SOW XRD System RFI.pdf

REQUIREMENT SPECIFICATIONS

XRD DIFFRACTOMETER SYSTEM

1.0 Scope. The objective is to procure an X-Ray Diffraction (XRD) Diffractometer System that meets the analytical needs of advanced materials research, capable of performing high-precision analyses of crystalline materials. The system should be versatile, enabling users to conduct various diffraction experiments, including phase identification, quantification, and crystallographic structure determination. This XRD Diffractometer System will be a key asset in supporting advanced materials research and analysis needs, contributing to enhanced research capabilities and scientific outcomes.

2.0 Overview. The X-Ray Diffraction (XRD) Diffractometer System is intended to fulfill high-precision analytical needs for materials research, supporting detailed characterization of crystalline structures in various material types. This system should provide accurate, reproducible, and high-resolution diffraction data, enabling phase identification, quantitative analysis, and crystallographic studies. The required XRD system must accommodate a range of sample types, including powders, thin films, and bulk solids, offering both versatility and adaptability in research applications.

Key components of the XRD Diffractometer System will include a high-stability X-ray source, configurable optics for various diffraction modes, a high-resolution detector, and advanced software for comprehensive data analysis. The system should also support efficient workflows through automated features, user-friendly software, and adaptable configurations for different experimental setups. Safety is paramount, so the system must meet all regulatory standards for radiation protection and include necessary safety features, such as shielding and emergency controls.

This system will enhance the research capabilities of the lab, allowing for accurate characterization of materials and contributing to a better understanding of their structural and compositional properties. Through targeted analyses, the XRD Diffractometer will support innovations in materials science, aiding in applications from basic research to applied development across sectors such as electronics, nanotechnology, pharmaceuticals, and environmental science.

3.0 Requirements. The resulting purchase order shall insure full compliance to OSHA

OTC.

1. System Performance Requirements:

• High Sensitivity and Resolution:

• The system should provide high diffraction sensitivity and resolution to accurately detect and quantify crystallographic phases.

• Versatile Sample Handling: Capable of accommodating different sample forms, including powders, thin films, and bulk solids.

• X-Ray Source and Optics:

• High-Stability X-Ray Source: Equipped with a stable X-ray generator and source to ensure consistent results.

• Configurable Optics: Should include adjustable optics for flexible configurations, including reflection and transmission modes.

• Detector System:

• High-Resolution Detector: The detector must provide high resolution with low background noise for accurate data acquisition.

• Fast Scanning Capabilities: Detector system should support high-speed scanning for efficient data collection.

• Software and Data Analysis:

• User-Friendly Interface: The system should be equipped with intuitive software that facilitates setup, operation, and data analysis.

• Data Processing: Advanced capabilities for data processing, including peak analysis, pattern fitting, and crystallographic structure analysis.

• Operational Flexibility:

• Temperature and Environmental Control: Should allow for analysis under variable environmental conditions (temperature, humidity) if required for specific experiments.

• Automated Sample Loading and Unloading: If possible, automated sample handling options for efficiency and reproducibility in measurements.

• Safety and Compliance:

• Radiation Shielding: The system should be fully compliant with safety standards for radiation protection and meet local regulatory requirements.

• Emergency Stop and Interlock System: Equipped with emergency controls to immediately halt operations if needed.

2. Support Requirements

• The purchase shall meet the requirements for purchase set forth in the Buy American Act.

4.0 Delivery. The contractor shall deliver and install the XRD system and provide basic operations training to OTC within 120 days of contract award date. Supplier is responsible for the shipping cost.

5.0 Delivery Location

OSHA Technical Center 8660 S Sandy Pkwy Sandy, UT 84070

6.0 Specifications. The contractor shall provide services for installation of the XRD system. Also, the contractor shall aid in optimization of XRD system to ensure technical requirements (low levels of respirable crystalline silica) can be reliably measured.

The requested components are:

6.1.1. XRD system will have an X-ray source with Cu target.

6.1.2. XRD system will have goniometer system.

6.1.3. XRD system will have sample stage.

6.1.4. XRD system will have heat exchanger (air cooled or water cooled) water chiller system for cooling of the X-ray source.

6.1.5. XRD system will have a removable monochromator.

6.1.6. XRD system will have an automated sample changer capable of analyzing

48-100 samples and standards at a time.

6.1.7. XRD system will have automatic sample holders that can accommodate

25-mm diameter silver membrane filters.

6.1.8. XRD will have enough power minimize sample analysis time but yield limits of detection of 10 ug of silica or better for all peaks.

6.1.9. XRD system will have a Detector.

6.1.10. XRD system will have a modular system capable of exchanging beam path accessories.

6.1.11. XRD system will have a PC Computer for instrument control and data processing.

6.1.12. XRD system will have the ability to calibrate the range from 10 micrograms to 2,000 micrograms of quartz and 20 micrograms to 2,000 micrograms of cristobalite.

6.1.13. XRD system will have a way to export results into a delimited ACSII text file or other comma separated type file for import into other processing software.

6.1.14. XRD system will be able to reliably measure quartz at the four major angles (26.66°, 20.88°, 50.18°, 60.00°) down to 10 micrograms for quartz and 20 micrograms for cristobalite (22.00°, 36.07°, and 31.42°). Vendors will be given the opportunity to analyze several 10-microgram quartz and 20-microgram cristobalite spikes on silver filters provided by the OSHA Technical Center (OTC) and are expected to submit the scans, scan times, and quantitative results for each of the four peaks listed to the OTC for consideration. Other challenge samples will be provided by the OTC at or around the 50-microgram spike level for quartz or cristobalite or mixtures of both.