A03_-_Redacted_Simplified_Acquisition_Sole_Source_Justification.pdf

Control No: JA-Adel-17-358

Contractor: EDAX, Inc.

Supply/Service: Energy Dispersive Spectroscopy Equipment and Maintenance Service

Weapons and Materials Research Directorate (WMRD) Materials and Manufacturing Science Division (MMSD)

JUSTIFICATION REVIEW DOCUMENT

FAR PART 13 SIMPLIFIED ACQUISITION JUSTIFICATION AND APPROVAL FOR

OTHER THAN

FULL AND OPEN COMPETITION

Supply/Service: The purchase of three (3) Energy Dispersive Spectroscopy (EDS) component upgrades and one (1) Electron Back Scattered Diffraction (EBSD) component upgrade to attach to microscopes currently owned by ARL and all corresponding software. This purchase will also include an extended warranty service contract for the equipment.

Authority: 41 U.S.C. 1901(e)(2), implemented by FAR 13.501(a) -- Only One Responsible Source and No Other Supplies or Services Will Satisfy Agency Requirements.

Amount: $614,473.00

Prepared by: [REDACTED]

Contracting Officer: Dan Dougherty DSN: 290-4680 Contracting Officer Date: 03/14/2017 Email: daniel.p.dougherty14.civ@mail.mil

Technical: [REDACTED]

Requirements: [REDACTED]

Reviews: I have reviewed this justification and find it adequate to support other than full and open competition.

Program Manager:

[REDACTED]

mailto:daniel.p.dougherty14.civ@mail.mil

Supply/Service: Energy Dispersive Spectroscopy Equipment and Maintenance Service

Version – November 2015

Department of Army FAR Part 13 Simplified Acquisition Sole Source Justification and Approval for

Other than Full and Open Competition

1. Contracting Activity: US Contracting Command – Aberdeen Proving Ground, Adelphi Contracting Division, (ACC-APG-CCAP-SCA), 2800 Powder Mill Road, Adelphi, Maryland 20783.

2. Description of Action: US Army Research Laboratory (ARL), Weapons and Materials Research Directorate (WMRD) Materials and Manufacturing Science Division (MMSD) requests approval to solicit for a new firm fixed price (FFP) on the basis of other than full and open competition pursuant to FAR13.501 (a). The requested contract is for the purchase of systems upgrades of ancillary EDS and EBSD instrumentation on the Government-owned electron microscopes with corresponding software. The suggested sole source vendor is EDAX Inc., 91 McKee Drive, Mahwah, NJ 07430. The Government projects award for May 2017 and Fiscal Year (FY) 2017/2018 Army, Research Development Test & Evaluation (RDT&E) funding will be utilized.

_X An acquisition plan is not required because this procurement does not meet the threshold at Defense Federal Acquisition Regulation Supplement 207.103(d)(i)(B) and is not a cost reimbursement type contract (FAR 16.301- 3(a)(2)).

__ (Insert approval authority title) approved an acquisition plan in accordance with FAR 16.301-3(a)(2) and/or DFARS 207.103(d)(i)(B) on (insert date).

__ The required acquisition plan in accordance with FAR 16.301-3(a)(2) and/ore DFARS 207.103(d)(i)(B) is currently awaiting (insert approval authority title) approval.

3. Description of Supplies/Services:

CLIN Part Number CLIN Description Estimated Amount

Period of Performance (PoP)/Delivery Date

CLIN 0001 PV6600/70 WS OCTANE Elite T(70), TEAM

Enhanced EDS

[REDACTED]

60 days ARO

CLIN 0002 PV6600/70 OCTONE Elite 70 TEAM Enhanced EDS Analysis with SDD

[REDACTED]

60 days ARO

CLIN 0003 PV5500/E-70-HSuper Team Pegasus Integrated EDS-

EBSD

[REDACTED]

60 days ARO

CLIN 0004 PV6062/03 Atom Probe Assist [REDACTED] 60 days ARO

CLIN 0005 PV6062/08 NPAR [REDACTED]

60 days ARO

CLIN 0006 PV6062/09 Fast Phase Mapping [REDACTED] 60 days ARO

CLIN 0007 PV6060/60 TEAM 3D-API [REDACTED]

60 days ARO

CLIN 0008 PV6063/80 TEAM 3D IQ-EDS [REDACTED]

