FINAL_SOW_14_Aug_15_04552_SOW_ICP-OES.docx

Attachment I

STATEMENT OF WORK

Inductively Coupled Plasma Optical Emission Spectrometer (ICP-OES) System

I. SPECIFICATIONS

The Contractor shall provide one (1) Perkins Elmer OPTIMA 8300 Concentric ICP-OES analytical instrument system or EQUIVALENT with the salient characteristics listed below. The Contractor shall install the instrument and provide training and warranty as described below.

This is a brand name or equal requirement. Brand name or equal description is intended to be descriptive, but not restrictive, and is to indicate the quality and characteristic of products that will be considered satisfactory to meet the agency’s requirement.

Salient Characteristics:

The instrument shall be a Dual Viewing, simultaneous ICP using a minimum of two solid state detectors for increased efficiency. The instrument shall have a concentric sample introduction system with a cyclonic spray chamber and concentric nebulizer system.

· The new ICP shall include Flat Plate Plasma technology for increased precision and stability. No consumable RF coil shall be needed.

· System shall be able to operate with the AS 93 autosampler and S10 autosampler.

· System shall allow for a neb heater which keeps the chamber at a regulated torch temperature.

· The ICP system shall have a diagnostic plasma view camera that allows you to see every component in the torch compartment while the plasma is in operation. Shall also include a shutter aperture to increase or decrease light.

· The detector shall be cooled by a Peltier device to minimize detector dark current thereby enhancing instrument performance and detection limits.

· The instrument shall have an Echelle-based Spectrometer. The entire optical system shall have the ability to be purged using standard purge rate and boost purge for determinations made at wavelengths below 185nm. Either nitrogen or argon shall be used as purge gases and the gas flows shall be controlled by the system controller.

· The resolution of the system shall be a minimum of 0.006 nm at 200 nm. The spectrometer shall incorporate Schmidt correction to eliminate aberration and enhance the UV and a fused-quartz prism which enhances the visible region.

· The instrument shall be able to perform determinations across the UV and Visible spectrum for a minimum of 246 wavelengths simultaneously.

· The instrument shall be able to determine all desired elements using one analytical method, with multiple wavelengths per element, axially and/or radially. It shall also be able to deselect (but not delete) selected wavelengths from a method prior to measurement.

· The entire optical system shall be enclosed in a purged and thermostatted optical enclosure. The optical enclosure shall be mounted on the same large optical bench as the sample-introduction system. The optical bench shall be shock-mounted to the frame of the instrument so that normal floor vibrations do not affect system performance.

· The system shall include a computer controlled, pneumatically operated shutter system that shields the detector between samples from long exposures to UV radiation.

· Each detector pixel shall have anti-blooming protection to enable the simultaneous measurement of trace level analytes in the presence of major matrix constituents.

· The radio frequency (RF) generator shall be totally solid-state at a frequency of 40 megahertz (MHz). The generator shall have a minimum power output range of 750- 1500 watts and be computer controllable in 1-watt increments and not utilize any power amplifier (PA) tubes. . The RF generator shall have power transfer efficiency into the plasma of at least 81% and a power output stability of 0.1% or better. The compact RF supply shall meet all Federal Communications Commission (FCC) certification requirements for RF emission (Part 18 of FCC rules and regulations)..

· Totally automated Instrument start-up and shut down shall be computer controlled.

· If the RF power fluctuates, the system shall be able to automatically increase the stabilization time prior to starting an analysis.

· Argon flow shall be at 8ml/min or less.

· Plasma gas flows shall be controlled in 1L/min increments.

· Auxiliary and nebulizer gas flows shall be controlled in 0.1 L/min increments.

· Shall include an Eco Bench system with a manual robotic arm that holds the monitor and keyboard.

· The instrument shall be able to operate with temperature changes of up to 2.5C per hour without any degradation of performance.

· The sample introduction system chamber shall be heated and thermostat controlled to compensate for variations in room temperature.

· The instrument shall monitor gas pressures and flows, interlocks, water flows, and plasma stability. The system shall continuous monitor the interlocks; and if any interlock is interrupted, the plasma shall shut down automatically.

· The system shall include a water recirculator. The recirculator shall not be mounted to the instrument chassis and shall have the ability to be situated at a distance from the instrument.

· The viewing of the plasma shall be computer controlled. Plasma torch shall be mounted axially and be of a demountable design.

· The instrument shall have a compressed air shear gas to cut off the cool end of the axial plasma to reduce material deposition on the entrance optic a well as to reduce self-sorption and physical interferences.

· The system shall include a computer controlled, pneumatically operated shutter system that shields the detector between samples from long exposures to UV radiation.

· The instrument shall be able to run organic as well as aqueous matrices. Organic matrices include oil, MIBK, Kerosene, and Hexanes.

· System shall be upgradable to an autosampler which can deliver the sample process properly and efficiently in less than 45 sec. The complete process includes sample flush, pump speeds, read delay, measurements and rinse out.

· All transfer components shall be designed to handle environmental samples.

· When using the cross-flow nebulizer the instrument shall be able to handle 50% HCl, HNO3, H2SO4, H3PO4, 20% HF, and 30% NaOH. The system shall be able to aspirate 20% NaCl for one hour without clogging.

· The system shall be able to accommodate commercially available, specialty nebulizers and spray chambers manufactured by third parties for maximum analytical flexibility.

· The torch system shall have integrated gases; no tubes or nipples for the gases.

· The torch shall be computer adjustable and manually adjustable for (organic or unique sample types) while the plasma is lit.

