73 Andor

Ellipsometer V-VASE J.A. WOOLLAM

COMPANY

VACUUM CHAMBER N/A Locally Manufactured

GOVERNMENT FURNISHED PROPERTY/BASE SUPPORT

Government Furnished Property (GFP): GFP for this program is not anticipated.

However, if work is proposed to be performed off base, and no conflicts exist as to usage of equipment, GFP may be negotiated if it is in the best interest of the government.

Base Support: The offeror shall, insofar as possible, avoid incurring costs in duplicating work or support capacity available at or through AFRL/RX during the performance of the contract. Therefore, the offeror may propose to utilize any or all available Government or Government controlled working space, equipment, supplies, materials, services, or other support at or available through AFRL/RX.

The items contemplated by the clause entitled “Base Support” are as follows:

a. The Government shall provide Base Support on a no charge-for-use basis.

Several laboratories in buildings 651-655 will be made available. Office space, as well as base computer/network access, will be provided to contractor personnel working on-site. Base support will consist of internet access, office space and equipment (i.e. desks, chairs, etc.) and phone services. Use of in-house laboratories is deemed more advantageous due to location and the potential cost of duplicating unique laboratory equipment. Network access is anticipated. Systems access request and approval and requisite training will be accomplished prior to providing access.

− Government provided workspace in Building 654 will be made available, including Rooms: 105, 219, 220, 245, 246, 247, 301, 302, 303, 304, 305, 325, 326, 331, 332, 333, 334, 335, 336, 339, − Government provided laboratory and equipment access in Buildings 651-655. Examples include the Material Characterization Facility (MCF) labs in building 655, including: Scanning Electron Microscope, Transmission Electron Microscope, Atomic Force Microscope, Focused Ion Beam, Microtomy, Image analysis computer, and Metallography preparation labs.

Examples in Building 654 include the NMR lab, Biofabrication/characterization lab, Microbiology/molecular biology lab, Nanotube fabrication lab, Printed electronic lab, Photovoltaic/photophysics lab, and the Synthesis/processes lab.

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