60 days ARO

Supply/Service: Energy Dispersive Spectroscopy Equipment and Maintenance Service

Version – November 2015

CLIN 0009 PV8910/96 OIM 3D Visualization [REDACTED] 60 days ARO

CLIN 0010 PV8914/00-70Elite127 Extended Warranty Yr 1 TEAM Pegasus, Octane Plus, Hikari XP2

[REDACTED] 05/15/2017-05/14/2018

OPT CLIN 0011 PV8914/00-70Elite127

Extended Warranty Yr 2

PV6600/70 WS

[REDACTED] 05/15/2018-05/14/2019

OPT CLIN 0012 PV8914/00-70Elite127 Extended Warranty Yr 2 PV6600/70 [REDACTED] 05/15/2018-05/14/2019 OPT CLIN 0013 PV8914/00-70Elite127 Extended Warranty Yr 2 PV5500/E-

70-HSuper

[REDACTED] 05/15/2018-05/14/2019

OPT CLIN 0014 PV8914/00-70Elite127

Extended Warranty Yr 2 TEAM Pegasus, Octane Plus, Hikari XP2

[REDACTED] 05/15/2018-05/14/2019

OPT CLIN 0015 PV8914/00-70Elite127

Extended Warranty Yr 3

[REDACTED] 05/15/2019-05/14/2020

OPT CLIN 0016 PV8914/00-70Elite127 Extended Warranty Yr 3 PV6600/70 [REDACTED] 05/15/2019-05/14/2020

OPT CLIN 0017 PV8914/00-70Elite127 Extended Warranty Yr 3 PV5500/E- 70-HSuper

[REDACTED] 05/15/2019-05/14/2020

OPT CLIN 0018 PV8914/00-70Elite127 Extended Warranty Yr 3 TEAM Pegasus, Octane Plus, Hikari XP2

[REDACTED] 05/15/2019-05/14/2020

OPT CLIN 0019 PV8914/00-70Elite127

Extended Warranty Yr 4

[REDACTED] 05/15/2020-05/14/2021

OPT CLIN 0020 PV8914/00-70Elite127 Extended Warranty Yr 4 PV6600/70 [REDACTED] 05/15/2020-05/14/2021

OPT CLIN 0021 PV8914/00-70Elite127 Extended Warranty Yr 4 PV5500/E- 70-HSuper

[REDACTED] 05/15/2020-05/14/2021

OPT CLIN 0022

PV8914/00-70Elite127

Extended Warranty Yr 5

[REDACTED] 05/15/2021-05/14/2022

OPT CLIN 0023 PV8914/00-70Elite127 Extended Warranty Yr 5 PV6600/70 [REDACTED] 05/15/2021-05/14/2022

OPT CLIN 0024 PV8914/00-70Elite127 Extended Warranty Yr 5 PV5500/E- 70-HSuper

[REDACTED] 05/15/2021-05/14/2022

TOTAL $614,473

The Government requires three (3) EDS/EBSD ancillary instruments (CLINs 0001-0003) to attach to electron microscopes currently owned by ARL and all corresponding software (CLINs 0004-0009) all which include a one (1) year standard service maintenance warranty. The following describes the instruments and associated software to be procured with specifications:

1. Octane Elite T (70), TEAM Enhanced EDS Analysis, Windowless, with Shutter- This system will replace the obsoleted Silicon Li-drifted (Si(Li)) X-ray detector based microanalysis system on the WMRD JEOL 2100F transmission electron microscope/scanning transmission electron microscope (TEM) with a Silicon Drift Detector (SDD) based microanalysis system with the following specifications:

windowless detector with element detection down to Al Lα (73 eV)

70 mm2 chip size collimated providing larger solid angle collection angle (0.5 steradians) input count rates up to 2,000,000 counts per second (cps)throughputs up to 850,00 cps

X-ray energy resolution of 127 eV or better for Mn Kα dwell time < 10 microseconds/pixel- enabling ultrafast EDS Mapping with up to 1 million spectra per second capability non-liquid nitrogen operation, thermoelectrically-cooled detector selectable X-ray process times down to a minimum of 120 ns pile up correction for collection rates >120 kcps

Supply/Service: Energy Dispersive Spectroscopy Equipment and Maintenance Service

Version – November 2015 system capable of interfacing with Gatan Digital Micrograph DigiScan operating on Gatan Microscopy Suite ver1.85

