PWS FIB SEM Dual Beam_Rev 1.pdf

Performance Work Statement Maintenance of

FEI Helios FIB/SEM Dual Beam

1. Background:

1.1 Benet Labs’ FEI Helios 600i Focused Ion Beam / Scanning Electron Microscope is a scientific instrument that combines the imaging capabilities of a scanning electron microscope (SEM) with the micro-machining capabilities of a focused ion beam system (FIB). The dual-beam allows the Lab to characterize cutting edge materials, including nano-structured and non-metallic designs, composite structures, atomic-scale materials, and non-metallic coatings in-house. In order to maintain the quality, reliability, and accuracy of the instrument, periodic maintenance is required.

2. Applicable Documents: None.

3. Scope/Objective:

3.1 Provide maintenance, support, repair and software updates to FEI Helios 600A FIB/SEM Dual Beam per the Description of Services.

4. Requirements:

4.1 Contractor shall provide maintenance service to include 1PM per year, calibration to factory specification, OEM replacement parts, as available, labor, materials, repairs, support, and software updates where necessary on the following items:

4.1.1 Helios Nanolab 600i, S/N 9921883

4.1.2 FEI Easylift, S/N 9921883.1

4.1.3 Pt Deposition, S/N 9921883.2

4.1.4 ICE Detector, S/N 9921883.3

4.1.5 STEM Detector, S/N 9921883.4

4.1.6 NavCam, S/N 9921883.5

4.2 Contractor shall not be required to provide consumable items such as, but not limited to:

4.2.1 Final Apertures

4.2.2 Scintillators

4.2.3 Filaments

4.3 Contractor will be required to provide the following consumable items:

4.3.1 Ion Source; F/G,LMI,GA69,CA,LONGLIFE - 16830 - QTY 1

4.3.2 EXTRACTOR ASSY,SW - 4035 272 35971 - QTY 1

4.3.3 SUPPRESSOR,SW - 4035 272 35991 - QTY 1

4.4 Contractor’s response time for service call(s) shall be 48 hours after being notified of equipment problem or failure. FEI shall provide telephone support for repair and maintenance of the Equipment during FEI business hours (Monday through Friday, 8:00 am – 5:00 pm, based on the time zone in which the Equipment is located, exclusive of FEI holidays).

5. QASP:

Performance Objectives Reference Acceptable Quality Level (AQL)

Method of Surveillance

Provide 1 PM per year Para. 4.1 100% Feedback from the Technical POC.

Response for service calls shall be 48 hours after notification of problems

Para. 4.3 98% Feedback from the Technical POC for each service call.

6. Special Requirements

6.1 Accounting for Contract Service:

6.1.1 The contractor shall report ALL contractor labor hours (including subcontractor labor hours) required for performance of services provided under this contract for the [FEI Helios FIB/SEM Dual Beam] via a secure data collection site. The contractor is required to completely fill in all required data fields using the following web address: https://www.ecmra.mil

6.1.2 Reporting inputs will be for the labor executed during the period of performance during each Government fiscal year (FY), which runs October 1 through September 30. While inputs may be reported any time during the FY, all data shall be reported no later than October 31 of each calendar year, beginning with 2020. Contractors may direct questions to the help desk at:

https://www.ecmra.mil

7. Options: N/A

8. Period of Performance on this maintenance contract shall be for one (1) year, 1 April 2024 through 31

March 2025.

9. Benet Technical Point of Contact is Ray Seitz, (518) 266-5812.

10. Place of Performance: Benet Laboratories, Watervliet Arsenal, Watervliet, NY 12189.

11. Information Disclosure: A Certificate of Non-Disclosure shall be signed by all contractor employees working under this effort and returned to the COR prior to award. The contractor shall not release any information or data without the approval of the Government.