Benchtop Scanning Electron Microscope (SEM) with a maximum footprint of 24" x 48".

one (1) benchtop Scanning Electron Microscope (SEM) with a maximum footprint of 24" x 48". Microscope must have Backscatter Electron (BSE) and Secondary Electron (SE) imaging capabilities, energy dispersive spectroscopy (EDS) mapping, and in-situ mechanical testing capabilities.

A. shall be capable of imaging samples up to 100 millimeter (mm) wide, 100mm long.
B. shall have a scan area up to 100 mm x 100 mm.
C. shall be equipped with a high definition backscatter detector.
D. shall be equipped with an Everhart-Thornley secondary electron detector.
E. shall provide a resolution of under 10 nanometers (nm) at 10 kilovolts (kV) or less accelerating voltage, both in backscatter and secondary electron imaging modes.
F. shall support adjustable acceleration voltages ranging from 5 kV (or lower) and up to at least 20 kV
G. shall have capability for energy dispersive x-ray spectroscopy with silicon drift detector (SDD); this capability shall include both hardware and data acquisition and data analysis system.
H. shall have capabilities for in-situ tensile and compression testing of samples with up to 1 kilonewtons (kN) of load.
I. shall be equipped with all hardware and software for standard operation, data acquisition and analysis.
J. shall fit on a tabletop not exceeding 48 inches long by 24 inches wide
K. shall require a standard single phase 110 volts (V) power with a maximum of 300 watts (W)
L. shall not require an external cooling system

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