SOW XRD System - Final - 12-9-25.docx

REQUIREMENT SPECIFICATIONS

XRD DIFFRACTOMETER SYSTEM

1.0 Scope. The objective is to procure an X-Ray Diffraction (XRD) Diffractometer System that meets the analytical needs of advanced materials research, capable of performing high-precision analyses of crystalline materials. The system should be versatile, enabling users to conduct various diffraction experiments, including phase identification, quantification, and crystallographic structure determination. This XRD Diffractometer System will be a key asset in supporting advanced materials research and analysis needs, contributing to enhanced research capabilities and scientific outcomes.

2.0 Overview. The X-Ray Diffraction (XRD) Diffractometer System is intended to meet high-precision analytical requirements for materials characterization, providing accurate, reproducible, and high-resolution diffraction data. It must support phase identification, quantitative analysis, and crystallographic evaluation across a variety of sample types, including powders, thin films, and bulk solids.

The system should include a stable X-ray source, configurable optics, a high-resolution detector, and comprehensive analysis software. It must accommodate different experimental configurations with flexibility and efficiency. The system is also required to meet all applicable safety standards for radiation protection, including shielding and integrated safety controls.

This instrument will expand the lab’s capability to characterize materials and contribute to advancements in structural analysis across scientific disciplines such as electronics, nanotechnology, pharmaceuticals, and environmental science.

3.0 Technical Requirements / Specifications. The resulting purchase order shall ensure full compliance with OSHA OTC. All services and materials provided under this agreement shall be performed by, or sourced directly from, the original equipment manufacturer (OEM) to maintain system integrity, ensure compatibility, and uphold warranty and performance standards.

3.1 System Performance Requirements

· High Sensitivity and Resolution The system should provide high diffraction sensitivity and resolution to accurately detect and quantify crystallographic phases.

· Versatile Sample Handling Capable of accommodating different sample forms, including powders, thin films, and bulk solids.

· X-Ray Source and Optics

· High-Stability X-Ray Source: Equipped with a stable X-ray generator and source to ensure consistent results.

· Configurable Optics: Should include adjustable optics for flexible configurations, including reflection and transmission modes.

· Detector System

· High-Resolution Detector: The detector must provide high resolution with low background noise for accurate data acquisition.

· Fast Scanning Capabilities: Detector system should support high-speed scanning for efficient data collection.

· Software and Data Analysis

· User-Friendly Interface: The system should be equipped with intuitive software that facilitates setup, operation, and data analysis.

· Data Processing: Advanced capabilities for data processing, including peak analysis, pattern fitting, and crystallographic structure analysis.

· Operational Flexibility

· Temperature and Environmental Control: Should allow for analysis under variable environmental conditions (temperature, humidity) if required for specific experiments.

· Automated Sample Loading and Unloading: If possible, automated sample handling options for efficiency and reproducibility in measurements.

· Safety and Compliance

· Radiation Shielding: The system should be fully compliant with safety standards for radiation protection and meet local regulatory requirements.

· Emergency Stop and Interlock System: Equipped with emergency controls to immediately halt operations if needed.

3.2 Support Requirements and Specifications The contractor shall provide services for installation of the XRD system. Also, the contractor shall aid in optimization of XRD system to ensure technical requirements (low levels of respirable crystalline silica) can be reliably measured. The requested components are:

· The XRD Diffractometer shall meet the requirements of the Buy American Act.

· Specifications should include the following:

· XRD system will have an X-ray source with Cu target.

· XRD system will have a goniometer system.

· XRD system will have sample stage.

· XRD system will have a heat exchanger (air-cooled or water-cooled) chiller system for cooling of the X-ray source.

· XRD system will have a removable monochromator.

· XRD system will have an automated sample changer capable of analyzing 48–100 samples and standards at a time.

· XRD system will have automatic sample holders that can accommodate 25-mm diameter silver membrane filters.

· XRD will have enough power to minimize sample analysis time but yield limits of detection of 10µg of silica or better for all peaks.

· XRD system will have a detector.

· XRD system will have a modular system capable of exchanging beam path accessories.

· XRD system will have a PC computer for instrument control and data processing.

· XRD system will have the ability to calibrate the range from 10-µg to 2,000 µg of quartz and 20 µg to 2,000 µg of cristobalite.

· XRD system will have a way to export results into a delimited ASCII text file or other comma-separated file for import into other processing software.

XRD system will be able to reliably measure quartz at the four major angles (26.66°, 20.88°, 50.18°, 60.00°) down to 10 µg for quartz and 20 µg for cristobalite (22.00°, 36.07°, and 31.42°).Vendors will be given the opportunity to analyze several 10-µg quartz and 20-µg cristobalite spikes on silver filters provided by the OSHA Technical Center (OTC) and are expected to submit the scans, scan times, and quantitative results for each of the four peaks listed to the OTC for consideration. Other challenge samples will be provided by the OTC at or around the 50-µg spike level for quartz, cristobalite, or mixtures of both.

4.0 Delivery. The contract will cover delivery, installation, calibration, training, and warranty support. The system must be delivered within 30 days after the contract is awarded. Installation and operational verification will be completed within 90 days of delivery to the following location:

· OSHA Technical Center 8660 S Sandy Pkwy Sandy, UT 84070

5.0 Maintenance and Support Requirements. The contractor shall provide a base year and four (4) option periods of service maintenance beginning on the date of Government acceptance of the XRD system.

The full-service maintenance agreement shall include:

· Unlimited remote technical support during standard business hours, defined as 8:00 AM to 4:30 PM Mountain Standard Time (MST), Monday through Friday, excluding federal holidays.

· Software upgrades and support for applicable control software.

· 72-hour on-site response upon diagnosis during business hours.

· Repair visit(s) as required and determined by the contractor’s Service Manager.

· Standard repair parts and one-way shipping to the Government site.

· Loaner parts provided to ensure continued operation.

· One (1) annual on-site Preventive Maintenance (PM) visit shall be provided during the Base Year and each of the four (4) Option Periods, including:

· Consumables replacement (via PM kit),

· Performance optimization and diagnostics.

· The Contractor shall provide one (1) anode rebuild for each rotating anode X-ray generator during the agreement period, to include all labor, parts, balancing, and one-way shipping. In addition, to minimize equipment downtime and ensure continuity of preventive maintenance activities, the Contractor shall furnish one (1) additional anode as part of this purchase.

All maintenance must be performed by certified technicians using original manufacturer parts and procedures to maintain system performance and warranty compliance.

6.0 Period of Performance.