Environmental test chamber

The National Institute of Standards and Technology (NIST) is conducting a sources sought notice to identify potential vendors for an environmental test chamber to support semiconductor research under the CHIPS Act initiative. The procured equipment must meet specific technical specifications, including a workspace exceeding 1.5 cubic feet, temperature range capability from -35°C to +175°C, humidity control between 10% and 95% relative humidity, a GN2 purge system, and an electronic touch screen controller. This market research effort supports NIST's Grand Challenge 1 Program in semiconductor metrology, which focuses on measurement technologies and materials quality for semiconductor device manufacturing. Interested vendors must submit responses electronically to Junee Johnson at junee.johnson@nist.gov with a response deadline of December 15, 2025, and must be registered in SAM.gov with a valid Unique Entity ID. Vendors should provide comprehensive company information, detailed equipment specifications, manufacturing details, customization capabilities, manufacturing location, small business status, service capabilities, and pricing arrangements. This is a sources sought notice for market research purposes only and does not guarantee that a solicitation or contract will be issued.

This procurement carries no set-aside designation, meaning it is open to all qualified vendors regardless of business size or status. The notice does not identify any current incumbents or existing contractors, nor does it specify a budget range or anticipated award value. No specific quantity of chambers or timeline for delivery has been disclosed in this pre-solicitation phase, as this notice represents preliminary market research to inform future procurement planning. Vendors responding to this sources sought notice should understand that their participation in this phase does not obligate the government to proceed with a formal solicitation, but successful vendors may be considered for future contract opportunities.