ASME B46.1-2019_2020-06-30.pdf

Surface Texture (Surface Roughness, Waviness, and Lay)

A N I N T E R N A T I O N A L S T A N D A R D

ASME B46.1-2019

(Revision of ASME B46.1-2009)

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ASME B46.1-2019

(Revision of ASME B46.1-2009)

Surface Texture (Surface Roughness, Waviness, and Lay)

AN INTERNATIONAL STANDARD

Two Park Avenue • New York, NY • 10016 USA x

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Date of Issuance: June 30, 2020

The next edition of this Standard is scheduled for publication in 2025.

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The American Society of Mechanical Engineers Two Park Avenue, New York, NY 10016-5990

Copyright © 2020 by

THE AMERICAN SOCIETY OF MECHANICAL ENGINEERS

All rights reserved Printed in U.S.A.

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CONTENTS

Foreword . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ix

Committee Roster . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xi

Correspondence With the B46 Committee . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xii

Executive Summary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xiv

Summary of Changes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . xv

Section 1 Terms Related to Surface Texture 1-1 General 1-2 Definitions Related to Surfaces 1-3 Definitions Related to the Measurement of Surface Texture by Profiling Methods 1-4 Definitions of Surface Parameters for Profiling Methods 1-5 Definitions Related to the Measurement of Surface Texture by Area Profiling and Area

Averaging Methods 1-6 Definitions of Surface Parameters for Area Profiling and Area Averaging Methods Section 2 Classification of Instruments for Surface Texture Measurement 2-1 Scope 2-2 Recommendation 2-3 Classification Scheme Section 3 Terminology and Measurement Procedures for Profiling, Contact, Skidless

Instruments 3-1 Scope 3-2 References 3-3 Terminology 3-4 Measurement Procedure Section 4 Measurement Procedures for Contact, Skidded Instruments 4-1 Scope 4-2 References 4-3 Purpose 4-4 Instrumentation Section 5 Measurement Techniques for Area Profiling 5-1 Scope 5-2 References 5-3 Recommendations 5-4 Imaging Methods 5-5 Scanning Methods Section 6 Measurement Techniques for Area Averaging 6-1 Scope 6-2 Examples of Area Averaging Methods iii Copyright ASME International Provided by IHS Markit under license with ASME Licensee=EB - Electric Boat - Loc 1/9993263100, User=Arnold, Sandra

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Section 7 Nanometer Surface Texture and Step Height Measurements by Stylus Profiling Instruments

7-1 Scope 7-2 Applicable Documents 7-3 Definitions 7-4 Recommendations 7-5 Preparation for Measurement 7-6 Calibration Artifacts 7-7 Reports Section 8 Nanometer Surface Roughness as Measured With Phase Measuring Interferometric

Microscopy 8-1 Scope 8-2 Description and Definitions: Noncontact Phase Measuring Interferometer 8-3 Key Sources of Uncertainty 8-4 Noncontact Phase Measuring Interferometer Instrument Requirements 8-5 Test Methods 8-6 Measurement Procedures 8-7 Data Analysis and Reporting 8-8 References Section 9 Filtering of Surface Profiles 9-1 Scope 9-2 References 9-3 Definitions and General Specifications 9-4 2RC Filter Specification for Roughness 9-5 Phase Correct Gaussian Filter for Roughness 9-6 Filtering for Waviness 9-7 Filtering of Surfaces With Stratified Functional Properties Section 10 Terminology and Procedures for Evaluation of Surface Textures Using Fractal

Geometry 10-1 General 10-2 Definitions Relative to Fractal-Based Analysis of Surfaces 10-3 Reporting the Results of Fractal Analyses 10-4 References Section 11 Specifications and Procedures for Precision Reference Specimens 11-1 Scope 11-2 References 11-3 Definitions 11-4 Reference Specimens: Profile Shape and Application 11-5 Physical Requirements 11-6 Assigned Value Calculation 11-7 Mechanical Requirements 11-8 Marking 11-9 Calibration Interval Section 12 Specifications and Procedures for Roughness Comparison Specimens 12-1 Scope 12-2 References iv Copyright ASME International Provided by IHS Markit under license with ASME Licensee=EB - Electric Boat - Loc 1/9993263100, User=Arnold, Sandra

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12-3 Definitions 12-4 Roughness Comparison Specimens 12-5 Surface Characteristics 12-6 Nominal Roughness Grades 12-7 Specimen Size, Form, and Lay 12-8 Calibration of Comparison Specimens 12-9 Marking

Nonmandatory Appendices A General Notes on Use and Interpretation of Data Produced by Stylus Instruments B Control and Production of Surface Texture C A Review of Additional Surface Measurement Methods D Additional Parameters for Surface Characterization E Characteristics of Certain Area Profiling Methods F Descriptions of Area Averaging Methods G Observations on the Filtering of Surface Profiles H Reference Subroutines I A Comparison of ASME and ISO Surface Texture Parameters J Functional Standards K Suggested Terminology and Procedures for the Evaluation of Functional Correlations of