· The operator shall be able to change torch injectors without having to remove the torch assembly from the instrument.

· The instrument shall include a quick-change torch module so the torch can be removed or changed quickly without excessive torch alignment. The sample-introduction cassette shall allow adjustment (with the plasma on) for maximum performance in different matrices. One hand removal with no tools shall be required for torch or sample-introduction cassette removal.

· The system shall include a variable speed, computer controlled peristaltic pump equipped with the Tubing-Saver mode. The pump shall have three channels to allow for on-line addition of internal standards.

· The autosampler shall be upgradable to the PrepFAST system.

· NexION: Recognition of over-range samples and automatic insertion of rerun at calculated dilution factor.

· Shall be able to append a method to an autosampler run after the run has begun and during a run.

· Shall include a “Universal Data Acquisition” mode which enables users to—optionally, on demand—collect all the spectral data for every sample regardless of the elements being determined.

· Software shall allow users to easily change instrument parameters (such as number of replicates) without creating a new method prior to measurement to facilitate methods development efficiencies.

· The software shall allow for Priority samples to be inserted at any time during an analysis without stopping the actual sequence. The software shall also allow many samples to be appended into a run without interrupting the run.

· The instrument shall read both background and emission data simultaneously and allow for automatic background correction.

· All raw data shall be saved to the computer and the system shall allow for post run reprocessing of any data point, eliminating the need to reanalyze the sample thus increasing productivity. This includes changing of background correction points, standard values, curve-fit technique, and individual replicate editing.

· The software shall have a library of analytical wavelengths containing all the major wavelengths for all elements.

· Shall include a Continuous graphics mode. Continuous graphics shall be displayed in real time displaying how the instrument is operating by acquiring and displaying data in real time. The system shall allow operating parameters of the instrument and RF generator to be modified as data is acquired, allowing method optimization to be further enhanced. For example, RF power and nebulizer flow can be changed while their impact is monitored. Peristaltic pump speed can be set to improve noise and signal intensity, maximizing system performance.

· Shall include a detection limit diagnostic that is a one button diagnostic that causes measurements of blanks and calculations of detection limits—number of replicates and standard deviation multipliers should be fully user programmable.

· Instrument shall achieve the same or smaller FWHM peak resolution for the following elements of interest:

· Shall provide 2 hardcopy and 1 softcopy format (either PDF or Microsoft Word) Operations and Maintenance Manuals for the analytical instrument.

· The vendor shall provide a new instrument and a model currently in production. Refurbished or demonstrator/demonstration instruments will not be accepted.

Installation:

The Contractor shall install the instrument in Building 227, Room B323, at NIST Gaithersburg, MD. Installation shall include, at a minimum, uncrating/unpacking of all equipment, set-up and hook-up of all equipment, start-up, demonstration of specifications, and removal of all trash. Instrument shall operate to manufacturer’s specifications upon installation. Installation shall take place during normal business hours, between 8:30 am and 5:00 pm Eastern Time, Monday through Friday except Federal Holidays, and shall be coordinated with the NIST Technical Point of Contact (TPOC). Installation shall occur within 60 days of contract award.

Warranty:

The Contractor shall provide, at a minimum, a one year warranty for the system. All hardware and software shall be covered. The warranty shall cover all parts, labor and travel. Only original equipment manufacturer certified parts shall be used in the repair and maintenance of the instrument. The warranty shall commence upon successful completion of delivery, installation, training and demonstration of all required specifications.

During the warranty period, the Contractor shall provide telephone support, and on-site service and replacement of any defective equipment or software. The Contractor must respond to NIST personnel requesting service by phone not later than two hours after receiving a request for service or technical support. The Contractor must provide their best effort to be on-site at NIST within two business days of the initial request for service.

Training:

The Contractor shall provide at least two (2) hours of training at NIST for up to two (2) NIST personnel covering normal operation, troubleshooting, and routine maintenance. Training shall be provided during normal business hours, between 8:30am and 5:00pm Eastern Time, Monday through Friday, except Federal Holidays, and shall be coordinated with the NIST Technical Point of Contact (TPOC) to ensure maximum availability of NIST personnel. Training shall occur within 10 days of installation. Training may be completed on-site at NIST immediately after installation and demonstration of specifications.

II. GOVERNMENT FURNISHED PROPERTY

No Government Furnished Property will be provided to the Contractor.

III. DELIVERABLES

IV. PERFORMANCE REQUIREMENT SUMMARY

The Contractor shall demonstrate that the Perkins Elmer OPTIMA 8300 Concentric ICP-OES analytical instrument system or Equivalent System that meets all of the standard performance criteria as well as specific criteria listed: Run organic matrices; Aspirate 20% NaCI for one (1) hour without clogging; and FWHM peak resolution.

V. GENERAL INFORMATION

Safety: The Contractor employee shall be responsible for knowing and complying with NIST installation safety prevention regulations (http://www-i.nist.gov/mml/safety/policies/index.htm.) Such regulations include, but are not limited to, general safety, fire prevention, and waste disposal.

Vehicle Registration: All Contractor employees must register their vehicles with the NIST Security Office to gain access to the campus. A valid driver’s license, Government-furnished civilian ID, proof of insurance and current registration must be presented to the NIST Security Office, at which time a NIST vehicle pass will be issued. The pass shall be displayed in accordance with instructions issued by the NIST Security Office. The Contractor employee shall follow NIST procedures for removal and turn-in of the vehicle pass upon termination of services under this contract.