Licensing Opportunity: Wavefront Distortion Correction in Microscopy Image
Closed Special Notice Posted
- Solicitation number
- 2024-09-11_M
- Agency
-
Department of Energy
- Responses due
- Set-aside
- No set-aside
Opportunity facts
- Place of performance
- Oak Ridge, Tennessee 37830, United States
- Points of contact
Notice details come from SAM.gov. Updated .
About this opportunity
The Department of Energy has published a Special Notice for a Licensing Opportunity related to a wavefront distortion correction algorithm for scanning tunneling microscope (STM) images. This algorithm can identify and correct nonlinear in-plane distortions in atomic resolution STM images without prior knowledge of the physical scanning parameters or individual atom positions.
The purpose of this Special Notice is to make this wavefront correction technology available for licensing. The algorithm provides a facile approach to correct distorted STM images, even when locating each atom position is challenging. It can transform distorted wavefronts into straight lines to produce a linearly distorted image, which can then be corrected by a linear transformation. This technology is applicable to scanning tunneling microscope manufacturers, electron microscope manufacturers, STM users, TEM users, and atomic resolution instrumentation manufacturers. The due date for this licensing opportunity is October 26, 2024, and interested parties should contact the Department of Energy for more information.
Notice text
Invention Reference Number: 202405644
Distortion in scanning tunneling microscope (STM) images is an unavoidable problem. This technology is an algorithm to identify and correct distorted wavefronts in atomic resolution STM images. This algorithm can be used to correct nonlinear in-plane distortions without prior knowledge of the physical scanning parameters, the characteristics of the piezoelectric actuator, or individual atom positions.
Description
This is a wavefront correction algorithm that provides a facile approach for correcting nonlinearly distortions in 2D lattice images in scanning tunneling microscopes. This allows correction of distorted STM images even when locating each atom position is challenging. In the correction algorithm, distorted wavefronts are easily identified using a wavefront vector field. The algorithm then transforms distorted wavefronts into straight lines by moving each point in the STM image along the wavefront to preserve atomic order to produce a linearly distorted image, which can finally be corrected by a linear transformation.
Benefits
- Drastically reduces distortions
- Wavefront vector field can be generated even when the sample rate is low
- Method is complementary to existing post-processing algorithms, but does not require foreknown order or atomic lattice positions
- Does not require any physical scanning parameters
- Applicable to all topographic and spectroscopic data regardless of the nature of distortions
Applications and Industries
- Scanning tunneling microscope manufacturers
- Electron microscope manufacturers
- STM users
- TEM users
- Atomic resolution instrumentation manufacturers
Contact
To learn more about this technology, email partnerships@ornl.gov or call 865-574-1051.
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