64 bit Windows operating system

2. Octane Elite -70, TEAM Enhanced EDS Analysis with The Octane Elite SDD- This system will replace the obsoleted silicon Li-drifted (Si(Li)) X-ray detector based microanalysis system on the WMRD Hitachi S-4700 Field Emission Scanning Electron Microscope (FESEM) with a SDD based microanalysis system with the following specifications:

Silicon Nitride window detector with element detection down to Al Lα (73 eV)

1:1 Al Lα to Al Kα peak ratio at an accelerating voltage of 2.5kV

70 mm2 chip size collimated providing larger solid angle collection angle (0.5 steradians) input count rates up to 2,000,000 cps (counts per second) throughputs up to 850,00 cps

X-ray energy resolution of 127 eV or better for Mn Kα dwell time < 10 microseconds/pixel- enabling ultrafast EDS Mapping with up to 1 million spectra per second capability non-liquid nitrogen operation, thermoelectrically-cooled detector selectable X-ray process times down to a minimum of 120 ns pile up correction for collection rates >120 kcps

3. TEAM Pegasus Integrated EDS-EBSD with Octane Elite -70 and Hikari Super Scanning Electron Microscope (SEM ) interface for Hikari Camera-This system will replaced the obsoleted silicon Li-drifted (Si(Li)) X-ray detector based microanalysis system on the WMRD FEI NanoSEM 600 FESEM with a SDD based microanalysis system with the following specifications:

Silicon Nitride window detector with element detection down to Al Lα (73 eV)

1:1 Al Lα to Al Kα peak ratio at an accelerating voltage of 2.5kV

70 mm2 chip size collimated providing larger solid angle collection angle (0.5 steradians) input count rates up to 2,000,000 cps (counts per second) throughputs up to 850,00 cps

X-ray energy resolution of 127 eV or better for Mn Kα dwell time < 10 microseconds/pixel- enabling ultrafast EDS Mapping with up to 1 million spectra per second capability non-liquid nitrogen operation, thermoelectrically-cooled detector selectable X-ray process times down to a minimum of 120 ns pile up correction for collection rates >120 kcps

EBSD system capable of indexing over 1400 EBSD patterns per second with a beam current of 13 nA (nano amp)

EBSD system capable of operating at a beam current down to 100 pA (pico amp) at an accelerating voltage of 5 kV (kilo volt)

Supply/Service: Energy Dispersive Spectroscopy Equipment and Maintenance Service

Version – November 2015

4. Atom Probe Assist- Unique, proprietary software module for the TEAM Pegasus Integrated EDS-EBSD with Octane Elite -70 system enabling detection and monitoring grain boundary position of Atom Probe Tomography (APT) specimens during preparation in a Focused Ion Beam instrument.

5. NPAR (Neighbor Pattern Averaging/Rescan)- Unique, proprietary software module option for the TEAM Pegasus Integrated EDS-EBSD with Octane Elite -70 system that provides a method of improving the signal-to-noise level of EBSD patterns in order to improve pattern indexing performance, i.e. speed and reliability.

6. Fast Phase Mapping (Spectrum Aggregate Mapping)- Unique, proprietary software module option for the TEAM Pegasus Integrated EDS-EBSD with Octane Elite -70 system that is specifically designed to intensify spectral data during a map acquisition using statistical methods.

7. TEAM 3D for SEM- Required software/hardware communication package for the TEAM Pegasus Integrated EDS-EBSD with Octane Elite -70 system that allows for the communication between the FEI NanoSEM 600 microscope and the EDAX instrumentation system.

8. TEAM 3D IQ- Proprietary EDS 3D imaging and analysis system for the TEAM Pegasus Integrated EDS-EBSD with Octane Elite -70 system that allows operations within the same software package.

9. OIM 3D Visualization Software- Proprietary software package for the TEAM Pegasus Integrated EDS-EBSD with Octane Elite -70 system that allows 3D graphical displays to be produced from previously collected serial sectioned EBSD data.

In addition, the Government requires an extended service maintenance warranty on each system reflected on option CLINs 0011-0024. The extended service maintenance warranty includes: Technical support; facility visits that include one (1) scheduled preventative maintenance visit and one (1) unscheduled repair visit; and shipping of replacement parts (hardware and software).

