SATPC0038580 Tab 04 4 SOW..pdf
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- Attached to
- Maple Leaf SD-100 Optical Probe Station Federal contract opportunity
- Solicitation number
- 80NSSC25905586Q
About this file
This Statement of Work (SOW) details NASA Langley Research Center's requirement for a Maple Leaf SD-100 Optical Probe Station (or equivalent) for the Photonic Integrated Circuit Advanced Research and Development (PICARD) program. The probe station must enable testing of bare photonic integrated circuit (PIC) dies/chips, with specific technical requirements including a motorized fiber optic positioning system with 6 degrees of freedom, a computer-controlled chip positioner with thermal control, top and side view microscope systems with at least 12x magnification and 20MP camera sensors, and comprehensive software for automated chip testing and alignment.
The detailed specifications include provisions for a refurbished or new system with a 12-month hardware warranty, expandability for future electrical probing, precise positioning capabilities (with 5 nm resolution), and a Fotonica Software Suite featuring raster-scan algorithms, coordinate system registration, and a Python API. The probe station will be delivered to Langley Research Center in Hampton, VA, with a performance period of 8-12 weeks after receipt of order. The system's primary purpose is to rapidly test multiple PICs, characterize component performance, measure chip variance, and identify known-good dies to improve packaging yield.
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| File | Type | Posted |
|---|---|---|
| SATPC0038580 Tab 10 RFQ Open Market Template.pdf |
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STATEMENT OF WORK
1. Objective/Requirements
NASA Langley Research Center requires the purchase of (1) Maple Leaf SD-100 Optical Probe Station (or Equivalent) in support of Photonic Integrated Circuit Advanced Research and Development (PICARD) to enable testing of bare PIC dies/chips. The photonic integrated circuit (PIC) probe station should include automated fiber optic positioning to enable optical input/output to the chip, a temperature-controlled and motorized chip stage for holding the chips, microscope systems to inspect the chip and speed up alignment, and software for controlling positioners and enabling automated chip testing. The probe station enables rapid testing of multiple PICs to characterize component performance, measure variance between multiple chips, and identify known-good dies (KGDs) to improve yield during PIC packaging.
2. Characteristics, Scope, and Specs
The probe station must include:
• Probe station may be new or refurbished
• Probe station may include or not include control computer
• Probe station should include at least 12 month warranty on hardware
• Probe station should be expandable/modular to accommodate electrical probing in the future
• Motorized and computer-controlled fiber positioner o 6 degrees of freedom (x/y/z position, x/y/z rotation) o x/y/z position must be motorized with at least 10 mm of travel, and better than 5 nm resolution o At least one of x/y/z rotation must be motorized o Mount for fiber array
• Motorized and computer-controlled chip positioner o At least 4 degrees of freedom (x/y/z rotation and 1 of x/y/z position) o Motorized degree of freedom to be at least +/- 5 deg with 0.1 deg resolution o Thermal control (TEC + temperature sensor) o Option for changing chip/die mount o Vacuum port for holding chip/die
• Top view microscope system o At least 12x magnification o Includes camera sensor (>5 MP) o Includes coaxial illumination o Mounting system to support microscope above chip positioner stage
• Side view microscope system o At least 12x magnification
Side-view Lens System
a) Lens system: 12x magnification (0.6-7x), 1-12 mm FOV (diag): manual fine focus, 20MP sensor
b) XY stages for lens positioning (XY: 25 mm) Motion Control Module
a) Motor controller modules and power supplies
b) Trigger logic (raster scans and sweeps)
c) TEC controller
d) 19" rack-mount chassis
Fotonica Software Suite (GUI version), including:
a) Raster-scan to find first light and fiber-alignment algorithms
b) Coordinate system chip registration and automated device testing
c) Custom-script interface
d) Instrument driver support
e) Python API
Standard Warranty and Support
a) 12-month warranty on hardware (manufacturing defects or workmanship issues)
b) 3-month s/w maintenance, feature updates, and bug fixes
c) 5-hours of post-installation remote support within the first 3 months
3. Place of Performance Langley Research Center 1 Nasa Dr Hampton, VA 23666
4. Period of Performance
8-12 weeks ARO
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