Surface Textures With Processing and Performance

Figures 1-2.1-1 Schematic Diagram of Surface Characteristics 1-3.1-1 Measured Versus Nominal Profile 1-3.1.1-1 Stylus Profile Displayed With Two Different Aspect Ratios 1-3.2-1 Filtering a Surface Profile 1-3.2-2 Examples of Nominal Profiles 1-3.3-1 Profile Peak, Valley, and Element 1-3.5-1 Surface Profile Measurement Lengths 1-4.1.1-1 Rt, Rp, and Rv Parameters 1-4.1.1-2 The Rt and Rmax Parameters 1-4.1.1-3 Illustration for the Calculation of Roughness Average Ra 1-4.1.1-4 Surface Profile Containing Two Sampling Lengths, l1 and l2, Also Showing the Rpi and Rti

Parameters 1-4.1.2-1 The Waviness Height, Wt 1-4.2-1 The Mean Spacing of Profile Elements, RSm 1-4.2-2 The Peak Count Level, Used for Calculating Peak Density 1-4.3-1 Amplitude Density Function — ADF(z) or p(z) 1-4.3-2 The Bearing Area Curve and Related Parameters 1-4.3-3 Three Surface Profiles With Different Kurtosis 1-4.3-4 The Profile Bearing Length 1-4.3-5 Three Surface Profiles With Different Skewness 1-5.1-1 Topographic Map Obtained by an Area Profiling Method 1-5.3-1 Area Peaks (Left) and Area Valleys (Right) v Copyright ASME International Provided by IHS Markit under license with ASME Licensee=EB - Electric Boat - Loc 1/9993263100, User=Arnold, Sandra

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1-6.3-1 Comparison of Profiles Measured in Two Directions on a Uniaxial Periodic Surface Showing the Difference in Peak Spacing as a Function of Direction

1-6.5-1 Indication of Surface Lay 2-1-1 Classification of Common Instruments for Measurement of Surface Texture 3-3.3-1 Profile Coordinate System 3-3.4.2-1 Conical Stylus Tip 3-3.4.3-1 Other Stylus Tip Geometries 3-3.8.3-1 Aliasing 4-1.2-1 Schematic Diagrams of a Typical Stylus Probe and Fringe-Field Capacitance Probe 4-4.2-1 Effects of Various Cutoff Values 4-4.7-1 Examples of Profile Distortion Due to Skid Motion 4-4.7-2 Examples of Profile Distortion 7-4.2.4-1 The Radius of Curvature for a Surface Sine Wave 7-4.2.5-1 Stylus Tip Touching Bottom and Shoulders of Groove 7-4.2.5-2 The Stylus Tip Contact Distance, x 8-2-1 A Typical Phase Measuring Interferometer System 8-2-2 Demonstration of the Detector Array With Element Spacing, Δ, and the Measurement of the

Longest Spatial Wavelength, λL, Covering the Total Number of Pixels, N 8-2-3 Demonstration of the Detector Array With Element Spacing, Δ, and the Measurement of the

Smallest Spatial Wavelength, λR, Covering Five Pixels 9-3.2-1 Wavelength Transmission Characteristics for the 2RC Filter System 9-3.2-2 Gaussian Transmission Characteristics Together With the Uncertain Nominal Transmission

Characteristic of a 2 μm Stylus Radius 9-3.2-3 Weighting Function of the Gaussian Profile Filter 9-5.8-1 Gaussian Transmission Characteristic for theWaviness Short-Wavelength Cutoff, λsw, or for

Deriving the Roughness Mean Line Having Cutoff Wavelengths, λc 9-5.9-1 Gaussian Transmission Characteristic for the Roughness Long-Wavelength Cutoff Having

Cutoff Wavelengths, λc 9-5.10-1 Example of a Deviation Curve of an Implemented Filter From the Ideal Gaussian Filter as a

Function of Spatial Wavelength 10-2.1.3-1 Self-Similarity Illustrated on a Simulated Profile 10-2.1.4-1 An Idealized Log-Log Plot of Relative Length (of a Profile) or Relative Area (of a Surface)

Versus the Scale of Observation 10-2.1.9-1 An IdealizedLog-Log Plot of Relative Length orRelative AreaVersus the Scale of Observation

(Length-Scale or Area-Scale Plot), Showing Multifractal Characteristics and Crossover Scales

10-2.2.1-1 Three Stepping Exercises From a Length-Scale Analysis on a Simulated Profile 10-2.2.2-1 Four Tiling Exercises From an Area-Scale Analysis 10-2.2.2.4-1 An Area-Scale Plot Including the Results of the Tiling Series in Figure 10-2.2.2-1 11-4.1-1 Type A1 Groove 11-4.1-2 Type A2 Groove 11-5.3-1 Allowable Waviness Height, Wt, for Roughness Calibration Specimens 11-7.1-1 Assessment of Calibrated Values for Type A1 11-7.2-1 Type B1 Grooves: Set of Four Grooves 11-7.2-2 Type B2 or Type C2 Specimens With Multiple Grooves 11-7.2-3 Use of Type B3 Specimen 11-7.3-1 Type C1 Grooves vi Copyright ASME International Provided by IHS Markit under license with ASME Licensee=EB - Electric Boat - Loc 1/9993263100, User=Arnold, Sandra

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11-7.3-2 Type C3 Grooves 11-7.3-3 Type C4 Grooves 11-7.4-1 Unidirectional Irregular Groove Specimen Having Profile Repetition at 5λc Intervals (Type

