Requirements-Specs document.pdf

REQUIREMENTS/SPECIFICATIONS DOCUMENT:

TITLE: On-Wafer Probes from DC to 1 THz Requesting Lab: Communications Technology Laboratory

General Statement of Need –

The National Institute of Standards and Technology (NIST)/Communications Technology Laboratory (CTL) need to test nonlinear on-wafer devices to 1 THz. As such, CTL needs on-wafer probes from Formfactor, because only these probes meet the technical specifications.

These specifications include E-field orientation, overtravel, bias-tees, probe pitch, and insertion loss. These WR (WR1, WR1.5, WR2.2, WR3.4, WR4.3, WR5.1, WR6) probes will be used on custom on-wafer station for on-wafer THz electronics. The probe station uses VDI extender heads with a vertical E-field orientation. The station can only control the height of the probe to within about 10 um, so the probe must be able to tolerate 20 um of overtravel. The WR probes should have a bias tee, and where possible standard 25 um pitch (50 um pitch is acceptable for WR6), no more than 10 dB of insertion loss and a return loss no greater than -15 dB. CTL needs to trade-in I110-A-GSG-50 (4 EA), I110-A-GSG-100 (1 EA), I67-A-GSG-100 (3 EA), for a set of I110-AM-GSG-50 (4 EA), I110-AM-GSG-100 (1 EA), I67-AM-GSG-100 (3 EA).

ITEMS and/or ANCILLARY SERVICES –

Item 1: WR6, WR5.1, WR4.3, WR3.4, WR2.2, WR1.5, and WR1.0 Waveguide Probe with bias Ts; QTY: 14 EA

Specifications—Purchase new; T1100-GSG-25-BT (QTY; 2 EACH), T750-GSG-25-BT (QTY:

2 EACH), T500-GSG-25-BT (2 EACH), T330-GSG-25-BT (2 EACH), T260-GSG-25-BT

(QTY: 2 EACH), T220-GSG-25-BT (QTY: 2 EACH), T170-GSG-50-BT (QTY: 2 EACH); must have bias tees; must have service contract; must tolerate 10 um of overtravel; must have less than 15 dB of insertion loss.

Item 2: trade in—I110-A-GSG-50 (QTY: 4 EACH), I110-A-GSG-100 (QTY: 1 EACH), 167-A- GSG-100 (QTY: 3 EACH) for a set of I110-AM-GSG-50 (QTY: 4 EACH), I110-AM-GSG-100

(QTY: 3 EACH)

QTY: 8 EACH