Licensing Opportunity: Deterministic Atom Steering for Repeated Identical Defect Generation in the Scanning Transmission Electron Microscope

Closed Special Notice Posted

Solicitation number
2024-09-11_B
Agency
Responses due
Set-aside
No set-aside

Opportunity facts

Place of performance
Oak Ridge, Tennessee 37830, United States

Notice details come from SAM.gov. Updated .

About this opportunity

The Department of Energy has issued a Special Notice for a licensing opportunity related to a method for deterministic atom steering for repeated identical defect generation in the scanning transmission electron microscope (STEM). This technology enables the precise control and placement of atomic defects in materials, which is critical for applications in quantum photonics, magnetic storage, and catalysis.

The purpose of this Special Notice is to provide information about this patented technology and seek potential licensees. The technology allows for the real-time monitoring and adjustment of atomic movements within materials, without damaging the material's atomic content. It is applicable to both 2D and 3D materials, and can be used to create large-scale patterns of atomic defects for advanced material design. There are no set-aside requirements, and the opportunity is open to any interested parties. Responses are due by October 26, 2024, and interested parties can learn more by contacting the Department of Energy.

Notice text

Invention Reference Number: 202405646

Scanning transmission electron microscopes are useful for a variety of applications. Atomic defects in materials are critical for areas such as quantum photonics, magnetic storage, and catalysis. Traditional methods using scanning tunneling microscopes (STM) are limited by their slow speed, requirement for conductive surfaces, and low operating temperatures. This technology provides the ability to control these defects at the atomic level and is not limited to surfaces or conductive materials, opening many new possibilities for atomic-scale manufacturing.

Description

This technology is a method for deterministic atom steering for repeated identical defect generation in the scanning transmission electron microscope. This enables precise defect creation in layered materials, enhancing quantum photonics, storage, and catalysis. This technique involves the precise control of the STEM’s electron beam to move atoms from one initial position to a well-defined final position. The method relies on fast and repeated scanning of the electron probe, which allows for real-time monitoring and control of individual atomic movements. The method scans the electron probe between multiple positions to direct the movement of individual atoms and create specific defects with high precision. It allows monitoring of atomic movements in real-time using a high speed detector, usually an annular dark or bright field detector, and maintains atomic lattice information for repeated and precise movements over large areas.

Benefits

  • Enables the precise creation and placement of atomic defects with high fidelity
  • Allows for real-time monitoring and adjustment of atomic movements
  • Applicable to both 2D and 3D materials, enhancing bulk material properties
  • Can use standard STEM with minor retrofit
  • Maintains the material’s atomic content; prevents damage or ejection of atoms  
  • Scalable – can create large-scale patterns of atomic defects for advanced material design

Applications and Industries

  • Materials research and production
  • STEM (scanning transmission electron microscope) manufacturers
  • STEM users
  • Quantum photonics
  • Catalysis
  • High-density memory

Contact

To learn more about this technology, email partnerships@ornl.gov or call 865-574-1051.

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