Amendment 0001.docx
DOCX document 34 KB Posted
- Attached to
- IR Spectrometer System Federal contract opportunity
- Solicitation number
- 1333ND26QNB030142
About this file
This is an amendment to a Request for Quote (RFQ) for an IR Spectrometer System issued by the National Institute of Standards and Technology (NIST), a component of the Department of Commerce. The amendment provides government responses to four contractor questions submitted in response to solicitation number 1333ND26QNB030142 and extends the submission deadline.
The primary purpose of the IR spectrometer acquisition is to measure the emissivity of metal thin films, including platinum, as a function of both temperature and wavelength when samples are placed on a temperature-controlled stage. The instrument will be used in conjunction with temperature-controlled stage equipment. NIST indicated that the number of samples analyzed per day will depend on research needs and stated it has no present challenges that require contractor problem-solving assistance. The submission deadline has been extended to April 15, 2026, at 4:00 PM Eastern Time. Contractors should refer to the attached documents for detailed response instructions and pertinent specification details.
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Other files for this federal contract opportunity
| File | Type | Posted |
|---|---|---|
| CSS IR Spectrometer System 1333ND26QNB030142.docx | DOCX document | |
| SOW_Final_2_9.docx | DOCX document | |
| Provisions_Clauses 1333ND26QNB030142.docx | DOCX document |
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Text version
Amendment 0001 Request for Quote Number: 1333ND26QNB030142 Requirement: IR Spectrometer System Purpose: Provide government response to submitted questions and extend the response deadline Date: 04/09/26
1. Government Responses:
1. Question 1: What are the plans for the instrument?
Response 1: To measure emissivity of metal thin films as a function of both temperature and wavelength when the sample is placed on a temperature-controlled stage
2. Question 2 2: What kind of samples will be analyzed? How many samples does NIST estimate per day?
Response 2: Metal thin film surfaces including Pt. The samples per day depend on the research needs.
3. Question 3: Will any other instruments or techniques be used alongside the IR? If so, what?
Response 3: Will use this instrument along with a temperature -controlled stage to measure the emissivity of metal thin films as a function of temperature.
4. Question 4: Are there particular challenges within the work the contractor may be able to help solve?
Response 4: NIST would like to use the IR spectrometer specified in the documents to measure emissivity of metal thin films as a function of both temperature and wavelength when the sample is placed on a temperature-controlled stage, and have no present challenges.
2. Submission Deadline Date Extension The submission deadline date is hereby extended to 04/15/26, 4:00pm ET image1.png
File details come from the government source that posted it. Updated .