4. Authority Cited:

41 U.S.C. 1901(e)( 2), implemented by FAR 13.501(a) -- Only One Responsible Source and No Other Supplies or Services Will Satisfy Agency Requirements.

5. Reason for Authority Cited:

The Government requires upgrades to its obsolete EDAX lithium-drifted silicon based (Si(Li)) X-ray EDS microanalytical instrumentation that attach to three (3) electron microscopes currently owned by ARL (Hitachi S-4700 SEM, FEI NanoSEM600 SEM, and JEOL 2100F TEM) and outdated electron backscattered detector (EBSD) system on the FEI NanoSEM600 SEM to support current and future research and development (R&D) mission and customer programs. The R&D performed by MMSD scientists requires microstructural and chemical characterization of materials that have been developed or

Supply/Service: Energy Dispersive Spectroscopy Equipment and Maintenance Service

Version – November 2015 are undergoing development and evaluation for Army applications. The required updates to these systems will include an upgrade to the latest generation of the more advanced SDD based EDS microanalytical instrumentation/software technology with enhanced light element detection and higher collection rate capabilities resulting in time reductions of 90% for chemical mapping of light elements. Current EDAX EDS/EBSD attachments owned by ARL WMRD have become obsolete and no longer are able to be serviced by Original Equipment Manufacturer (OEM). The new EDS/EBSD system upgrades that will be attached to the three aforementioned electron microscopes represent the state-of-the-art for these systems allowing for future service and maintenance. Just as the obsolete systems, maintenance warranties are also needed for the new systems to insure they are performing optimally to factory specifications in order to generate data that is reliable. The purpose of the required extended maintenance warranties is to prevent lapses in maintenance coverage that have occurred in the past due to budgetary reasons. This will prevent potential loss in systems performance, erroneous data generation, and loss in the values of the systems. The instruments possess proprietary hardware and software which can only be properly serviced by the OEM.

The EDS microanalytical technique allows ARL scientists and engineers to determine the distribution of elements and phases in both homogeneous and heterogeneous materials at length-scales on the order of nanometers to micrometers. The required instrumentation allows for not only bulk chemistry to be determined, but also the chemistry of small precipitates, inclusions, and secondary phases present in heterogeneous materials to be identified. The FEI NanoSEM600 SEM currently contains outdated EDAX EBSD instrumentation (which is a third-party attachment) and requires the detector to be upgraded to the latest generation of EDAX detectors. The systems in their current state are capable of collecting the aforementioned data albeit very slowly exceeding hours in processing time. The upgrades is required to reduce this processing time to minutes and allow high speed and forward backscattered electron detection capabilities, again resulting in significant reductions in the time to characterize phases and other crystallographic information such as crystallographic orientation, grain size, and grain boundary misorientation of materials. Both EDS and EBSD technologies are vital materials characterization tools that ARL scientists and engineers use in order to understand how manufacturing processes and applications environments cause changes in a materials chemistry and microstructure which ultimately affect its properties and performance. Not only are upgrades required for current R&D efforts to achieve the most optimal results but it will also replace obsolete instrumentation that can no longer be serviced or maintained.

Of the vendors who manufacture EDS and EBSD technologies, EDAX is the only vendor that offers EDS and EBSD systems (hardware and software) and extended maintenance warranty that meet the ARL’s WMRD MMSD needs for the most state-of-the-art elemental microanalysis and crystallographic characterization capabilities on its electron microscopes. The required specifications include:

SDD EDS capable of X-ray input rates up to 2,000,000 cps and throughput rates up to 850,000 cps or more

SDD EDS system capable of light element detection down to Al Lα (73 eV)

SDD EDS system capable of enhanced light element detection (capability to detect light elements (qualitative) and quantify how much is there)

Supply/Service: Energy Dispersive Spectroscopy Equipment and Maintenance Service

Version – November 2015

SDD EDS system capable of automated phase mapping

SDD EDS window capable of being cleaned by an oxygen-rich plasma cleaner (only for upgrades to the Hitachi S-4700 and FEI NanoSEM600)

EBSD pattern indexing greater than 1400 patterns per second or more

EBSD system capable of operating down to 100 pA and down to 5 kV

EBSD system capable of enhancing atomic number, topographic, grain boundary, or electron channeling contrast

EBSD system capable of EBSD pattern noise reduction enabling more reliable EBSD pattern recognition and grain boundary positioning

Simultaneous EDS and EBSD data acquisition from specific x,y spatial coordinates

EDS/EBSD systems compatible with pre-existing EDAX EDS/EBSD data

These capabilities enable more efficient elemental microanalysis and crystallographic characterization of materials to be performed resulting in time savings to the Government.

