AFM Technical Requirements.docx.docx

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AFM Microscope
Solicitation number
4-B176-Q-00581-00
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This document contains the technical requirements for an Atomic Force Microscope (AFM) that Argonne National Laboratory is seeking to procure through a federal contract opportunity. The key requirements include sensor noise specifications, standard and upgradable operating modes, and installation parameters. The related federal contract opportunity is seeking offers for an AFM microscope that meets these minimum requirements. The solicitation has an offer due date of July 5, 2024 at 12:00pm CDT, and offers will be evaluated on the basis of lowest price, technically acceptable. The solicitation requests information on country of origin, lead time, pricing justification, and evidence of technical compliance.

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AFM Requirement for Procurement

XY sensor noise (closed loop)
< 100pm
Z noise floor/height noise (closed loop)
< 20pm
Standard operating modes
Contact mode

Tapping mode (air) Tapping mode (fluid) Phase imaging Dual frequency resonance tracking Force modulation Frequency modulation Force volume Electrostatic force microscopy (EFM) Kelvin probe force microscopy (KPFM) Lateral force microscopy (LFM) Magnetic force Microscopy (MFM) Piezoresponse force microscopy (PFM) Nanolithography Nanomanipulation

Upgradable operating modes
STM

Conductive AFM (C-AFM) Electrochemical strain microscopy (ESM) Viscoelastic mapping mode

Standard capabilities
Fast scan (line rate >20Hz)

Temperature control (0-250℃) Imaging in stable fluid (with ways to reduce imaging noise in fluids)

Upgradable capabilities
Imaging with liquid perfusion onto sample

(optional: video rate imaging for dynamic process characterization)

Installation requirements
No stand-alone vibration isolation table needed for AFM (the AFM will be placed directly onto firm table in lab)

Table size for controller and computer is smaller than 30’’ x 80’’

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