D1 With λc = 0.8 mm) B-2-1 Surface Roughness Produced by Common Production Methods C-2.2-1 Schmaltz Profile Microscope C-2.3-1 Reflectance Measurement C-2.4-1 Schematic Diagram of Circular Path Profiler C-2.5-1 Multiple-Beam Interferometer C-2.6-1 Differential Interference Contrast Photograph of Automobile Engine Cylinder Wall C-2.7-1 Differential Interferometry C-3-1 Zehender Method C-4.1-1 Comparison of Optical and Transmission Electron Microscopes C-4.2-1 Diagram of Scanning Electron Microscope D-2.1-1 Average Peak-to-Valley Roughness D-2.2-1 Average Spacing of Roughness Peaks D-2.3-1 Swedish Height of Irregularities D-3-1 Measured Profiles and Their Autocorrelation Functions E-3.1.1-1 Schematic Diagram of an Optical Focus-Sensing Instrument E-3.2.1-1 Schematic Diagram of Nomarski Differential Profiler E-3.3.1-1 Area Scanning Stylus Profiler E-3.4.1-1 Basic Structure of an Early STM E-3.5.1-1 Schematic Diagram of an Atomic Force Microscope With an Optical Lever Sensor E-3.6-1 Schematic Diagram of a Confocal Microscope F-1-1 Comparison of Roughness Void Volumes F-1-2 Principle of Capacitance Between Parallel Plates F-2-1 Schematic Diagram of an Instrument for Measuring TIS F-3-1 Schematic Diagram of an Instrument for Measuring ARS or BRDF H-4-1 Subroutines K-4.1-1 Roughness, Rz, Versus Feed K-4.2-1 Mean Relative Areas Versus Scale, μm, From Surfaces CreatedWith All Five Discharge Pulse

Energies K-4.2-2 Mean Area-Scale Fractal Complexities (Asfc) Versus Scale for All Pulse Energies K-4.2-3 Multiscale Correlation Strengths of the First Kind K-4.3-1 Example of Regression Analysis and a Strong Functional Correlation K-4.3-2 Multiscale Correlation Strengths of the Second Kind

Tables 3-3.20.1-1 Cutoff Values for Periodic Profiles Using RSm 3-3.20.2-1 Cutoff Values for Nonperiodic Profiles Using Ra 4-4.2-1 MeasurementCutoffs andTraversingLengths forContinuouslyAveraging InstrumentsUsing

Analog Meter Readouts 4-4.2-2 Measurement Cutoffs and Minimum Evaluation Lengths for Instruments Measuring

Integrated Roughness Values Over a Fixed Evaluation Length 9-4.3.2-1 Limits for the Transmission Characteristics for 2RC Long-Wavelength Cutoff Filters . . . 51 9-5.11-1 Typical Cutoffs for Gaussian Filters and Associated Cutoff Ratios vii Copyright ASME International Provided by IHS Markit under license with ASME Licensee=EB - Electric Boat - Loc 1/9993263100, User=Arnold, Sandra

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9-6.3-1 Typical Values for theWaviness Long-Wavelength Cutoff, λcw, and RecommendedMinimum Values for the Waviness Traversing Length

10-3-1 Example of a Report on Fractal Analysis 11-7.1-1 Nominal Values of Depth or Height and Examples of Width for Type A1 11-7.1-2 Nominal Values of Depth or Radius for Type A2 11-7.1-3 Tolerances and Uncertainties for Types A1 and A2 11-7.2-1 Tip Size Estimation From the Profile Graph for Type B1 11-7.3-1 Typical Ra and RSm Values for Type C1 11-7.3-2 Tolerances and Uncertainties for Types C1 Through C4 11-7.3-3 Typical Values of Ra and RSm for Type C2 11-7.3-4 Typical Values of Ra for Type C4 11-7.4-1 Tolerances and Uncertainties for Types D1 and D2 12-6-1 Nominal Roughness Grades, Ra, for Roughness Comparison Specimens 12-7-1 FormandLayofRoughnessComparisonSpecimensRepresentingVariousTypesofMachined

Surfaces 12-8-1 Examples of Sampling Lengths for Calibration of Comparison Specimens, mm I-1 ASME B46.1-2019 Parameters J-1 Reference Standards K-3-1 Elements for Reporting a Functional Correlation viii Copyright ASME International Provided by IHS Markit under license with ASME Licensee=EB - Electric Boat - Loc 1/9993263100, User=Arnold, Sandra

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FOREWORD

The first standard on surface texture was issued in March 1940. The dates for the subsequent changes are as follows:

Revision — February 1947 Revision — March 1985 Revision — January 1955 Revision — June 1995 Revision — September 1962 Revision — October 2002 Revision — August 1971 Revision — October 2009 Revision — March 1978

The current revision is the culmination of a major effort by the ASME B46 Committee on the Classification and Des-ignation of SurfaceQualities. A considerable amount of newmaterial has been added, particularly to reflect the increasing number of surfacemeasurement techniques and surface parameters inpractical use. Overall, the vision forASMEB46.1 is twofold as follows:

(a) to keep it abreast of the latest developments in the regime of contact profiling techniques where the degree of measurement control is highly advanced

(b) to encompass a large range of other techniques that present valid and useful descriptions of surface texture Technical drawings referring to a specific edition of ASME B46.1 (e.g., ASME B46.1-2009) refer to the rules and definitions given in that edition of the surface texture standard as indicated. For technical drawings that do not indicate a specific editionof theASMEB46.1 surface texture standard, the rules anddefinitions given in theASMEB46.1 revision in effect at the release date of the drawing shall be used.