In addition, due to time constraints WMRD requires EDS and EBSD systems that create minimal disruption to program plans. The new required systems must also be compatible with pre-existing EDS/EBSD data. Market research (see section 8.) indicates that there are no other companies with similar products with the required specifications that meet ARL’s needs. EDAX, Inc. is the sole vendor capable of providing an EDS and EBSD systems with the required specifications, compatibility with the EDAX proprietary data formats currently used by prior research efforts completed within the directorate, and interoperability with existing analysis software.

EDAX EDS SDD systems offer up to 35% greater X-ray energy detection efficiency of light elements such as [REDACTED] compared to other manufacturers. These particular elements are essential to WMRD MMSD scientists and engineers as it is their main focus area of lightweight materials. , The Si3N4 window material offered by EDAX allows the window to be cleaned by an oxygen-rich plasma cleaner that is used to clean organics from the inside of electron microscopes without the need to protect the window. The window materials offered by other vendors such as Oxford, Bruker, and ThermoFisher have to be protected when plasma cleaning is being performed in the microscopes, thereby leading to an increased light element X-ray absorption due to organic contamination on the window over time, as well as an increased chance of damage and need for repair. This feature is unacceptable to WMRD MMSD because of mission-related development and evaluation programs requiring consistent analysis of materials based on or containing light elements such as [REDACTED].

In addition, the Government requires the highest x-ray input rates available in the commercial market place to advance to the latest state of the art equipment. EDAX EDS SDD systems possess higher count rates (input rates up to 2M cps and through-put rates up to 850k cps) and data collection rates up to 1400 indexed points per second compared to EDS SDD systems offered by other vendors. EDS SDD systems offered by Oxford, Bruker, and ThermoFisher are capable of input rates of only 250k cps, 1.5M cps, and 1M cps, respectively. Purchasing an EDS SDD system from another manufacturer would result in a longer data collection times and loss of productivity.

Supply/Service: Energy Dispersive Spectroscopy Equipment and Maintenance Service

Version – November 2015

Another required specification of EDAX EDS SDD systems is Automated Phase Mapping.

This capability enables unambiguous generation of X-ray phase maps with no user input, but can accept manual user interaction to lock phase identifications. In addition, X-ray phase mapping is made more efficient by automatic collection time optimization.

Automated Phase Mapping enables phase mapping to be performed more efficiently allowing more materials to be characterized and data analyzed in a given time period, resulting in lower costs per material.

EDAX offers a better performing integrated EDS-EBSD system that is able to operate down to 100 pA electron beam current at 5 kV electron acceleration voltage. This enables poor electron conducting materials such as ceramics and intermetallic compounds to be characterized without the need for conductive coatings to be applied. This results in the phenomenally high count rates which greatly improves the analysis of light elements in lightweight materials that are important in MMSD’S mission programs focused on synthesis and processing of light element containing materials as stated previously.

Another feature of the required systems is that it can conduct both EDS and EBSD simultaneously allowing correlation between chemical data with crystallographic data at specific x,y spatial coordinates. This significantly reduces data acquisition time and improves the quality of both data sets because these can be done in parallel rather than in series. Data quality is improved because of the reduced total time the specimen surface is exposed to the electron beam resulting in less organic contamination (which can degrade imaging and EDS/EBSD data collection). The integrated EDS-EBSD system offered by EDAX provides clear time savings, as well as improved data set fidelity. For example, Typical EDS and EBSD map scans can last over 12 hours each on our current systems. Therefore, to generate a single EDS/EBSD map pair would normally take TWO DAYS. With EDAX’s new integrated EDS/EBSD system, a single EDS/EBSD map pair would take less than ONE HOUR. In one day, we could collect 8 EDS/EBSD map pairs.

To do the same on our current EDS/EBSD system would take at least two months factoring in other users. As for cost savings, it would be < 1 hour versus 16 hours for each EDS/EBSD map pair.

