3. XRT_RFI 10-15-2024.pdf

PDF 179 KB Posted Oct 15, 2024

Attached to: 455357 - X-ray Microscope and Sample Preparation - RFI
Solicitation number: 455357
Issued by: Department of Energy Office of Science

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Written by GovTribe AI · Oct 15, 2024

This document is a Request for Information (RFI) from Brookhaven Science Associates (BSA), the operator of Brookhaven National Laboratory (BNL), regarding a potential acquisition of an X-ray microscope system and sample preparation tool for the Center for Functional Nanomaterials (CFN).

The RFI seeks information on vendors' capabilities to provide an X-ray microscope system with at least 50nm pixel resolution, able to image solid samples between 1-50μm in diameter, and a sample preparation tool to prepare samples for the microscope. The microscope should operate between 5-9keV X-ray energy and enable tomographic imaging of the samples in under 24 hours. The sample preparation tool should be able to prepare samples with 10-50μm diameter and at least 5μm height, using methods like laser ablation or focused ion beam. Both the microscope and sample preparation tool should have computer control and software capabilities. Interested vendors are asked to provide a statement of capabilities and answer the questions in the RFI by the due date of October 30, 2024. This is for information gathering purposes only and does not constitute a solicitation at this time.

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Request for Information (RFI) 455357

X-ray Microscope and Sample Preparation

Overview

Brookhaven Science Associates (BSA) supports the Nanoscale Science Research Center Recapitalization Project (NSRC-Recap) which is adding new and updated capabilities to the Department of Energy’s nanoscience infrastructure. As part of the work, BSA is potentially seeking to acquire a suite of tools that includes an X-ray microscope with a visualization workstation and at least one sample preparation tool for the Center for Functional Nanomaterials (CFN) at Brookhaven National Laboratory (BNL).

1. General

1.1. This specification describes the requirements for a suite of a lab-based X-ray microscope system and a sample preparation tool at the Center for Functional Nanomaterials (CFN) at Brookhaven National Laboratory. The suite of tools will include the following components: (A) an X-ray microscope with a visualization workstation and (B) at least one sample preparation tool. We are interested in bids for a single component or both. The microscope and sample preparation can either be integrated or separate.

This X-ray microscope system shall be capable of 50nm pixel resolution or better using X-rays with photon energy sufficient for measuring sample volumes between 1-50µm. The sample preparation must provide a way to fashion samples to geometries acceptable for high resolution microscopy.

2. Principal Configuration

2.1. The X-ray Microscope should have at least one X-ray energy between 5-9keV (Cr, W source). We are interested in solutions that have multiple energies. The microscope will enable collection of images from solid samples with a cylindrical geometry with diameter from 1-50µm and should take less than 24 hours.

2.2. The Sample Preparation System shall have the capability to prepare solid samples with a geometry acceptable for direct transfer to the X-ray microscope. The system can be either standalone or connected to the X-ray microscope. We will consider a variety of sample preparations, such as laser ablation or focused ion beam milling.

2.3. Both the X-ray microscope and the sample preparation system shall be controlled via software that has the ability for writing scripts for data collection. The microscope and sample preparation can be controlled by different computers.

2.4. The X-ray microscope shall come with a separate visualization workstation.

2.5. The system shall conform to all power, safety and environmental specifications.

3. Performance Requirements

3.1. X-ray Microscope

3.1.1. The system shall perform x-ray tomography using approx. 5-9KeV x-rays.

3.1.2. There shall be at least one x-ray source, preferably more.

3.1.3. The system shall have a pixel wise resolution of 50nm or better.

3.1.4. The system shall enable collection of images from solid samples with diameter from 1-50µm.

3.1.5. The collection of a tomogram should take less than 24hours.

3.1.6. The system should have Zernike phase contrast

3.1.7. The system should have the ability to accommodate future accessories, for example, ports to allow for in-situ heating, biasing or nanoindentation communication cables.

3.1.8. The sample shall be on a high accuracy rotation stage with motorized XY motion.

3.1.9. The analysis chamber should have at least one internal camera for alignment purposes.

3.1.10. The system shall have a detector either scintillator based or direct photon counting detector

3.1.11. Shall include options for correlative measurements such as EDS, Raman, PL.

3.2. Sample Preparation

3.2.1. The sample preparation tool shall have the capability to prepare samples with a geometry acceptable for direct transfer to the X-ray microscope. The samples should have a diameter between 10-50 microns, with a height of at least 5 microns. We would prefer solutions that can prepare a 2um diameter.

