Synopsis-RFI (Sole Source using 6.302-1).doc

Synopsis – J&A for Other than Full and Open Competition & Request for Information (RFI)

1. Class Code: 66

2. NAICS Code: 334516

3. Subject: NOTICE OF INTENT TO SOLE SOURCE – One (1) Premium High Vacuum and Environmental Control Atomic Force Microscope (AFM/SPM) & critical add-on components.

4. Solicitation Number: W911QX-21-R-0028

5. Set-Aside Code: N/A

6. Response Date: NLT 15 Days after posting of Synopsis (11.59 AM EST)

7. Place of Performance: US Army Contracting Command

Aberdeen Proving Ground

Adelphi Contracting Division

2800 Powder Mill Road

Adelphi, MD 20783-1138

8. Description:

The United States Government intends to solicit and negotiate with only one source under the authority of FAR 13.501(a), Only One Responsible Source and No Other Supplies or Services Will Satisfy Agency Requirements. The Government intends to solicit and negotiate with Hitachi High-Technologies Science America Inc., 20770 Nordhoff St, CA, 91311-5900 (CAGE: 4N4P1) for One (1) Premium High Vacuum and Environmental Control Atomic Force Microscope (AFM/SPM) & critical add-on components.

This notice of intent is not a request for competitive proposals. However, this notice does function as a Request for Information (RFI) for offeror’s who believe they can meet the Government’s requirement (see Section 9 below). Any responsible source who believes it is capable of meeting the requirement may submit a capability statement, proposal, or quotation, which shall be considered by the agency, only if received by the closing date and time of this notice. A determination not to compete the proposed requirement based upon the responses to this notice is solely within the discretion of the Government.

Requirement: One (1) Scanning Probe Microscope (SPM) with rapid, efficient sample exchange, scanning capabilities and tuning modes to measure sample properties, high vacuum, low and high temperature control, humidity control accessory capability, vibrational isolation and controls for sub nanometer measurements at 1-0.3A noise levels, zoom microscope, lens magnification fixtures, compatible sample-holder unit for sample protection from air to transfer sample between SPM and other such protected systems, accommodation for 25 mm diameter semiconductor-wafer samples of various typical thicknesses under 10 mm, state-of-the-art data handling, and ease of use.

SPM Salient Characteristics

1. SPM Functional Property-Measurement Capabilities: Electrostatic force measurements (EFM), conductivity measurements (CFM), doping measurements, capacitance measurements, relative surface potential measurements (KFM, KPFM).

2. Environmnetal control capability specifications: High Vacuum (9.9 x 10-5 Pa) in addition to ambient, droplet, or low-evaporation accommodations and options, low (-120 °C) to high (~800 °C) temperature control range; humidity control capability option availability).

3. Sample size ~ 25 mm diameter, 10 mm thickness.

4. Zoom microscope and 5X-50X range of lens magnification.

5. Automatic cantilever alignment capability with computer controlled motorized Laser spot positioning and photodiode centering system with diffraction limited performance

6. XY scanning with range capability up to 150 µm (XY) and up to 15 µm (Z-height), closed and open loop capability, with minimal sample drift (<20/200nm/°C with/without temperature control module), vibrational isolation and controls for sub nanometer (~ 10-100 pm) measurements at 0.3-1 Ångstroms noise level. Quantify noise as average deviation (Adev) in a 0.1Hz to 1kHz bandwidth. Quantify AC and DC system noise height in picometers. Quantify closed loop scan performance and feedback gains to achieve lattice resolution (<10nm scans) relative to large scan (>1µm) values.

7. Vibration isolation/immunity: <10pm coupling into deflection for 1mm/s2 floor acceleration

8. Air-protection sample-holder transfer unit compatible with inert-gas and evacuation levels in associated (transfer-destination) system environments.

9. State-of-the-art data handling and ease of use. Powerful, fast data acquisition, real-time and offline graphing up to 3D, overlay capability, real-time and offline image processing capabilities, image export in multimple formats (JPEG, TIFF, etc.)

10. Upgradeable software and firmware

11. Digitally operated controllers and electronics

12. Options/Accessories add-on capability: to fulfill current and future needs of the requirement.

13. Installation, Training, post-installation Testing and Qualification; on-site vendor personnel of US Citizenship.

14. Post-Sales Service Package: one year parts and labor warranty; ongoing technical assistance.

Responses to this notice are due on or before 15 days after posting of synopsis at 11:59 AM EST by email at william.nuamah.civ@mail.mil .

Point of Contact for this notice is William Nuamah, 301-394-0755, william.nuamah.civ@mail.mil

Template last updated 3/2/2015