The file's text, extracted by GovTribe without its formatting.
A Statement of Work (SOW) “Laser Screening and Lot Qualification Testing for the Primary Constituent Monitor (PCM) Project” January 14, 2025 NASA Technical Point of Contact:
Emily Rabel NASA Project Manager NASA Johnson Space Center 2101 NASA Parkway Houston, TX 77058 Emily.k.rabel@nasa.gov 281-709-8234
1. INTRODUCTION
This SOW addresses the testing of lasers used to detect oxygen (O2), carbon dioxide (CO2), and water vapor (H2O) in the Habitation and Logistics Outpost (HALO) Primary Constituent Monitor (PCM). HALO is a module within the Gateway architecture and is planned to be crewed during Artemis IV, the first Gateway mission with crew presence in lunar orbit.
HALO requires monitoring of O2, CO2, and H2O. This monitoring is primarily during Crewed activities but PCM will be operating prior to crew ingress and for a period time following crew departure. It is expected PCM will be operational for a maximum of 40 days during each Artemis mission visiting Gateway. The data gathered from PCM will be used in the atmosphere control algorithm to maintain a habitable environment.
The intent of this SOW is to specify the testing required for the O2, CO2, and H2O lasers contained within PCM. Due to the unique nature of laser technology NASA-STD-8739.11 (draft) requires 100% screening of lasers procured for the flight hardware. This screening assures lasers meet the functional and performance requirements imposed on the piece parts. The data collected will be used to select the best performing lasers for the flight hardware. Lasers not utilized in the flight hardware will be either designated as spares or utilized in the lot qualification testing.
In addition to laser screening, this SOW also specifies laser Lot Acceptance Test (LAT, also referred to as Laser Lot Qualification Test) is a series of tests to ensure that the laser lot meets or exceeds requirements. NASA-STD-8739.11 (draft) Table 3 Laser Device Lot Acceptance Test is the base source, though tailoring has been applied.
It is the intent of this SOW to execute the laser screening and laser Lot Acceptance Testing of the following:
| Laser Manufacturer |
| Constituent Detected |
| Manufacturer |
Part Number Procured Quantity
| Nanoplus |
| Oxygen (O2) |
| DFB-076083 |
| 65 |
| Vertilas |
| Water Vapor (H2O) |
| VL-1393-1-SQ-A5 |
| 51 |
| Vertilas |
| Carbon Dioxide (CO2) |
| VL-2003-1-SQ-A5 |
| 51 |
2. GOVERNMENT FURNISHED INFORMATION
The government shall provide the following items to support the execution of this SOW:
| 1 |
| Primary Constituent Monitor (PCM) Laser Source Control Document (SCD), CTSD-DSG-020 |
· Source Control Document
| 2 |
| Laser Allocation Direction |
· Project Memo
| 1 per Laser P/N |
| <10 days from receipt of Laser Screening Data (Section 3.1.2) |
3. REQUIREMENTS
3.1. Task Descriptions
This SOW encompasses several tasks associated with testing of lasers for the PCM. This includes Electro-Optical Performance Test Sequence (Section 3.1.1), Laser Screening Tests (Section 3.1.2), Laser Lot Acceptance Tests (Section 3.1.3), Destructive Physical Analysis (Section 3.1.4), Total Ionizing Dose (Section 3.1.5), and Displacement Damage Dose (Section 3.1.6). Following Laser Screening Tests (Section 3.1.2) a brief (no more than 10 days) pause is expected so NASA and Stakeholders can review the data collected and allocate lasers for subsequent activities. Figure 3.1-1, Figure 3.1-2, and Figure 3.1-3 lays out the flow of activities and allocation for laser for each phase for Nanoplus O2 Laser, Vertilas H2O Laser, and Vertilas CO2 Laser, respectively.
Figure 3.1-1 Nanoplus O2 Laser Distribution
Figure 3.1-2 Vertilas H2O Laser Distribution
Figure 3.1-3 Vertilas CO2 Laser Distribution
3.1.1. Electro-Optical Performance
Table 3.1.1-1 documents the series of tests required for Electro-Optical Performance. These tests will be repeated throughout Laser Screening (section 3.1.2) and Lot Acceptance Testing (3.1.3).
