Or_Equal_for_Bid.xlsx

XLSX spreadsheet 10 KB Posted

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SCANNING PROBE MICROSCOPE
Solicitation number
W91YTZ-13-T-0267
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OR EQUAL

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A11.doc DOC document
A11.doc DOC document
Or_Equal_for_Bid.xlsx XLSX spreadsheet

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Sheet2

Salient CharacteristicsCompany Name:
Please Fill in Equal with description
1modulus recording capabilities up to 50 Gpa
2high resolution camera and pointing system to accurately place probes in area that need to be investigated
3low X-Y signal noise (less than 0.20 nm)
4low drift rates (less than 200 ppm/min)
5Capable of scanning modes:Tapping Mode (air), Force spectroscopy, Contact Mode, Nano lithography, Force Modulation, Lateral and magnetic force microscopy, Tunneling atomic force microscopy
6needs to be able to investigate materials that are dry in the ambient environment but also materials that are immersed in liquid without affecting the scan process
7investigate the thermal characteristics of a material on a nano-scale range that will supplement my macro thermal analysis techniques on the selected materials as a whole (thermal mechanical analysis, thermal transitions, etc.)
8needs to work with Atomic force software/data
--Tapping Mode (air)
--Force spectroscopy
-- Contact Mode
-- Nano lithography
--Force Modulation
-- Lateral and magnetic force microscopy
-- Tunneling atomic force microscopy

Sheet3

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