Maintenance of Hitachi Scanning Electron Microscope (SEM)
Closed Special Notice Posted
- Solicitation number
- N6449825Q0209
- Agency
-
Naval Sea Systems Command
Department of the Navy, Department of Defense
- Responses due
- Set-aside
- No set-aside
Opportunity facts
- NAICS code
- 811210 Electronic and Precision Equipment Repair and Maintenance
- Place of performance
- Philadelphia, Pennsylvania 19112, United States
- Points of contact
Notice details come from SAM.gov. Updated .
About this opportunity
The Naval Surface Warfare Center Philadelphia has issued a Special Notice for the procurement of preventative maintenance services for a Hitachi Scanning Electron Microscope (SEM), Model S-3700N. The notice is published by the Department of the Navy Naval Sea Systems Command, a defense agency. This procurement falls under the Electronic and Precision Equipment Repair and Maintenance NAICS category and involves modification of equipment hardware and abrasives. The opportunity is posted as of June 17, 2025, with responses due by July 2, 2025. No set-aside designation applies to this procurement.
The government intends to award this contract to a single source, Hitachi High-Tech America, Inc., under the authority of FAR 13.106(b), which allows for sole source procurement under specific circumstances. The primary objective is to secure ongoing preventative maintenance services for critical scanning electron microscope equipment used by the naval facility. Contractors interested in this opportunity must submit their inquiries via email to brooke.a.steele3.civ@us.navy.mil, as phone calls will not be accepted. The procurement is structured as a single-source award, indicating that the government has determined that only Hitachi High-Tech America, Inc. can provide the specialized maintenance services required for this particular equipment model. The July 2, 2025 deadline provides a relatively short window for any potential responses or questions regarding the procurement.
Notice text
The Naval Surface Warface Center Philadelphia intends to procure preventative maintenance of Hitachi Scanning Electron Microscope (SEM), Model S-3700N from Hitachi High-Tech America, Inc.
The proposed contract action is for supplies or services for which the Government intends to solicit and award with only one source under authority of FAR 13.106(b).
Any questions regarding this notice should be emailed to: brooke.a.steele3.civ@us.navy.mil
Phone calls will NOT be accepted.
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