SOW_Final.docx

STATEMENT OF WORK

Title: High Voltage G3VM-101LR Switches Lab: National Institute of Standards & Technology (NSIT) Nanoscale Device Characterization Division, Advanced Electronics Group, Project GC 5.03

BACKGROUND & PURPOSE

Advanced electronics in many applications require very low failure rates under harsh operation conditions over a very long period of time. To ensure that electronics systems meet such requirements, reliability data under realistic use condition with sufficient statistics is needed. Such data are lacking in general, and a gap exists between what is needed for system designers to build a reliable system, and what chipmakers can provide. NIST aims to develop a massively parallel reliability measurement platform to bridge this gap. The proposed platform requires custom electronic circuitries to enable it operation, data acquisition and analysis. These custom electronics circuits are built around high-voltage switches that form a switching network. The Advanced Electronics Group requires the acquisition of 15,000 opto-isolated high voltage switches. These switches will populate custom printed circuit boards used for the measurement of capacitor leakage currents and failure statistics as part of the massively parallel reliability testing platform under the CHIPS R&D: Metrology Grand Challenge for modeling and simulating semiconductor manufacturing processes. This equipment is critical to the generation of an adequate level of failure statistics for SiC gate dielectrics from which novel reliability models can be built. The semiconductor industry requires a better physical understanding of failure/reliability mechanisms, which can only be found through truly massively parallel testing.

Purpose: Bridge the gap between what is needed for system designers to build a reliable system and what chipmakers can provide.

SCOPE

The Contractor shall deliver a quantity of 15,000 G3VM-101LR switches manufactured by Omron, inclusive of FOB Destination delivery terms.

BRAND NAME ONLY JUSTIFICATION

NIST aims to develop a massively parallel reliability measurement platform This work fall under the Grand Challenge #5 “Modeling and Simulating Semiconductor Manufacturing Processes” of the CHIPS metrology program. The proposed platform requires custom electronic circuitries to enable its operation, data acquisition and analysis. These custom electronics circuits are built around high-voltage switches that form a switching network. The Advanced Electronics Group requires the acquisition of 15,000 opto-isolated high voltage switches. These switches will populate custom printed circuit boards used for the measurement of capacitor leakage currents and failure statistics as part of the massively parallel reliability testing platform under the CHIPS R&D: Metrology Grand Challenge for modeling and simulating semiconductor manufacturing processes. This equipment is critical to the generation of an adequate level of failure statistics for SiC gate dielectrics from which novel reliability models can be built. The semiconductor industry requires a better physical understanding of failure/reliability mechanisms, which can only be found through truly massively parallel testing.

The only Switch discovered capable of meeting all requirements is model G3VM-101LR, manufactured by Omron Electronics, LLC and available through at least three (3) authorized resellers. To be technically acceptable for the application the switches will be used in, all of the following salient characteristics must be met:

1. Shrink Small Outline Package (SSOP) footprint

2. 100 V load rating

3. Output leakage of no more than 200 pA at 80 V load (open relay)

MINIMUM REQUIREMENTS

The Contractor shall submit a firm fixed price quotation for all line items. The offered supplies/system must meet all technical specifications identified below. All items must be new. Used or remanufactured equipment will not be considered for award. All line items shall be shipped in the original manufacturer’s packaging and include all original documentation and software, when applicable. This requirement is for modified commercial off the shelf items only.

Line Item 0001:

Description: G3VM-101LR switch Quantity: 15,000 A. Technical Specifications

a. G3VM-101LR switches in in T/R, tube, tray, or custom reels.

DELIVERABLES

No later than sixteen (16) weeks after receipt of order.

DELIVERY TERMS

Delivery shall be F.O.B Destination (or equivalent incoterms, such as DDP) and shall occur in accordance with the delivery due dates provided in the below table.

FOB Destination means: The contractor shall pack and mark the shipment in conformance with carrier requirements, deliver the shipment in good order and condition to the point of delivery specified in the purchase order, be responsible for any loss of and/or damage to the goods occurring before receipt and acceptance of the shipment by the consignee at the delivery point specified in the purchase order; and pay all charges to the specified point of delivery. The contractor shall deliver all Line Items to:

National Institute of Standards and Technology Shipping and Receiving 100 Bureau Drive, Building 301 C/O TBD Building 225/B348 Gaithersburg, MD 20899

INSPECTION & ACCEPTANCE

In addition to the inspection and acceptance terms articulated in the specific FAR clause that allows the Government reserves the right to perform such performance tests and evaluations as defined below to verify specified system performance. Such tests and evaluations, if performed, shall be conducted within the environment that the system is to be operated. The Contractor has the right to be present during the tests and evaluations, if performed, at the Contractor’s expense.

Performance Tests:

1. Leakage current of subset of switches meets/exceeds datasheet specification

NIST may choose at its discretion to forego this part of acceptance testing.

A visual inspection of the equipment will be performed by the NIST TPOC/COR to identify surface defects or any form of indication that any equipment was damaged during transport to NIST. The Government shall have sole discretion to require repair or replacement of damaged and/or nonconforming supplies at no cost to the Government. The Government at any time prior to acceptance shall reject the equipment due to defects and/or nonconformance. The vendor is responsible for latent defects discovered any time after final inspection. However, the extent of its liability shall be prorated over the useful life of the equipment.

Ownership of the equipment shall transfer to NIST upon acceptance by the Government.

The Government will test, inspect, and accept or reject the equipment within 2 weeks of the receipt of the equipment unless otherwise indicated above. The Government reserves the right to conduct quality assurance testing to confirm that a given instrument(s) meets the manufacturer’s and/or the Government’s performance specifications. It is anticipated that the equipment will meet all manufacturer’s specifications and/or the Government’s performance specifications identified in the most recent operations and maintenance manual for each piece of equipment and/or in this document.

PAYMENT SCHEDULE

Advanced payment is not authorized. The Contractor shall submit the invoice in the arrears and shall be paid, in accordance with the payments clause in the contract and as otherwise noted in this document, upon receipt of a proper invoice.

NOTE: Partial shipments and partial invoices will not be accepted, unless otherwise requested and accepted by the Contracting Officer prior to award offer. Proposed payment schedules shall be submitted with vendor’s response to the RFQ for consideration.

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