The ASME B46 Committee contributes to international standardization activities related to surface texture measure-ment and analysis as referenced in ISO/TR 14368:1995, Geometrical Product Specification (GPS) — Masterplan.

The present Standard includes 12 Sections as follows:

Section 1, Terms Related to Surface Texture, contains a number of definitions that are used in other Sections of the

Standard. A large number of surface parameters are defined in addition to roughness average, Ra. These include rms roughness Rq, waviness heightWt, the mean spacing of profile elements RSm, and several statistical functions, as well as surface parameters for area profiling techniques.

Section 2, Classification of Instruments for Surface Texture Measurement, defines six types of surface texture measuring instruments including several types of profiling instruments, scanned probe microscopy, and area averaging instruments.With this classification scheme, future Sectionsmay provide for the specification on drawings of the type of instrument to be used for a particular surface texture measurement.

Section 3, Terminology and Measurement Procedures for Profiling, Contact, Skidless Instruments, is based on propo-sals by ISO Technical Committee 57 to define the characteristics of instruments that directly measure surface profiles, which then can serve as input data to the calculations of surface texture parameters.

Section 4, Measurement Procedures for Contact, Skidded Instruments, contains much of the information that was previously contained in ASME B46.1-1985 for specification of instruments primarily intended for measurement of aver-aging parameters such as the roughness average Ra.

Section 5,Measurement Techniques for Area Profiling, lists a number of techniques, many of themdeveloped since the mid-1980s, for three-dimensional surface mapping. Because of the diversity of techniques, very few recommendations canbe given in Section5at this time to facilitate uniformity of results betweendifferent techniques.However, this Section does allow for the measurement of the area profiling parameters, Sa and Sq, as alternatives to the traditional profiling parameters.

Section6,MeasurementTechniques forAreaAveraging, discusses theuse of area averaging techniques as comparators to distinguish the surface texture of partsmanufactured by similar processes. In later Sections, surface parameters based directly on these techniques may be defined or surface specifications may be proposed that call for measurements by these types of instruments.

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Section 7, Nanometer Surface Texture and Step Height Measurements by Stylus Profiling Instruments, addresses the use of contacting profilometry in the measurement of surface texture features whose height dimensions are typically measuredwithin the scale of nanometers. Section 7may be applicable to such industries as semiconductor, data storage, and microelectromechanical systems (MEMS) manufacturers.

Section 8, Nanometer Surface Roughness as Measured With Phase Measuring Interferometric Microscopy, addresses theuseof optical noncontact techniques formeasuringhighly polished surfaces. Section8maybe applied to themeasure-ment of such items as polished silicon wafers, optical components, and precision mechanical components.

Section 9, Filtering of Surface Profiles, carries on with the traditional specifications of the 2RC cutoff filter and intro-duces the phase corrected Gaussian filter as well as band-pass roughness concepts.

Section 10, Terminology and Procedures for Evaluation of Surface Textures Using Fractal Geometry, introduces the field of fractal analysis as applied to measuring surface texture. Introductions of various techniques and terms are included to allow for lateral scale specific interpretation of surface texture.

Section 11, Specifications and Procedures for Precision Reference Specimens, describes different types of specimens useful in thecalibrationand testingof surfaceprofiling instruments. It isbasedon ISO5436,Part1,MaterialMeasures, and contains new information as well.

Section 12, Specifications and Procedures for Roughness Comparison Specimens, describes specimens that are useful for the testing and characterization of area averaging instruments.

ASME B46.1-2019 was approved by the American National Standards Institute on October 22, 2019.

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ASME B46 COMMITTEE

Classification and Designation of Surface Qualities

(The following is the roster of the Committee at the time of approval of this Standard.)

STANDARDS COMMITTEE OFFICERS

T. B. Renegar, Chair

D. J. Schertz, Vice Chair L. Chan, Secretary

STANDARDS COMMITTEE PERSONNEL

E. P. Becker, Friction and Wear Solutions, LLC T. S. Bergstrom, Worcester Polytechnic Institute C. A. Brown, Worcester Polytechnic Institute L. Chan, The American Society of Mechanical Engineers J. R. Clark, Woodward, Inc.

D. K. Cohen, Michigan Metrology, LLC P. J. deGroot, Zygo Corp.

W. V. Holzhauer, Consultant S. Ledger, Cummins, Inc.

D. Lombardo, GE Global Research B. Ludwick, Jenoptik Automotive North America, LLC M. C. Malburg, Digital Metrology Solutions, Inc.

J. A. O’Hearn, Supfina Machine Co., Inc.

J. Raja, University of North Carolina S. K. Ramasamy, Apple, Inc.

T. B. Renegar, National Institute of Standards and Technology D. J. Schertz, Koyo/Jtekt M. Stewart, Numerical Engineering Research and Design A. N. Tabenkin, A T Consulting H. D. Tran, Sandia National Laboratories T. V. Vorburger, National Institute of Standards and Technology E. S. Widder, Federal-Mogul Corp.

