During phase II, xallent plans to develop an innovative hybrid metrology system to use for imaging and electrical characterization of thin film materials and semiconductor devices
Ended Cooperative Agreement Awarded Last action
- Award ID
- 70NANB22H131
- Recipient
-
Xallent LLC UEI VTJBCD7QGNU6
- Awarding agency
-
National Institute of Standards and Technology
Department of Commerce
- Obligated
- $400,000
Award facts
- Assistance listing
- 11.620 Science, Technology, Business and/or Education Outreach
- Completion date
- Originally
- Place of performance
- Ithaca, NY, USA
Award details come from USAspending.gov.
Description
- Activities
- During phase II, xallent proposes to develop and commercialize an atomic force microscope (AFM) platform that leverages an innovative AFM probe with integrated 4-point probes to allow for atomic imaging and sheet resistance characterization of thin films and semiconductor devices.
- Expected outcomes
- Xallent¿s multiple tips AFM probe will allow researchers to sequentially perform AFM and 4-point probing, which is currently not possible on existing single tip AFM tools.
- Intended beneficiaries
- Semiconductor foundries, integrated device manufacturers, fabless semiconductor companies, government/r & d centers, industry subcontractors, and research universities.
- Subrecipient activities
- The recipient does not intend to subaward funds.
Transactions
| Action | Obligated | Date |
|---|---|---|
| Amendment | -$400,000 | |
| Amendment | $400,000 | |
| Original award | $400,000 |
Quick answers
Who received award 70NANB22H131?
70NANB22H131 was awarded to Xallent LLC by National Institute of Standards and Technology (Department of Commerce) on September 1, 2022.
How much is award 70NANB22H131 worth?
$400,000 has been obligated on 70NANB22H131.
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