Salient Characteristics - XPS.doc

Public Distribution

Salient Characteristics

Commercial Availability Certification:

I have evaluated the commercial marketplace and determined that all of the salient characteristics documented below are available in products/services offered in the commercial marketplace.

Signature (typed name): _Ngon Tran____________________________

Technical Point of Contact (TPOC) or Contracting Officer’s Representative (COR)

SALIENT CHARACTERISTICS

1. The X-ray photoelectron spectrometer system for characterizing materials shall have the capability to gather x-ray photoelectron data. System shall be equipped with a minimum of the following items/capabilities.

2. X-ray sources

a. A monochromated aluminum K alpha x-ray source shall be supplied with a nominal photon energy of 1486.6 electron volts.

b. A second monochromated higher energy x-ray source shall be supplied that has a photon energy of between 2900 electron volts and 5500 electron volts.

c. Switching between the aforementioned monochromated sources shall be automatic via computer control.

d. Cross contaminations between the aforementioned monochromated sources shall not exceed 0.5%. Vendor shall quantify cross contaminations.

e. X-ray sources shall be capable of focusing to spot sizes at or below 300 um.

f. System shall be capable of “small area” x-ray photoelectron analysis. Vendor shall give the count rate of the silver 3d5/2 photoelectron peak with an energy resolution less than or equal to 0.6 electron volts. With an analysis area of 20 x 20 micrometers. Count rates are roughly proportionate to system sample throughput when doing “small area” analysis.

g. System shall be capable of “small area” x-ray photoelectron analysis. Vendor shall give the count rate of the silver 3d5/2 photoelectron peak with an energy resolution less than or equal to 0.6 electron volts. With an analysis area of 200 x 200 micrometers. Count rates are roughly proportionate to system sample throughput when doing “small area” analysis.

h. The aluminum k-alpha x-ray source shall have a count rate of greater or equal to 200,000 counts per second with an energy resolution 0.6 electron volts or less with an analysis area of 20 x 20 micronmeters.

3. Charge neutralization

a. System shall have an electron source that can efficiently neutralize a wide range of samples.

4. Ion gun and sputter sources

a. System shall be equipped with a monochromatic argon ion source that is capable of 4kV or greater energies.

b. System shall be equipped with an Argon cluster ion source that is capable of 20kV or greater energies.

c. Switching between the aforementioned ion gun sources shall be automatic via computer control.

5. Stage motors and sample holders

a. Computer control of the stage with movement in the 3 orthogonal cartesian coordinites (x, y and z) and rotate in the x-y plane, where z is in the direction of substrate normal. Sample tilt shall also controlled via computer with tilt ocuring with respect to the electron analyzer.

b. Variable Temperature Stage

i. Heating and cooling shall occur either at the analysis stage or load dock (or introductory chamber)

ii. Heating stage shall attain 500 degrees Celsius or greater.

iii. Cooling stage shall attain -100 degrees Celsius or lower.

iv. Temperature shall be controlled automatically via computer. The computer software controlling the temperature shall be fully integrated into the main software that controls the x-ray photoelectron analysis.

v. Electrical contacts for the variable temperature stage shall be readily secured. .

c. Clamps shall be supplied for holding irregularly shaped samples.

d. Vacuum transfer vessel for handling air sensitive samples shall be provided.

e. Sample transfer from the introductory chamber to the main chamber for analysis shall be automatic via computer control.

6. Position on the sample surface shall be indicated via a video imaging system to a position in the sample x-y plane with a resolution of 50 micrometers or less. The automatic system height alignment (z axis) shall be capable of handling irregularly shaped and/or non-flat samples.

7. Software

a. Shall be capable of collecting x-ray photoelectron spectroscopy, Auger electron spectroscopy, ultraviolet photoelectron spectroscopy, reflection electron energy loss spectroscopy, low energy inverse photoemission spectroscopy, and ion scattering spectroscopy.

b. Shall be capable of peak fitting and identification.

c. Shall include control system. And, the control system shall include the following

i. Graphical representation of instrument configuration.

8. Facilities

a. The entire instrument and workstation shall fit in a space that has the dimensions, 10 feet (width) x 11 feet (length) x 9.5 feet (height). The room is larger but the allotted space shall adhere to safety regulations. All components and necessary equipment needed for installation shall fit through an entrance that has the dimensions, 5.8 feet (wide) x 7.75 feet (height).

b. The main components of the X-ray photoelectron spectroscopy system shall be powered by a single phase 220 volts alternating current (60 hertz) or no more than a 30 ampere circuit. The power for the system bake-out shall be powered by a separate circuit of single phase 220 volts alternating current (60 hertz) or no more than an additional 30 ampere circuit.

c. A water to water heat exchanger shall be supplied capable of supporting the X-ray photoelectron spectroscopy system. This heat exchanger must accept a 13 pound per square inch pressure difference between the building supply and return as well as a water temperature of ~60 degrees Fahrenheit. The heat exchanger power shall be supplied by the X-ray photoelectron system.

d. System shall accept a house nitrogen supply of 100 psi or less.

e. Noise level of entire instrument system should not exceed 85 dBA.

9. System purchase shall include

a. On-site installation shall be at Aberdeen Proving Grounds, MD 21005.

b. On-site user training shall be at Aberdeen Proving Grounds, MD 21005.

d. One-year warranty on the system to INCLUDING all labor, components and consumables. This shall begin starting from the date that the system is both installed and demonstrated to be fully functional.

10. In addition to the basic components for x-ray photoelectron data collection, the instrument shall have 7 or more of the following additional options. Price of each additional option shall be itemized.

c. More intensive training on basic instrument maintenance for at least 2 users for at least 4 days shall be provided at vendor site (to be used within one year of the date the system is installed and demonstrated to be fully functional).

d. Additional year of warranty on the system to INCLUDING all labor, components and consumables. This shall begin starting from the date that the system is installed, demonstrated to be fully functional, and after the above baseline one-year warranty. Vendor shall provide options on prices for 1 year and for 3 years if there is discount for multiple years.

e. Annual service contract shall begin starting from the date the warranty ends. The vendor shall provide options on pricing for a one-year term and for a three-year term , including any available multi-year discounts.

f. Warranty and service contract shall guarantee on-site response time within 5 business days as well as on-site labor that has technical expertise to address issues in any parts of the x-ray photoelectron spectrometer system, including all options.

a. C60 cluster ion gun that is capable of low damage surface cleaning.

b. Ultraviolet photoelectron spectroscopy (UPS) that is fully computer controlled with authomated ultraviolet lamp ignition and gas delivery.

c. Low energy inverse photoemission spectroscopy (LEIPS) that has two optical bandpass filters.

d. Reflection electron energy loss spectroscopy (REELS) that has an elastic peak sensitivity > 1.5 Mcps @ 1 nA target beam current

e. Auger that has <100 nm electron beam diameter and is capable of scanning spectra, images, line scans, depth profiles and maps.

f. Accessory chamber with the capability to heat samples in reactive gas environment of at least 700 degrees Celsius. Shall have direct transfer to analysis chamber.

g. X-ray sources that have multi position anodes.

h. Charge neutralization that has a dual beam charge neutralization system. There shall be a combination of a low energy ion beam (less than 10 electron volts) and a low energy electron beam (less than 10 electron volts) to compensate for the surface charging of non-conducting samples due to x-ray generated photoelectrons.

i. Ion Scattering Spectroscopy (ISS) capability

j. Heating of sample in ultra high vacuum to at least 500 degrees Celcuis with subsequent UPS and/or LEIPS measurements.

Contracting Officer:

Public Distribution