Supply/Service: Energy Dispersive Spectroscopy Equipment and Maintenance Service

Version – November 2015

The Government requires a capability for accurate EBSD pattern recognition such that patterns from adjoining grains can be automatically analyzed unambiguously. EDAX has developed two patented techniques to improve accurate EBSD pattern recognition and grain boundary positions. Neighbor Pattern Averaging & Reindexing (NPAR) is a technique that averages the collected EBSD patterns with all the closest surrounding EBSD patterns on the mapping grid and then reindexes them. This approach reduces the image noise similar to frame averaging, but without the associated time penalty for better quality patterns. Confidence Index (CI) is EDAX’s patented technique of assessing the quality and reliability of an index assigned to an EBSD pattern. With CI, the position of grain boundaries are more reliably positioned. This enables MMSD scientists and engineers to accurately determine the position of grain boundaries in materials providing information with respect to processing history on local deformation, grain growth, and grain orientation. Prior to this capability, EBSD analysis tools obscured grain boundaries to a degree (patterns at grain boundaries unable to be indexed) because at the grain boundaries, the patterns from adjoining grains combine and cannot be automatically analyzed unambiguously, especially when there is poor signal to noise.

In addition to the required specifications, WMRD MMSD requires that the software on the required instrumentation be compatible with existing data sets which are EDAX based.

Over the last five (5) to ten (10) years, ARL scientists and engineers have predominately used EDAX EDS/EBSD systems to acquire data sets on a vast number of materials. Some of these data sets are repeatedly accessed, displayed, re-analyzed, and compared to newer data sets. While these data sets remain, the previously tested materials used in generating that data are most often lost. Unfortunately, these data sets cannot be read by other any other vendors’ EDS/EBSD software because data formats and structures are vendor-specific. In principle, software can be procured to convert one vendor’s data format into the data format of another vendor, but this would cause unnecessary burden to the Government in terms of cost and time delays. It is estimated that if all the EDAX EDS data acquired in the last five (5) years was converted into another vendor’s data format, it would take over 6,000 man-hours to do so. For EDS data generated in the last year, it would take over 1,200 man-hours which is approximately 6 months. In addition, this is assuming that the software translates the data perfectly and the integrity of the data is preserved.

The loss of time, added costs, and possible compromise in data integrity would have a definite negative impact on various programs. As for converting EBSD data, no such software exists. The required proprietary software is exclusive to the EDAX instrumentation and no other vendor can provide the required software.

Supply/Service: Energy Dispersive Spectroscopy Equipment and Maintenance Service

Version – November 2015

The majority [REDACTED] of EDS users and 100% of EBSD users within MMSD use the EDAX EDS/EBSD systems. The EDS system on the JEOL 2100F TEM is manufactured by Oxford Instruments and currently [REDACTED] and thus minimally affected by the change to EDAX. Procuring EDS/EBSD systems from another vendor would cause unnecessary burden to the Government in terms of cost and time delays resulting from the need for an extended training period and decreased productivity resulting from lower user proficiency with respect to hardware and software. Additionally, new instrument operating procedures would have to be written, approved, and instituted which would, conservatively, require 1.5 man-years and cost $525,000. The extended training period, decreased productivity, and need for new IOPs would contribute significant time delays and added costs to supported programs. Cumulatively, the burden in terms of cost and time is estimated to be over 3,000 man-hours which is approximately 18 months.

Based on the aforementioned, it is in the best interest to award this on a sole source basis to EDAX, Inc. as the only vendor with the instrumentation that meets the required specifications of the Government, with software compatible with existing data sets, and an extended warranty service for the equipment due to being the OEM.

6. Efforts to Obtain Competition:

Based on the market research (see Section 8) performed by [REDACTED], Materials Engineer, 23 years’ experience. In effort to obtain competition the following techniques were used to search for potential sources: searches on UNICOR; AbilityOne; CHESS;

OASIS; GSA. Discussions with knowledgeable people or subject matter experts within Government and industry, review of other market research efforts conducted for similar or identical items, and reviewed catalogs and other generally available product literature published by manufacturers, distributors, and dealers or available on-line. Market Research determined no other vendor other than EDAX, Inc. were found to be able to fulfill the Government’s requirement. Additionally, there are no authorized distributors or resellers of the items required.

7. Actions to Increase Competition:

ARL WMRD has actively conducted extensive market research to locate other sources with similar capabilities and specifications. ARL WMRD will continually search the marketplace to increase competition by attending conferences/exhibition, trade journals, World Wide Web research and through open discussion with industry experts to determine if another company can meet the compatible, proprietary data formats, and interoperability with existing Government hardware.