E. R. Olear, Honorary Member, Consultant

PROJECT TEAM POOL

P. Bari, ZF Group M. T. Bell, REM Surface Engineering L. Bergquist, Deere and Co.

C. Canetta, The MITRE Corp.

A. Diaz, REM Surface Engineering V. V. Dunaevsky, Consultant M. L. Fink, Boeing J. Fox, National Institute of Standards and Technology C. L. Giusca, National Physical Laboratory J. E. Gockel, Consultant M. Ham, Consultant I. N. Kerns, Retired J. S. Kozar, Ford Motor Co.

J. Kramer, Zygo Corp.

G. P. Manogharan, The Pennsylvania State University R. J. McNaughton, Honeywell Technology Solutions, Inc.

S. P. Moylan, National Institute of Standards and Technology A. Narayanaperumal, Indian Institute of Technology Madras, Chennai

K. Ni, The Timken Co.

S. Pun, Aeroject Rocketdyne D. G. Richards II, Microtek Finishing P. Ried, Jr., Ried and Associates, LLC A. L. Rivard, LAI International J. Salsbury, Mitutoyo America Corp.

D. J. Sisemore, Advanced Measuring Systems J. Soons, National Institute of Standards and Technology P. J. Stack, Truegage J. O. Vera, Consultant R. A. Wasilesky, Metris USA, Inc.

C. M. Wichern, Nanofocus, Inc.

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CORRESPONDENCE WITH THE B46 COMMITTEE

General. ASME Standards are developed and maintained with the intent to represent the consensus of concerned interests. As such, users of this Standard may interact with the Committee by requesting interpretations, proposing revisions or a case, and attending Committee meetings. Correspondence should be addressed to:

Secretary, B46 Standards Committee The American Society of Mechanical Engineers Two Park Avenue New York, NY 10016-5990 http://go.asme.org/Inquiry

Proposing Revisions. Revisions are made periodically to the Standard to incorporate changes that appear necessary or desirable, as demonstrated by the experience gained from the application of the Standard. Approved revisions will be published periodically.

This Standard is always open for comment and the Committeewelcomes proposals for revisions to this Standard. Such proposals should be as specific as possible, citing the paragraph number(s), the proposed wording, and a detailed description of the reasons for the proposal, including any pertinent documentation.

Proposing a Case. Casesmay be issued to provide alternative rules when justified, to permit early implementation of an approved revision when the need is urgent, or to provide rules not covered by existing provisions. Cases are effective immediately upon ASME approval and shall be posted on the ASME Committee web page.

Requests for Cases shall provide a Statement of Need and Background Information. The request should identify the

Standard and the paragraph, figure, or table number(s), and be written as a Question and Reply in the same format as existing Cases. Requests for Cases should also indicate the applicable edition(s) of the Standard to which the proposed Case applies.

Interpretations. Upon request, the B46 Standards Committeewill render an interpretation of any requirement of the Standard. Interpretations canonlybe rendered in response to awritten request sent to theSecretaryof theB46Standards Committee.

Requests for interpretation should preferably be submitted through the online Interpretation Submittal Form. The form is accessible at http://go.asme.org/InterpretationRequest. Upon submittal of the form, the Inquirer will receive an automatic e-mail confirming receipt.

If the Inquirer is unable to use the online form, he/she may mail the request to the Secretary of the B46 Standards

Committee at the above address. The request for an interpretation should be clear and unambiguous. It is further rec-ommended that the Inquirer submit his/her request in the following format:

Subject: Cite the applicable paragraph number(s) and the topic of the inquiry in one or two words.

Edition: Cite the applicable edition of the Standard for which the interpretation is being requested.

Question: Phrase the question as a request for an interpretation of a specific requirement suitable for general understanding and use, not as a request for an approval of a proprietary design or situation. Please provide a condensed and precise question, composed in such away that a “yes” or “no” reply is acceptable.

Proposed Reply(ies): Provide a proposed reply(ies) in the form of “Yes” or “No,” with explanation as needed. If entering replies to more than one question, please number the questions and replies.

Background Information: Provide the Committee with any background information that will assist the Committee in understanding the inquiry. The Inquirer may also include any plans or drawings that are necessary to explain the question; however, they should not contain proprietary names or information.

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Requests that arenot in the format describedabovemaybe rewritten in the appropriate formatby theCommitteeprior to being answered, which may inadvertently change the intent of the original request.

Moreover, ASME does not act as a consultant for specific engineering problems or for the general application or understanding of the Standard requirements. If, based on the inquiry information submitted, it is the opinion of the Committee that the Inquirer should seek assistance, the inquiry will be returned with the recommendation that such assistance be obtained.

ASMEprocedures provide for reconsideration of any interpretationwhen or if additional information thatmight affect an interpretation is available. Further, persons aggrieved by an interpretation may appeal to the cognizant ASME Committee or Subcommittee. ASME does not “approve,” “certify,” “rate,” or “endorse” any item, construction, proprietary device, or activity.

