One (1) Focused Ion Beam & One (1) FESEM System
Award Notice Posted
- Solicitation number
- W911QX18R0047
- Agency
-
ACC Aberdeen Proving Ground
Army Contracting Command, Department of Defense
- Awarded
- to FEI Company
- Set-aside
- No set-aside
Opportunity facts
- Contract number
- W911QX18P0312 Federal contract award
- NAICS code
- 334516 Analytical Laboratory Instrument Manufacturing
- PSC
- Not on record
Notice details come from SAM.gov. Updated .
Notice text
Synopsis of Award
In accordance with FAR 5.301, this document includes info required from FAR 5.207(a) and DFARS 205.301
1. Class Code: 66
2. NAICS Code: 334516 Analytical Laboratory Instrument Manufacturing
3. Subject: One (1) Focused Ion Beam - Field Emission Scanning Electron Microscope (FIB-FESEM) Dual-Beam System and One (1) Field Emission Scanning Electron Microscope (FESEM) System
4. Solicitation Number: W911QX18R0047
5. Contract Number: W911QX18P0312
6. Face Value of this Action: $2,270,897.00
7. Total Cumulative Face Value of Contract: $2,270,897.00
8. Description of What Was Purchased: One (1) Focused Ion Beam - Field Emission Scanning Electron Microscope (FIB-FESEM) Dual-Beam System and One (1) Field Emission Scanning Electron Microscope (FESEM) System
9. Award Date: 9/26/2018
10. Awardee Name and Address:
FEI Company
5350 NE Dawson Creek Drive
Hillsboro, OR 97123-5793
DUNS: 099141541
CAGE Code: 1FJ95
11. Place of Performance:
U.S. Army Research Laboratory
Logistics Warehouse, Building 321
6375 Johnson Road
Aberdeen Proving Ground, MD 21005
12. Contracting Office
US Army Contracting Command - Aberdeen Proving Ground
Adelphi Contracting Division
2800 Powder Mill Road
Adelphi, MD
20783-1197 USA
W911QX
13. Contracting Office Point of Contact
Name: Nicole Propst
Phone: 301-394-2031
Email: Nicole.l.propst.ctr@mail.mil
. Awarded Vendors: FEI Company. Contract Award Dollar Amount: $2,270,897.00. Contract Award Date: 2018-09-26.
Files
| File | Type | Posted |
|---|---|---|
| C01_-_Synopsis_of_Award.docx | DOCX document |
Notice history
| Notice | Type | Posted |
|---|---|---|
| This notice | Award Notice | |
| One (1) Focused Ion Beam & One (1) FESEM System | Solicitation | |
| One (1) Focused Ion Beam - Field Emission Scanning Electron Microscope (FIB-FESEM) Dual-Beam System and One (1) Field Emission Scanning Electron Microscope (FESEM) System | Pre-Solicitation |
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