Table 3.1.1-1 Electro-Optical Performance Sequence & Test Method
| Sequence |
| Parameter |
| Method |
| Notes |
| Evaluation Criteria |
| 11 |
| Output Power over ILD |
| Sweep ILD from 0mA to Max Rated ILD |
| TLD = 25°C or nominal operating value |
| <5% variation over testing sequence |
| 21 |
| Laser Diode Voltage over ILD |
| Sweep ILD from 0mA to Max Rated ILD |
| May be combined with test (1) |
| <5% variation over testing sequence |
| 31 |
| Optical Output Power |
| In mW at nominal operating forward current |
| May be obtained from test (1) data |
| <5% variation over testing sequence |
| 41 |
| Threshold Current |
| In mA at 25°C case temperature |
| May be obtained from test (1) data |
| <5% variation over testing sequence |
| 5 |
| AC resistance of Thermo-Electric Cooler |
| In ohms at 25°C case temperature |
<10% variation over testing sequence and within manufacturers specification
| 6 |
| Thermistor Zero-Power Resistance |
| MIL-STD-202, Method 203 |
| In ohms at 25°C reference temperature |
| <3% variation over testing sequence and within manufacturers specification |
1Output power, diode voltage, output power, and threshold current deltas may be calculated based on engineering units, rather than mA and mW, provided the same test configuration and equipment is used to acquire both pre and post burn in data.
3.1.2. Laser Screening
Laser Screening tasks are described in table 3.1.2-1 below.
All lasers (QTY 65 Nanoplus O2, QTY 51 Vertilas H2O, QTY 51 Vertilas CO2) will complete these tests.
Table 3.1.2-1 Laser Screening Overview
| Sequence1 |
| Screening Test |
| Method |
| Notes |
| 6 |
| Electro-Optical Performance |
| Per Table 3.1.1-1 Electro-Optical Performance Sequence & Test Method |
| None. |
| 7 |
| Verify Laser Center Wavelength |
| Per Manufacturer Specifications. |
| None. |
| 8 |
| Physical Dimensions |
| MIL-STD-883, Method 2016 |
| None. |
| 9 |
| Temperature Cycling |
| MIL-STD-883, Method 1010 |
| Unpowered, -40°C to +85°C, 20 cycles. |
| 10 |
| Mechanical Shock |
| MIL-STD-883, Method 2002 |
| Orientation TBD |
| 11 |
| Particle Impact Noise Detection (PIND) |
| MIL-STD-883, Method 2020, Condition A |
| None. |
| 12 |
| Pre-Burn-In Electro-Optical Performance |
| Per Table 3.1.1-1 Electro-Optical Performance Sequence & Test Method |
| None. |
| 13 |
| Burn-In |
| MIL-STD-883, Method 1015, Condition D |
| Tcase = Max Op Temp °C |
ILD = Max Op Current 240hrs
| 14 |
| Post-Burn-In Electro-Optical Performance |
| Per Table 3.1.1-1 Electro-Optical Performance Sequence & Test Method |
| None. |
| 15 |
| Calculate Deltas and Defective Percentage |
| Evaluation criteria per Table 3.1.1-1 Electro-Optical Performance Sequence & Test Method |
| None. |
a. Fine Leak
b. Gross Leak MIL-STD-883, Method 1014
a. Fine Condition - CH or B or A alt.
b. Gross Condition – CH or B3 or C4 Temp limit = +80°C
| 17 |
| Radiographic |
| MIL-STD-883, Method 2012 |
| Two views. |
| 18 |
| External Visual |
| MIL-STD-883, Method 2009 |
| None. |
| 19 |
| Thermistor Insulation Resistance |
| MIL-STD-202, Method 302 |
| None. |
| 20 |
| Thermistor Resistance Temperature Characteristic |
| At 25°C, Tmax , Tmin , three points between Tmin and 25°C, three points between 25°C and Tmax |
| Stabilization time ≥ 10 times the thermal time constant Zero-power resistance at each temperature point. |
Resistance curve to specification within tolerance limits at each temperature point.
1Laser Screening per CTSD-DSG-020 consists of tasks executed at the laser manufacturer (sequence number 1-5) followed by tasks executed at the laser screening facility (tasks 6-20).
3.1.3. Laser Lot Acceptance Test (LAT)
Laser Lot Acceptance Test (LAT) consists of a series of tests performed to accept the laser lot. This includes additional inspections beyond initial screening, environmental tests, and life testing.
A subset of lasers (QTY 22 Nanoplus O2, QTY 11 Vertilas H2O, QTY 11 Vertilas CO2) will complete these tests. Following testing, the used lasers will be returned to NASA; lasers used in LAT will not be used for flight/qual applications.