Attending Committee Meetings. The B46 Standards Committee regularly holds meetings and/or telephone confer-ences that are open to the public. Personswishing to attend anymeeting and/or telephone conference should contact the Secretaryof theB46StandardsCommittee. FutureCommitteemeetingdates and locations canbe foundon theCommittee Page at http://go.asme.org/B46committee.

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EXECUTIVE SUMMARY

1 GENERAL

In cases of disagreement regarding the interpretationof surface texture measurements, it is recommended that measurements with skidless stylus–based instruments with Gaussian filtering be used as the basis for interpreta-tion. The following keymeasurement parametersmust be established for proper surface texture specification and measurement.

2 FILTERING

The spatial wavelengths to be included in a surface texture measurement are generally limited by digital band-pass filtering. For measurement of roughness, short-wavelength cutoff, λs, specifies the short spatial wavelength limit and is defined as the wavelength where the Gaussian filter will attenuate the true profile by 50%. Spatialwavelengths less than λs are severely atte-nuated and minimally contribute to the roughness measurement.

The roughness long-wavelength cutoff, λc, specifies the long spatial wavelength limit and is defined as the wave-length where the Gaussian filter will attenuate the true profile by 50%. Spatial wavelengths greater than λc are severely attenuated and minimally contribute to the roughness measurement.

The ratio of λc to λs (λc:λs) is the bandwidth of the measurement. Some instruments allow the selection of λc and λs individually and/or the selection of a bandwidth, typically 100:1 or 300:1. The spatial wavelengths comprising the texture between λs and λc are minimally attenuated by the Gaussian filter.

The cutoffs, λc and λs, should be chosen by the designer in light of the intended function of the surface. When choosing λc and λs, one must be cognizant that the surface features not measured within the roughness cutoff bandwidth may be quite large and may affect the intended function of the surface. Thus in some cases it may be necessary to specify both surface rough-ness and waviness.

When surface waviness control is important, digital band-pass filtering is applied similarly as it is for rough-ness filtering. For waviness, the waviness short-wave-length cutoff, λsw, and waviness long-wavelength cutoff, λcw, are applied to obtain the waviness profile.

An important consideration is the correspondence of the roughness long-wavelength cutoff and the waviness short-wavelength cutoff. When these respective cutoff values are not equal, the discrimination of the roughness and waviness features of a given surface can become confounded.

On all surface texture specifications as of January 1997, λc and λsmust be stated. When λc and λs are not specified, guidelines are given in paras. 3-3.20.1 and 3-3.20.2 for the metrologist to establish λc and λs. These guidelines are intended to include the dominant features of the surface in the measurement whether these surface features are relevant to the function of the surface or not.

3 STYLUS TIP RADIUS

The stylus tip radius may be chosen by the designer or metrologist based on the value of λs (i.e., the short-wave-length cutoff). For λs equal to 2.5 μm, the tip radius should typically be2μmor less. For λs equal to8μm, the tip radius should typically be 5 μm or less. For λs equal to 25 μm, the tip radius should typically be 10 μm or less.

4 STYLUS FORCE

The maximum static measuring force is determined by the radius of the stylus and is chosen to assure minimal damage to the surface and that constant contact is main-tained with the surface. Specific recommendations for stylus force may be found in para. 3-3.5.2.

5 MEASUREMENT PARAMETERS

Many surface finish height parameters are in use throughout the world. From the simplest specification of a single roughness parameter to multiple roughness and waviness parameter specifications of a given surface, product designers have many options for speci-fying surface texture to control surface function. Between these extremes, designers should consider the need to control roughness height (e.g., Ra or Rz), roughness height consistency (e.g., Rmax), and waviness height (e.g., Wt). Waviness is a secondary longer wavelength feature that is only of concern for particular surface func-tions and finishing processes. A complete description of the various texture parametersmay be found in Section 1.

6 SURFACE TEXTURE SYMBOLS

Once the various key measurement parameters are established, ISO 1302:2002 may be used to establish the proper indication on the relevant engineering draw-ings.

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ASME B46.1-2019

SUMMARY OF CHANGES

Following approval by the ASMEB46 Committee and ASME, and after public review, ASMEB46.1-2019was approved by the American National Standards Institute on October 22, 2019.

In ASME B46.1-2019, the figures and tables have been redesignated based on their parent paragraph, and the cross-references have been updated accordingly. ASME B46.1-2019 includes the following additional changes identified by a margin note, (19).

Page Location Change 1 1-1.4 Address of ISO updated 3 1-3.3 Definitions of profile element, profile peak, profile peak height, profile valley, and profile valley depth revised 7 Figure 1-3.3-1 Former Figure 1-6 revised 9 1-4.2 Definitions of mean spacing of profile elements, peak density, SAE peak, and spacing parameter revised 10 Figure 1-4.2-1 Former Figure 1-13 revised 13 1-4.4 In first equation, symbol between dZ and dx corrected to division symbol 20 Figure 1-6.5-1 Former Figure 1-23 revised 24 3-2 Address of ISO updated 29 Table 3-3.20.1-1 Former Table 3-1 editorially revised 29 Table 3-3.20.2-1 Former Table 3-2 editorially revised 31 4-2 Address of ISO updated 36 5-2 Address of ISO updated 38 7-2 Address of ISO updated 47 9-2 Address of ISO updated 51 Table 9-4.3.2-1 Former Table 9-1 editorially revised 63 11-2 Address of ISO updated 71 Table 11-7.3-1 Former Table 11-5 revised 72 Table 11-7.3-3 Former Table 11-7 revised 73 Table 11-7.3-4 Former Table 11-8 revised 75 12-2 Address of ISO updated 82 Nonmandatory Appendix B, B-5 Added 91 Nonmandatory Appendix D D-1 added and subsequent sections redesignated 94 Nonmandatory Appendix E E-1 added and subsequent sections redesignated 104 Nonmandatory Appendix G Section headings G-1 and G-2 editorially added 117 Nonmandatory Appendix J Updated 118 Nonmandatory Appendix K Added xv Copyright ASME International Provided by IHS Markit under license with ASME Licensee=EB - Electric Boat - Loc 1/9993263100, User=Arnold, Sandra

