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- Time Tagging Electronics module Federal contract opportunity
- Solicitation number
- 1333ND25QNB680467
About this file
This is a NIST Requirements Document for a time-tagging electronics module for the National Institute of Standards and Technology's (NIST) Nanoscale Device Characterization Division (NDCD). The document outlines specific technical requirements for a sophisticated electronic instrument to be used in time-correlated single photon counting (TCSPC) experiments, focusing on characterizing quantum sensing and networking applications involving color centers in materials like silicon carbide and diamond.
Key specifications include a module with at least four input detection channels, 10 picoseconds timing resolution, less than 3 nanoseconds dead time, USB 3.0 communications, external 10 MHz clock input, data transfer rate of 75M tags/s, and Python programming libraries. Delivery is required within 12 weeks to NIST's Gaithersburg, MD location, with a 1-year warranty. Payment is 100% upon full system acceptance, contingent on successful performance demonstration. The procurement emphasizes new, non-experimental equipment and includes rigorous inspection and acceptance criteria, with NIST reserving the right to reject non-conforming supplies.
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NIST Requirements Document Time-tagging electronics module
I. Background The National Institute of Standards and Technology (NIST) Nanoscale Device Characterization Division’s (NDCD) mission is to develop and advance the measurement and knowledge infrastructure to characterize nano- and atom-scale engineered materials and solid-state devices for innovation in information processing, sensing, and future quantum technologies. The NDCD’s technical activities span atom scale devices, nanoscale spectroscopy, nanoscale imaging, nanoscale processes and measurements, and alternative computing. To meet mission requirements, the NDCD requires a time-tagging electronics module for time-correlated single photon counting (TCSPC) experiments. This acquisition will enable new capabilities in color center optical characterization for quantum sensing and quantum networking applications.
II. Scope The NDCD requires a time-tagging electronics module for time-correlated single photon counting experiments. This instrument will be used for characterizing the photon emission statistics of silicon vacancy defects in the 4H polytype of silicon carbide, nitrogen-vacancy defects in diamond, and W- and G-center defects in silicon. Such defects are leading candidates for quantum networking and quantum sensing applications. Developing mature quantum sensors and quantum networks requires time-resolved optical characterization of the constituent elements, namely, the color centers, in order to engineer the sensors and networks based on the photon emission statistics.
III. Minimum Requirements The system shall meet or exceed the minimum requirements identified below. All items must be new. Used or remanufactured equipment will not be considered for award.
Experimental, prototype, or custom items will not be considered. The use of “gray market” components not authorized for sale in the U.S. by the Contractor is not acceptable. All line items shall be shipped in the original manufacturer’s packaging and include all original documentation and software, when applicable.
The Contractor shall provide a time-tagging electronics module that meets the following minimum specifications:
1. Each channel must have a timing resolution of 10 picoseconds (RMS jitter) or less.
2. Each channel must have a digital resolution of 1 picosecond or less.
3. The module must have at least four input channels for detection, in addition to one sync channel. Ideally, the module would be upgrade-able at a later date to 8 channels.
4. The dead time for each channel must be less than 3 nanoseconds.
5. The module must have communications ports (USB 3.0 or similar) for data transfer with a control computer.
6. The module must have a closed form-factor such that it can be moved easily between several experimental setups (must not be a card that slots into a computer motherboard).
7. The module must have the ability to accept an external clock input at 10 MHz.
8. The module must have software to automatically collect histograms and coincidence events between channels, save and plot data.
9. The data transfer rate must be at least 75M tags/s.
10. The module must have python programming libraries for integration with other experimental apparatus.
IV. Delivery Delivery shall be FOB Destination (or equivalent terms, such as INCOTERMS Delivered Duties Paid) are required and shall occur not later than (NLT) 12 weeks ARO.
FOB Destination means: The contractor shall pack and mark the shipment in conformance with carrier requirements, deliver the shipment in good order and condition to the point of delivery specified in the purchase order, be responsible for any loss of and/or damage to the goods occurring before receipt and acceptance of the shipment by the consignee at the delivery point specified in the purchase order; and pay all charges to the specified point of delivery. The contractor shall deliver all Line Items to:
The National Institute of Standards and Technology 100 Bureau Drive, Building 217 Gaithersburg, MD 20899-1640
V. Inspection and Acceptance In addition to the inspection and acceptance terms articulated in 52.212-4, the Government reserves the right to perform such performance tests and evaluations as defined below to verify specified system performance. Such tests and evaluations, if performed, shall be conducted within the environment that the system is to be operated. The Contractor has the right to be present during the tests and evaluations, if performed, at the Contractor’s expense.
The Government will test the time-tagging electronics module on test samples and verify that its performance meets the requirements.
The Government will test, inspect, and accept the equipment onsite within 7 business days of the receipt of the time-tagging electronics module. A visual inspection of the time-tagging electronics module will be performed by the NIST TPOC to identify surface defects or any form of indication that the time-tagging electronics module was damaged during transport to NIST. The Government shall have sole discretion to require repair or replacement of damaged and/or nonconforming supplies at no cost to the Government. The Government at any time prior to acceptance shall reject the time-tagging electronics module due to defects and/or nonconformance.
VI. Warranty The contractor shall warrant the entire system for a period of a minimum of 1 year after receipt of the equipment and shall be in accordance with terms in FAR 52.212-4
VII. Payment Schedule
Advance payment is not authorized. The Contractor must invoice in arrears according to the payment schedule. The Contractor shall be paid, in accordance with Net 30-day payment terms, upon receipt and acceptance of a proper invoice, in accordance with the following schedule:
1. 100% after acceptance by the TPOC of fully inspected system, AND
2. After successful demonstration by the instrumentation that it performs IAW the technical requirements set forth in this document AND
3. After receiving an invoice submitted properly, IAW the purchase order terms and conditions.
NOTE: Partial shipments and partial invoices will not be accepted, unless otherwise requested and accepted by the Contracting Officer prior to award offer. Proposed payment schedules shall be submitted with vendor’s response to the RFQ for consideration.
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