Lasers allocated to each test will be determined following review of the data collected during Laser Screening (Section 3.1.2); NASA, Stakeholders, and Laser testing facility will participate in the final decision of laser allocation. In the event of a single failure during Subgroup 5 testing prior to 5000 hr, it may be permissible to repeat Subgroup 5 testing on QTY 5 spare lasers; NASA and Stakeholders will be consulted prior to executing this option to confirm that is the desired response to a failure. NOTE: The contractor shall not proceed with this optional service until authorized to do so by the contracting officer via a signed modification.
Table 3.1.3-1 Laser Lot Acceptance Test Sequence
| Sub-group |
| Process |
| Method |
| Quantity |
Qty Nanoplus Quantity Qty Vertilas (each)
Subgroup 2 Testing
| 2 |
| External Visual |
| MIL-STD-883, Method 2009 |
| 22 |
| 11 |
| 2 |
| Electro-Optical Performance |
| Per Table 3.1.1-1 Electro-Optical Performance Sequence & Test Method |
| 22 |
| 11 |
| 2 |
| Random Vibration |
| MIL-STD-883, Method 2026, Condition F |
| 22 |
| 11 |
| 2 |
| Temperature Cycling |
| MIL-STD-883, Method 1010 |
Unpowered, -20°C to +80°C, 100 cycles
| 2 |
| Constan Acceleration or Mechanical Shock |
| MIL-STD-883, Method 2001, 3000g’s |
MIL-STD-883, Method 2002, Condition A, Direction Y1 only
| 2 |
| PIND |
| MIL-STD-883, Method 2020, Condition A |
| 22 |
| 11 |
| 2 |
| Radiographic |
| MIL-STD-883, Method 2012, 2 Views |
| 22 |
| 11 |
a. Fine Leak
b. Gross Leak MIL-STD-883, Method 1014
a. Fine Condition - CH or B or A alt.
b. Gross Condition – CH or B3 or C4
| 2 |
| Electro-Optical Performance |
| Per Table 3.1.1-1 Electro-Optical Performance Sequence & Test Method |
| 22 |
| 11 |
Subgroup 4 Testing
| 4 |
| Low Temperature Storage |
| -20°C, Duration 72 hours |
| 22 |
| 1 |
| 4 |
| Electro-Optical Performance |
| Per Table 3.1.1-1 Electro-Optical Performance Sequence & Test Method |
| 22 |
| 11 |
Subgroup 5 Testing
| 5 |
| Steady State Life Test |
| MIL-STD-883, Method 1005 |
Max operating current (Max operating Tcase – 5)°C Duration 5000 hours
| 5 |
| Electro-Optical Performance |
| Per Table 3.1.1-1 Electro-Optical Performance Sequence & Test Method, every 500 operating hours |
| 22 1 |
| 111 |
1 If there is a single failure in Subgroup 5 testing, a group of 5 previously screened lasers may be retested provided the lasers have not been subjected to other tests in this table.
3.1.4. Destructive Physical Analysis (DPA)
Destructive Physical Analysis will be performed to collect workmanship information on the lasers. DPA can include external examination, radiographic examination, hermetic seal tests, Particle Impact Noise Detection (PIND), internal examination, bond strength, die shear, and material composition by x-ray fluorescent spectrometer. A final list of tests will be proposed by the executing test facility. Following testing, the disassembled lasers will be returned to NASA; lasers used in DPA will not be used for flight/qual applications.
A subset of lasers (QTY 5 Nanoplus O2, QTY 5 Vertilas H2O, QTY 5 Vertilas CO2) will complete these tests. Lasers allocated to each test will be determined following review of the data collected during Laser Screening (Section 3.1.2); NASA, Stakeholders, and Laser testing facility will participate in the final decision of laser allocation.
3.1.5. Total Ionizing Dose (TID)
Total Ionizing Dose will be performed to collect data on each laser part number and its ability to withstand the radiation environment expected throughout the hardware’s lifetime. The test facility and NASA Radiation SMEs will collaborate on the appropriate test dosage prior to executing TID. Following testing, the used lasers will be returned to NASA; lasers used in TID will not be used for flight/qual applications.
A subset of lasers (QTY 6 Nanoplus O2, QTY 6 Vertilas H2O, QTY6 Vertilas CO2) will complete these tests. Laser allocated to each test will be determined following review of the data collected during Laser Screening (Section 3.1.2); NASA, Stakeholders, and Laser testing facility will participate in the final decision of laser allocation.
3.1.6. Displacement Damage Dose (DDD)
Displacement Damage Dose will be performed to collect data on each laser part number and its ability to withstand the radiation environment expected throughout the hardware’s lifetime. The test facility and NASA Radiation SMEs will collaborate on the appropriate test dosage prior to executing DDD. Following testing, the used lasers will be returned to NASA; lasers used in DDD will not be used for flight/qual applications.