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Section 1 Terms Related to Surface Texture

1-1 GENERAL

1-1.1 Scope

This Standard is concerned with the geometric irregu-laritiesof surfaces. It defines surface textureand its consti-tuents: roughness, waviness, and lay. It also defines parameters for specifying surface texture.

The terms and ratings in this Standard relate to surfaces produced by such means as abrading, casting, coating, cutting, etching, plastic deformation, sintering, wear, and erosion.

1-1.2 Limitations

This Standard is not concerned with error of form and flaws, but discusses these two factors to distinguish them from surface texture.

This Standard is not concernedwith luster, appearance, color, corrosion resistance, wear resistance, hardness, subsurface microstructure, surface integrity, and many other characteristics that may govern functional consid-erations in specific applications.

This Section does not recommend specific surface roughness, waviness, or type of lay suitable for specific purposes, nor does it specify the means by which these irregularities may be obtained or produced. Criteria for selection of surface qualities and information on instrument techniques and methods of producing, controlling, and inspecting surfaces are included in the other Sections and in the Appendices.

Surface texture designations as delineated in this Stan-dard may not provide a sufficient set of indices for describing performance. Other characteristics of engi-neering components such as dimensional and geometrical characteristics, material, metallurgy, and stress must also be controlled.

1-1.3 SI Values

Values of quantities stated in the SI1 (metric) systemare to be regarded as standard. Approximate nonmetric equivalents are shown for reference.

1-1.4 ð19ÞReferences

Unless otherwise specified on the engineering drawing or other relevant documents, this Standard is to be used in conjunction with ISO 1302:2002, which prescribes engi-neering drawing and other related documentation prac-tices for specifying surface texture. Relevant standards that may be used in design and measurement are the following:

ASME B89.6.2-1973 (R2003), Temperature and Humidity Environment for Dimensional Measurement

ASME Y14.5M-1994 (R2004), Dimensioning and Toler-ancing, Engineering Drawings and Related Documenta-tion Practices

Publisher: The American Society of Mechanical Engineers (ASME), Two Park Avenue, New York, NY 10016-5990 (www.asme.org)

ISO 1302:2002, Geometrical Product Specifications (GPS)

— Indication of surface texture in technical product documentation

Publisher: International Organization for Standardization (ISO), Central Secretariat, ChemindeBlandonnet8,Case Postale 401, 1214 Vernier, Geneva, Switzerland (www.iso.org)

Nonmandatory Appendix J, Table J-1 is a partial list of specific industry standards that reference surface texture specifications. Users are encouraged to submit additional industry standards to be considered as references in Nonmandatory Appendix J.

References to other useful works are included as foot-notes.

1-1.5 Cleanliness

Normally, surfaces to bemeasured should be free of any foreign material that would interfere with the measure-ment.

1-2 DEFINITIONS RELATED TO SURFACES

1-2.1 Surfaces measured surface: a representation of the real surface obtained by the use of a measuring instrument.

1 Le Système International d’Unités.

ASME B46.1-2019

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real surface: the actual boundary of an object. Its devia-tions from the nominal surface stem from the processes that produce the surface.

surface: the boundary that separates an object from another object, substance, or space.

1-2.2 Components of the Real Surface

The real surface differs from the nominal surface to the extent that it exhibits surface texture, flaws, and errors of form. It is considered as the linear superposition of roughness, waviness, and form with the addition of flaws.

error of form:widely spaced deviations of the real surface from the nominal surface, which are not included in surface texture. The term is applied to deviations caused by such factors as errors in machine tool ways, guides, or spindles; insecure clamping or incorrect align-ment of the workpiece; or uneven wear. Out-of-flatness and out-of-roundness2 are typical examples.

flaws: unintentional, unexpected, and unwanted interrup-tions in the topography typical of a surface. Topography is defined inpara. 1-5.1.However, these topographical inter-ruptions are considered to be flaws only when agreed upon in advance by buyer and seller. If flaws are specified, the surface should be inspected by somemutually agreed-uponmethod to determinewhether flaws are present and whether they are to be rejected or accepted prior to performing final surface roughness measurements. If specified flawsarenotpresent, or if flawsarenot specified, then interruptions in the surface topography of an engi-neering component may be included in roughness measurements.

lay: thepredominant directionof the surfacepattern, ordi-narily determined by the production method used (see para. 1-6.5 and Figure 1-6.5-1).

roughness: the finer spaced irregularities of the surface texture that usually result from the inherent action of the production process or material condition. These might be characteristic marks left by the processes listed in Nonmandatory Appendix B, Figure B-2-1.

surface texture: the composite of certain deviations that are typical of the real surface. It includes roughness and waviness.

waviness: the more widely spaced component of the surface texture. Waviness may be caused by such factors as machine or workpiece deflections, vibration, and chatter. Roughness may be considered as superim-posed on a wavy surface.

