ScanWave Pro-Electronic Probe Interface Module (ePIM)

The National Institute of Standards and Technology (NIST) Material Measurement Laboratory is seeking market research for a fully electronically tunable Electronic Probe Interface Module (ePIM) designed to replace a broken manually tunable probe interface for their semiconductor metrology research. The module must be compatible with an Oxford/Asylum Research AFM MFP-3D system and capable of electronic tunability of the probe's resonance frequency while maintaining compatibility with existing AFM and controller software. Respondents are required to submit detailed company information, Unique Entity Identifier (UEI), product specifications, manufacturing location, customization capabilities, and service offerings via email, with responses due by December 15, 2025. All interested companies must be registered in the System for Award Management (SAM) prior to submission. This is a sources sought notice conducted for market research purposes, and responses do not guarantee a subsequent solicitation or contract award.

No set-aside designations have been applied to this procurement opportunity. The notice does not identify any current incumbent or potential contractors, nor does it specify award values or budget ranges. The procurement is classified under NAICS category 334516 (Analytical Laboratory Instrument Manufacturing) and PSC code 6640 (Laboratory Equipment and Supplies), indicating the scope focuses on specialized laboratory instrumentation for research purposes. Specific quantities, service timelines, or contract values have not been disclosed in this pre-solicitation phase, as the government is utilizing this notice to gather market information and assess available solutions before proceeding to a formal solicitation.