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This is a Salient Characteristics document that establishes minimum technical requirements for a real-time micro-focus X-ray inspection system procurement by the U.S. Army Research Laboratory (ARL). The system is intended for quality inspection of populated printed circuit boards (PCBs), specifically for Ball Grid Array (BGA) solder joint and void analysis following automated pick-and-place placement. The procurement is being conducted as a sole-source purchase order to Glenbrook Technologies, Inc. for their Jewel Box Ultra Compact Real Time X-ray Inspection System under solicitation number W911QX26QA203.

The required system must meet specific minimum technical specifications across 18 key characteristics, including real-time micro-focus X-ray imaging with operator-controlled zoom magnification, adjustable anode voltage (0-80 kV) and current (up to 200 micro-amps), a focal spot size of 10 microns or finer, geometric magnification of at least 500x, optical magnification of at least 1,200x, and a five-axis manipulator with joystick control. The system must accommodate a minimum 12" x 8" board capacity with an X/Y scan area of 5.5" x 9", include an integrated laser locator, support multiple image output formats (.jpg, .tif, .avi), feature self-contained computing with integrated display and wireless connectivity, maintain a compact desktop footprint not exceeding approximately 22"W x 26"D x 27"H, and operate on standard 120V/60Hz facility power. Additionally, the system must be fully shielded and compliant with U.S. radiation safety standards (21 CFR 1020.40) and CE marked. Desired evaluation factors include low-lead/lead-free enclosure design, optional transport/road case, warranty, installation, operator training, and U.S.-based service and support availability.

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SALIENT CHARACTERISTICS

Real-Time Micro-Focus X-Ray Inspection System Purpose: The Government requires a compact, real-time micro-focus X-ray inspection system for quality inspection of populated printed circuit boards (PCBs), including Ball Grid Array (BGA) solder joint and void analysis following automated pick-and-place placement.

The system offered shall meet or exceed all of the following minimum salient characteristics:

#
Characteristic
Minimum Requirement
1
Imaging Type
Real-time, micro-focus X-ray imaging with operator-controlled zoom magnification
2
Anode Voltage
Adjustable, with a range capable of at least 0 to 80 kV
3
Anode Current
Adjustable, capable of at least up to 200 micro-amps
4
Focal Spot Size
10 microns or finer
5
Resolution
10 microns or better (magnification-dependent)
6
Geometric Magnification
At least 500x (variable/adjustable)
7
Optical Magnification
At least 1,200x (adjustable)
8
Field of View
Selectable, providing at least 25 mm and 50 mm options
9
Positioning
Five-axis manipulator with joystick positioning control
10
X/Y Object Travel (Scan Area)
Minimum 5.5" x 9"
11
Maximum Board Accommodation
Minimum 12" x 8" board capacity
12
Sample Locating
Integrated laser locator for precise sample positioning
13
Image Processing Software
Variable frame averaging, contrast adjustment, and on-screen measurement capability
14
Image Output Formats
Static (.jpg and .tif) and video (.avi)
15
Integrated Computing/Display
Self-contained internal computer with integrated display; wireless keyboard/mouse; dual-display capability; Wi-Fi and Bluetooth
16
Footprint / Form Factor
Compact, desktop-capable; nominal exterior dimensions not to exceed approximately 22"W x 26"D x 27¼"H
17
Operating Power
120V/60Hz (and/or 220V/50Hz) standard facility power
18
Radiation Safety / Compliance
Fully shielded enclosure; compliant with applicable U.S. radiation safety standards (e.g., 21 CFR 1020.40 cabinet X-ray system requirements); CE marked or equivalent

Additional / Desired (state as evaluation factors, not pass/fail):

· Low-lead / lead-free enclosure design

· Optional transport/road case for portability

· Warranty, installation, operator training, and U.S.-based service/support availability

File details come from the government source that posted it. Updated .