3.2.2. The macroscopic sample geometry should allow for manipulation by tweezer or nano-manipulator to load the sample into the X-ray microscope.

3.2.3. Sample preparation can be prepared via laser ablation or focused ion beam.

3.2.4. If laser ablation is the sample preparation method, a pico or femto-second laser shall be used.

3.2.5. Sample introduction to the X-ray microscope can be manual or automated.

3.2.6. Samples prepared via focused ion beam should include a nanomanipulator, and gas injection system for enabling soldering samples to tomography carriers.

3.2.7. If a vacuum environment is used for sample preparation, the vacuum pumps shall be oil free.

3.3. Computer and Software

3.3.1. The X-ray microscope and sample preparation systems shall include a complete set of computer and software to enable the use of all the instrumentation. Each component can have a separate computer.

3.3.2. All software shall provide an easy to use graphical user interface, direct access to all commonly performed functions, and preferably shall be scriptable/user-extendable with a powerful programming or macro language providing access to and programming of all functions.

3.3.3. Automated alignment routines should be included for maintaining the sample in the field of view by bringing the same to the rotation center.

3.3.4. All data shall be stored in a suitable loss-less format, with transparent and fully documented data structure for adaptation/import into external third-party analysis programs.

3.3.5. The X-ray microscope software shall allow for automated Collection of projection images to collect either in series or in batches from 0-180 degrees with angular steps at 0.1 degrees or better.

3.4. Reconstruction and Visualization Workstation

3.4.1. The X-Ray microscope system shall include a separate workstation intended for the reconstruction and visualization of data collected from the equipment.

3.4.2. The computer shall include at least 128 GB RAM

3.4.3. The computer shall have dedicated graphics to satisfy data reconstruction and visualization requirements with at least 12 GB of dedicated VRAM

3.4.4. The computer shall have a solid-state storage drive with at least a 6 Tb capacity.

3.4.5. The software should include the option for input signal from other software (for example LabView, python) to control system components and the and ability to output signals to other software

3.4.6. Reconstruction-software to translate projections to 3D volumes shall be included. We would be interested in possible stitching between volumes with minimal overlap (<5%).

3.5. Power, Environment and Safety

3.5.1. The X-ray source, all accessories, and the system configuration must meet X-ray safety specifications.

3.5.2. The vendor shall be responsible for the installation of all components and provision of all interconnecting power, communication, control and instrument cabling, and all liquid and gas piping, and tubing between components and to the supply points identified by BSA.

3.5.3. Any laser systems shall be fully interlocked, including viewport covers, sample temperature, chamber pressure, and other relevant parameters, and operate as a class 1 - laser system.

3.5.4. If any components use radio frequencies, radiofrequency radiation exposures limits shall not exceed Threshold Limit Values (ACGIH TLV – 2016) and Safety Levels (ANSI/ IEEE C95.1).

Questions:

1. Can you provide (A) X-ray microscope with a visualization workstation, (B) a sample preparation tool, or both components? Are the components offered in a connected configuration or separately?

2. What anode materials are available for X-ray generation and what are the corresponding X-ray energies?

3. What are room requirements for the instrument (temperature control, electricity, vibrational etc.)?

4. What are the footprints of the proposed equipment?

5. Would the system have specialized options for sample holders? What limitations are there for sample geometries?

6. Does the X-ray safety conform to ANSI N43.3?

7. If the system has any lasers, will the system be configured to operate as a class 1?

8. If certain requirements cannot be met, please indicate what can be achieved and demonstrated.

9. Would the system be manufactured in the United States? If so, does it meet the definition of domestic end product as defined at FAR 25.101(a). If not, what is the country of origin of the product?

10. Do you offer NRTL certification?

11. Please specify if the company’s proposed product is considered a commercial product as defined in FAR

2.101?

12. Can all work pertaining to maintenance be performed on-site?

13. What kind of warranty or servicing plan products do you offer?

14. Is your company registered in SAM.gov? If so, please provide company Unique Entity Identification (UEI)

Number.

Response Requested Please provide a statement of capabilities as it pertains to meeting the above specifications and answers to the questions stated above.