8. Market Research:

Market research was conducted from August 1 through November 8, 2016 by [REDACTED], who holds a PhD in Materials Science & Engineering, Materials Engineer with the [REDACTED] and has over 23 years post-graduate experience in Materials Science and over 25 years of experience with electron microscopy. The purpose of the market

Supply/Service: Energy Dispersive Spectroscopy Equipment and Maintenance Service

Version – November 2015 research was to ascertain the state of the art in EDS and EBSD microanalysis instrumentation for the SEM and TEM for the purpose of upgrading current obsolete or soon to be obsoleted microanalysis instrumentation [REDACTED] interviewed [REDACTED], a Senior Scientist contractor in the [REDACTED]. [REDACTED] is recognized as a subject matter expert in electron microscopy and microanalysis techniques with 35 years’ experience. [REDACTED] attended the Microscopy and Microanalysis 2016 meeting in Columbus, OH and participated in demonstrations at exhibitors’ booths on EDS and SDD instrumentation, obtained and reviewed product literature, and talked with sales engineers and application specialists. The interview determined the new features and improvements available from vendors who participated in the meeting and current advancements in technology and software. [REDACTED] also conducted independent literature and web searches. Specifically, there are only four (4) manufacturers that make microanalysis systems that include SDD EDS detectors for both SEM and TEM and who also make and integrated EBSD system with the SDD EDS system for SEM. The four (4) manufacturers are Bruker Corporation, EDAX, Inc., Oxford, and ThermoFisher Scientific. Only EDAX, Inc. can meet the Government’s needs. In addition, these other vendors were unable to provide the all the requirements listed above.

The following deficiencies describe why Oxford, Bruker, or ThermoFisher cannot meet the requirements of the Government:

1) Oxford's EDS-SDD systems have a maximum input rate of 250,000 cps. Their Nordlys Max3 EBSD detector does not have the capability of virtual apertures for imaging flexibility.

2) Bruker's EDS-SDD system is only capable of 1.5 million cps and throughputs of only 600,000 cps. Their faster EBSD system, e-FlashFS is capable of only 945 indexed points per second and at a reduced pixel resolution, a crystallographic orientation precision of only 0.5 degrees, and cannot operate down to 100 pA and 5 kV.

3) ThermoFisher Scientific EDS system is only able to achieve an input count rate of 1 million cps and their EBSD indexing rate of 600 points per second, without the capability to operate down to 100 pA and 5kV, while their indexing precision is unclear. Thermo Scientific is also severely lacking in the data analysis software requirements, only capable of providing pole figure maps and orientation distribution functions.

4) None of the companies (other than EDAX) incorporates the EDS data into the EBSD indexing process for accuracy.

5) None of the other companies incorporates the Si3N4 ultrathin window that is capable of extremely high light element efficiency and the ability to be cleaned by an oxygen rich plasma.

6) All companies other than EDAX incorporate JFET amplifier technology in their EDS-SDD detectors instead of the faster CMOS technology that EDAX uses, which increases their relative deadtimes compared to EDAX. The relative improvement in efficiency of the EDAX EDS-SDD systems are approximately 30% to 40% better than the other companies. Allowing for a EBSD pattern indexing greater than 1400 patterns per second

Supply/Service: Energy Dispersive Spectroscopy Equipment and Maintenance Service

Version – November 2015

7) None of the other companies can open the proprietary data formats for EDAX EDS and EBSD data for analysis.

8) None of the other companies offer the technique of averaging nearest neighbor patterns or the confidence index technique for improving high speed pattern indexing and grain boundary determination as does EDAX with their NPAR and CI techniques allowing for EBSD pattern noise reduction enabling more reliable EBSD pattern recognition and grain boundary positioning.

9) None of the other companies can generate different information images, such as atomic number contrast, grain contrast, or topographic contrast, from their EBSD detectors cameras by using virtual apertures on the image. EDAX offers an EBSD system capable of enhancing atomic number, topographic, grain boundary, and electron channeling contrast.

Based on the aforementioned market research, it was found that only EDAX, Inc. can provide the required capabilities and compatibility for the integrated EDS-EBSD System on the NanoSEM600 and the EDS-SDD Systems on the Hitachi S-4700 and JEOL 2100F TEM. Only EDAX, Inc. can provide the EDAX Systems Upgrade requested. Potential vendors for installation, testing, and preventative maintenance/inspection services in the marketplace will continue to be followed to permit future competitive procurements if possible.

