STATEMENT OF WORK

1. Objective/Requirements

This Statement of Work (SOW) establishes the technical requirements, quality standards, and deliverables for the procurement of Back-Illuminated CMOS Image Sensors with Anti-Reflection coating for use in a NASA Do-No-Harm Compact Ultraviolet and Visible Imaging Spectrometer (CUVIS) instrument application. These detectors will operate between 190 nm to 570 nm spectral range, and between -40°C to +40°C.

2. Characteristics, Scope, and Specs The contractor shall supply, test, and deliver six (6) science grade CMOS image sensors with anti-reflection coating (AR) coatings.

The pixel format will be:

o 2000 rows × 1504 columns active pixels o 7 µm × 7 µm pixel size o Four (4) parallel analog output ports

Key performance parameters will be:

o o o o o Quantum Efficiency (QE) to meet design criteria for M48 AR coating as shown in Figure

1 below to within ±1% (the coating shall be optimized for enhanced response at 200 nm) o Back-side illuminated fill factor: ~100%

All devices shall be coated with the anti-reflection (AR) coating optimized by simulation for ultraviolet wavelength response down to 200 nm. Device quantum efficiency shall be measured in the UV spectral range between 400 nm to 1000 nm. QE data for the AR coating shall demonstrate performance between 200 nm to 1000 nm.

All devices shall be provided in the standard ceramic pin grid array (PGA) package with:

o 48.26 mm square package dimensions o 61 active pins per the CIS115 data sheet o Temporary protective window (to be removed for final integration)

Handling shall be performed by qualified personnel following approved procedures for:

o Electrostatic discharge (ESD) protection o Contamination control o Packaging and storage o Shipping container selection

The Contractor shall implement an ESD Control Program per ANSI/ESD S20.20 suitable for protecting CMOS image sensors. All work areas, personnel, and equipment shall be ESD-protected.

The Contractor shall maintain cleanliness levels appropriate for precision optical sensors sensing in the UV-VIS spectral range. Delivered devices shall be packaged in clean, sealed containers to prevent contamination during shipment.

The Contractor shall prove fabrication and packaging in a controlled environment:

o ISO Class 5 (Class 100) cleanroom with carbon filtration o Temperature: 20°C ±2°C, RH: 30-50% o AMC monitoring: QCM or SAW sensors, <1 ng/cm²/hr deposition

The Contractor shall deliver cleanroom certifications, coating transmission analysis reports, materials certs, contamination monitoring logs.

The Contractor for each device shall provide full traceability including:

o Device serial number o Wafer lot number o Test date and results o Coating batch information

The Contractor shall carry out the following functional tests:

o The Contractor shall utilize functional testing and inspection as the primary verification methods. Testing shall be performed at room temperature (293 K ± 5 K) unless otherwise specified.

o Perform Power-On Tests Verify all power supplies can be applied as per Data Sheet specifications Measure power consumption Verify IPIX and IREAD bias currents function correctly o Perform Basic Operability Tests

Verify all 61 pins for continuity and isolation Confirm row and column addressing functions Verify all four (4) output ports are functional Demonstrate pixel readout capability o Perform Imaging Functionality Tests

Capture test images under uniform illumination Verify IMAGESIG and IMAGEREF outputs Confirm correlated double sampling (CDS) operation Demonstrate frame capture at nominal 6.2 MP/s readout rate o Perform Key Performance Parameters Testing

Dark current measurement: Mean dark current at 293 K Readout noise measurement: Mean readout noise with CDS Linearity test: Verify ±3% non-linearity over 10-90% of QLIN Quantum efficiency: Comply with design values shown in this graph:

o Carry our Cosmetic Inspections Dark signal defects:

Photo-response defects: Count pixels with response <80% or >120% of local mean High noise pixels:

Column/row defects: -pixel defects

Acceptance Criteria for CMOS Detectors shall be:

o Operability: >99.99% functional pixels o Dark current median:

o Readout noise median:

o Dark defects: <100 pixels per device o Photo-response defects: <200 pixels per device

Environmental Testing o Given the Do-No-Harm mission classification, no environmental stress testing (thermal cycling, vibration, radiation) is required. Packaged devices shall be shipped as-manufactured following functional testing.

The Contractor shall deliver test reports for all devices including:

o Serial numbers and traceability information o Power-on test results o Imaging functionality verification o Performance parameter measurements o Cosmetic defect maps o Representative test images

For each device, the Contractor shall provide the following documentation:

o Certificate of Conformance o Device Test Report including:

Serial number and traceability data Functional test results Performance measurements Test images o Handling and Storage Guidelines o Packaging Documentation o User Manual o Complete test data o Cosmetic defect maps o Performance characterization plots o Calibration data (if applicable) o As-built configuration

The Contractor shall meet the flowing HANDLING, STORAGE, PACKAGING AND

DELIVERY requirements:

o Each device shall be individually packaged in:

ESD-protective container with appropriate ESD markings Clean, sealed bag to prevent contamination Protective case suitable for shipment External labeling with part number, serial number, and grade o Devices shall be stored in controlled environment:

Temperature: 15-25°C Humidity: <50% RH ESD-protected environment

3. Place of Performance

4. Period of Performance CMOS detectors and all other test reports, certification and documentation will be delivered within 2 months of the award of contract.