One (1) Focused Ion Beam & One (1) FESEM System

Award Notice Posted

Solicitation number
W911QX18R0047
Agency
Awarded
to FEI Company
Set-aside
No set-aside

Opportunity facts

Contract number
W911QX18P0312 Federal contract award
PSC
Not on record

Notice details come from SAM.gov. Updated .

Notice text

Synopsis of Award
In accordance with FAR 5.301, this document includes info required from FAR 5.207(a) and DFARS 205.301

1. Class Code: 66


2. NAICS Code: 334516 Analytical Laboratory Instrument Manufacturing


3. Subject: One (1) Focused Ion Beam - Field Emission Scanning Electron Microscope (FIB-FESEM) Dual-Beam System and One (1) Field Emission Scanning Electron Microscope (FESEM) System


4. Solicitation Number: W911QX18R0047


5. Contract Number: W911QX18P0312


6. Face Value of this Action: $2,270,897.00


7. Total Cumulative Face Value of Contract: $2,270,897.00


8. Description of What Was Purchased: One (1) Focused Ion Beam - Field Emission Scanning Electron Microscope (FIB-FESEM) Dual-Beam System and One (1) Field Emission Scanning Electron Microscope (FESEM) System


9. Award Date: 9/26/2018


10. Awardee Name and Address:


FEI Company
5350 NE Dawson Creek Drive
Hillsboro, OR 97123-5793
DUNS: 099141541
CAGE Code: 1FJ95


11. Place of Performance:
U.S. Army Research Laboratory
Logistics Warehouse, Building 321
6375 Johnson Road
Aberdeen Proving Ground, MD 21005


12. Contracting Office


US Army Contracting Command - Aberdeen Proving Ground
Adelphi Contracting Division
2800 Powder Mill Road
Adelphi, MD
20783-1197 USA
W911QX


13. Contracting Office Point of Contact
Name: Nicole Propst
Phone: 301-394-2031
Email: Nicole.l.propst.ctr@mail.mil



. Awarded Vendors: FEI Company. Contract Award Dollar Amount: $2,270,897.00. Contract Award Date: 2018-09-26.

Files

File Type Posted
C01_-_Synopsis_of_Award.docx DOCX document

Notice history

Notice Type Posted
This notice Award Award Notice
One (1) Focused Ion Beam & One (1) FESEM System Latest solicitation Solicitation
One (1) Focused Ion Beam - Field Emission Scanning Electron Microscope (FIB-FESEM) Dual-Beam System and One (1) Field Emission Scanning Electron Microscope (FESEM) System Original Pre-Solicitation

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