Laser Profiler and Accessories
Closed Solicitation Posted
- Solicitation number
- PR359830
- Agency
-
Department of Energy
- Responses due
- Set-aside
- No set-aside
Opportunity facts
- NAICS code
- 334513 Instruments and Related Products Manufacturing for Measuring, Displaying, and Controlling Industrial Process Variables
- Place of performance
- Oak Ridge, Tennessee 37830, United States
- Points of contact
Notice details come from SAM.gov. Updated .
About this opportunity
Oak Ridge National Laboratory (ORNL), part of the Department of Energy, is seeking laser profilers and accessories to support advanced battery manufacturing research. The solicitation (RFP359830) requires high-resolution measurement equipment capable of capturing sub-millimeter topological variations in conductive particles under compression at a rate of 1 meter per minute. Potential vendors must submit a proposal on company letterhead, a completed Bill of Materials, and signed Representations & Certifications by April 18, 2025, at 4:00 PM EST. The procurement will be evaluated on a lowest-priced, technically acceptable basis, with an offer validity period of 120 days. Vendors are encouraged to direct any questions to Procurement Officer Rian Lewis at lewisgr@ornl.gov by April 14, 2025.
The contract has no specific small business set-aside and falls under the NAICS category 334513 for Instruments and Related Products Manufacturing. The Bill of Materials includes seven line items, primarily from Keyence, featuring two laser profilers (LJ-X8002 and LJ-X8080), sensor cable head connections, programmable encoder accessories, and related equipment. The anticipated materials delivery timeline is approximately two weeks from award, with performance taking place in Oak Ridge, TN 37830. While specific award value is not explicitly stated, the procurement is structured as a Firm Fixed Price contract. The equipment will be critical to ORNL's research objectives of developing a digital platform for advanced battery manufacturing, with a focus on analyzing topology variation data from opaque, slurry-coated conductive substrates.
Notice text
ORNL is in need of laser profilers that provide high resolution measurement at a rate up to 1 meter per minute of sub millimeter scale. The ORNL research focuses on the investigation and analysis of sub-millimeter topological variations in active and conductive particles under compression, and how these variations influence the long-term performance. Slurry is applied to a conductive substrate that is opaque, limiting the types of sensor modalities available for topology variation data acquisition. This data is a crucial component of a digital platform for advanced battery manufacturing, with the ultimate goal of scaling production to industry standards, where manufacturing rates of 1 meter per minute are expected.
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