Figure 1-2.1-1 Schematic Diagram of Surface Characteristics

Normal sectionFlaw (unspecified)

Nominal surface

Lay

Total profile (includes error in geometric form)

Roughness profile (waviness heights attenuated)

Waviness profile (roughness heights attenuated)

2 ASME/ANSI B89.3.1-1972 (R1997), Measurement of Out-of- Roundness.

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1-3 DEFINITIONS RELATED TO THE

MEASUREMENT OF SURFACE TEXTURE BY

PROFILING METHODS

The features defined in para. 1-2.2 are inherent to surfaces and are independent of the method of measure-ment. Methods of measurement of surface texture can be classified generally as contact or noncontact methods and as three-dimensional (area) or two-dimensional (profile) methods.

1-3.1 Profiles form-suppressed profile: a modified profile obtained by various techniques to attenuate dominant form such as curvature or tilt. An example of a mechanical technique involves the use of a skidded instrument (see Section 4).

measured profile: a representation of the real profile o b t a i n e d b y a me a s u r i n g i n s t r umen t ( s e e Figure 1-3.1-1). Theprofile is usually drawn in an x-z coor-dinate system.

modified profile: a representation of the measured profile for which various mechanisms (electrical, mechanical, optical, or digital) are used to minimize certain surface texture characteristics and emphasize others. Modified profiles differ from unmodified, measured profiles in ways that are selectable by the instrument user, usually for the purpose of distinguishing surface rough-ness from surface waviness.

By previous definition (see para. 1-2.2), roughness irre-gularities are more closely spaced than waviness irregu-larities. Roughness can thus be distinguished from waviness in terms of spatial wavelengths along the path traced. Seepara. 1-3.4 for adefinitionof spatialwave-length.Nounique spatialwavelength isdefined thatwould distinguish roughness from waviness for all surfaces.

nominal profile: a profile of the nominal surface; a straight line or smooth curve (see Figure 1-3.2-2).

primary profile: a modified profile after the application of the short-wavelength filter, λs (see Section 9).

NOTE: This corresponds to P (profile) parameters per ISO 4287:1997.

profile: the curve of intersection of a normal sectioning plane with the surface (see Figure 1-2.1-1).

profiling method: a surface scanning measurement tech-nique that produces a two-dimensional graph or profile of the surface irregularities as measurement data.

real profile: a profile of the real surface.

roughness profile: the modified profile obtained by filtering to attenuate the longer spatial wavelengths asso-ciated with waviness (see Figure 1-2.1-1).

waviness profile: themodified profile obtained by filtering to attenuate the shorter spatial wavelengths associated with roughness and the longer spatial wavelengths asso-ciated with the part form.

1-3.1.1 Aspect Ratio. In displays of surface profiles generated by instruments, heights are usually magnified many times more than distances along the profile (see Figure 1-3.1.1-1).3 The sharp peaks and valleys and the steep slopes seen on such profile representations of surfaces are thus greatly distorted images of the rela-tively gentle slopes characteristic of actual measured profiles.

1-3.2 Reference Lines mean line (M): the reference line about which the profile deviations are measured. The mean line may be deter-mined in several ways as discussed below.

filtered mean line: the mean line established by the selected cutoff filter (see para. 1-3.5) and its associated analog or digital circuitry in a surface measuring instru-ment. Figure 1-3.2-1 illustrates the electrical filtering of a surface profile. It shows the unfiltered profile in Figure 1-3.2-1, sketch (a), along with the filtered mean line or waviness profile. The difference between the unfiltered profile and the waviness profile is the roughness profile shown in Figure 1-3.2-1, sketch (b).

least squares mean line: a line having the form of the nominal profile and dividing the profile so that, within a selected length, the sum of the squares of the profile deviations from this line is minimized. The form of the nominal profile could be a straight line or a curve (see Figure 1-3.2-2).

1-3.3 ð19ÞPeaks and Valleys, Height Resolution, and Height Range height (z) range: the largest overall peak-to-valley surface height that can be accurately detected by a measuring instrument. This is a key specification for a measuring instrument.

profile element: a profile peak followed by a profile valley or a profile valley followed by a profile peak (see Figure 1-3.3-1).

Figure 1-3.1-1 Measured Versus Nominal Profile z x

Measured profile

Nominal profile

3 R. E. Reason, Modern Workshop Technology, 2 — Processes, H. W.

Baker, ed., 3rd edition (London: Macmillan, 1970): Chapter 23.

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profile peak height: maximum height of the profile peak (see Figure 1-3.3-1).

profile valley: the portion of a profile that lies below the mean line and between two intersections of the profile with the mean line (see Figure 1-3.3-1).

profile valley depth: maximum depth of the profile valley (see Figure 1-3.3-1).

system height (z) resolution: theminimum…