9. Interested Sources:

In accordance with FAR 5.201 a synopsis was posted to the Federal Business Opportunities (FBO) website on 19 April 2017 with a response closing date of 04 May 2017. This opportunity allows for the submittal of capability statements to the Contracting Officer for review by any interested vendors. On 04 May 2017, Oxford Instruments expressed interest by email stating their plans to launch new EBSD camera technology which was announced by their company on 03 May 2017 claiming specifications that exceed those specified in the Notice of Intent. Specifications of the new technology and brochure was forwarded to the Technical Point of Contact (TPOC) for technical evaluation.

The TPOC, [REDACTED], provided a technical evaluation of the equipment set be launched on 15 May 2017. Technical evaluation determined the proposed instrument does not meet the requirements of the Government. Specifically, he determined Oxford’s specification of X-Max 80 mm sq SDD is capable of X-ray input count rates up to 500,000 cps and throughput of 275,000 cps does not meet or exceed the requirement of SDD EDS capable of X-ray input rates up to 2,000,000 cps and throughput rates up to 850,000 cps or more listed in the synopsis. It also determined Oxford’s proposed instrument does not adequately address the specifications of SDD EDS window capable of being cleaned by an oxygen-rich plasma cleaner (only for upgrades to the Hitachi S-4700 and FEI NanoSEM600) and EBSD system capable of EBSD pattern noise reduction enabling more reliable EBSD pattern recognition and grain boundary positioning. Furthermore the proposed Oxford instrument is not compatible with pre-existing EDAX EDS/EBSD data.

There were no other challenges to the intent to sole source and no other vendors have expressed interest.

Version – November 2015

10. Other Facts:

a. Procurement History Contract: W911QX14P0323 Contractor: EDAX Inc.

Award Date: 14 AUG, 2014 Competitive Status: Sole Source Authority: FAR13.501 (a); Only One Responsible Source and No Other Supplies or Services Will Satisfy Agency Requirements Reason for Authority Cited: EDAX only vendor with the required capabilities of the PV5500/PL-H, EDAX TEAM Pegasus Integrated Energy Dispersive Spectroscopy- Electron Backscattered Diffraction (EDS-EBSD) with Octane Plus and Hikari XP that could be configured on the [REDACTED] FEI NanoLab 600 Dual Beam Focused Ion Beam instrument.

11. Technical Certification: I certify that the supporting data under my cognizance which are included in the justification are accurate and complete to the best of my knowledge and belief.

Signer’s Title: [REDACTED]

12. Requirements Certification: I certify that the supporting data under my cognizance which are included in the justification are accurate and complete to the best of my knowledge and belief.

Signer’s Title: [REDACTED]

13. Fair and Reasonable Cost Determination: I hereby determine that the anticipated cost or price to the Government for this contract action will be fair and reasonable.

This determination will be made using the following:

__ Cost analysis _X_ Price analysis __ Should-cost

__ IGCE

__ Audit: (identify the audit type) __ Other: (identify the methodology or combination of methodologies that will be used)

As a part of this basis, certified cost or pricing data:

__ will be required.

_X_ will not be required and the following exception applies (FAR 15.403):

__ Prices that will be agreed upon are based on adequate price competition.

__ Prices that will be agreed upon are based on prices set by law or regulation.

_X_ A commercial item is being acquired.

__ A waiver has been granted by the head of the contracting activity (HCA) in accordance with DFARS PGI 215.403-1.

__ The contract action is a modification to a contract or subcontract for commercial item(s).

__ The estimated cost of the contract action is less than the threshold for certified cost or pricing data.

X

Contracting Officer (KO)

14. Contracting Officer Certification: I certify that this justification is accurate and complete to the best of my knowledge and belief.

Approval Based on the foregoing justification, I hereby approve the procurement of three (3) EDS components and one (1) EBSD component to attach to microscopes currently owned by ARL and all corresponding software. This purchase will also include an extended warranty service contract for the equipment, on an other than full and open competition basis pursuant to the authority of 41 U.S.C. 1901(e)(2), subject to availability of funds, and provided that the services or supplies herein described have otherwise been authorized for acquisition.

(End of Justification)