A subset of lasers (QTY 6 Nanoplus O2, QTY 6 Vertilas H2O, QTY6 Vertilas CO2) will complete these tests. Laser allocated to each test will be determined following review of the data collected during Laser Screening (Section 3.1.2); NASA, Stakeholders, and Laser testing facility will participate in the final decision of laser allocation.
3.2. Description of Deliverables
The Test Facility shall deliver data as described below.
Table 3.2-1 Data Deliverables
| 1 |
| Destructive Physical Analysis (DPA) proposal for NASA review/concurrence |
| 1 |
| 30 days ARO |
| 2 |
| Total Ionizing Dose (TID) proposal for NASA review/concurrence |
| 1 |
| 30 days ARO |
| 3 |
| Displaced Damage Dose (DDD) proposal for NASA review/concurrence |
| 1 |
| 30 days ARO |
| 4 |
| Test Data – Following Laser Screening (Section 3.1.2) |
| 1 report per laser tested |
| See Note 1 |
NLT 10 days after completion of testing
| 5 |
| Test Data – Following Laser Acceptance Testing (Section 3.1.3) |
| 1 report per laser tested |
| See Note 1 |
NLT 10 days after completion of testing
| 6 |
| Test Status – Status on Laser Acceptance Testing (Section 3.1.3) Subgroup 5. |
| A/R |
| Bi-weekly while Subgroup 5 5000 hr test is occurring |
| 7 |
| Test Data – Following Destructive Physical Analysis (Section 3.1.4) |
| 1 report per laser tested |
| 10 days after completion of testing |
| 8 |
| Test Data – Following Total Ionizing Dose (Section 3.1.5) |
| 1 report per laser tested |
| 10 days after completion of testing |
| 9 |
| Test Data – Following Displaced Damage Dose (Section 3.1.6) |
| 1 report per laser tested |
| 10 days after completion of testing |
1 Depending on execution of testing, it is acceptable for this data to be supplied piecemeal or as one complete package. This could include delivery of data as batches of lasers are complete, testing on a single part number is complete, or all laser screening is complete. The first two scenarios are preferred.
3.3. Schedule
Key Schedule Assumptions are shown in Table 3.3-1 (Nanoplus O2), Table 3.3-2 (Vertilas H2O), and Table 3.3-3 (Vertilas CO2) below. Each Laser is reflected individually to account for potential delays of one laser vender or laser type not holding up the others.
Table 3.3-1 Nanoplus O2 Schedule
| Task |
| Duration |
| Estimated Date |
| Delivery of Lasers to NASA |
| -- |
| 5/20/25 |
| Receipt of Lasers at Test Facility |
| -- |
| 5/27/25 |
| Laser Screening (Section 3.1.2) |
| 28 wks |
| 12/16/25 |
| Down selection (includes 2 wks for test facility to provide data and 2 wks for determination of allocation; if the data is received sooner, this can be adjusted accordingly) |
| 2 wks + 2 wks |
| 1/27/25 |
| Lot Acceptance Testing (Section 3.1.1) |
| 41 wks |
| 11/10/26 |
| Destructive Physical Analysis (Section 3.1.4) |
| 4 wks |
| NLT 2/24/261 |
| Total Ionizing Dose (Section 3.1.5) |
| 4 wks |
| NLT 2/24/261 |
| Displaced Damage Dose (Section 3.1.6) |
| 2 wks |
| NLT 2/24/261 |
1Due to Lot Acceptance Testing (Section 3.1.1, Destructive Physical Analysis (Section 3.1.4), Total Ionizing Dose (Section 3.1.5), and Displaced Damage Dose (Section 3.1.6) occurring in parallel testing for DPA, TID, and DDD can occur at any point prior to completion of Lot Acceptance Testing.
Table 3.3-2 Vertilas H2O Schedule
| Task |
| Duration |
| Estimated Date |
| Delivery of Lasers to NASA |
| -- |
| 5/8/25 |
| Receipt of Lasers at Test Facility |
| -- |
| 5/15/25 |
| Laser Screening (Section 3.1.2) |
| 28 wks |
| 12/4/25 |
| Down selection (includes 2 wks for test facility to provide data and 2 wks for determination of allocation; if the data is received sooner, this can be adjusted accordingly) |
| 2 wks + 2 wks |
| 1/15/25 |
| Lot Acceptance Testing (Section 3.1.1) |
| 41 wks |
| 10/29/26 |
| Destructive Physical Analysis (Section 3.1.4) |
| 4 wks |
| NLT 10/29/261 |
| Total Ionizing Dose (Section 3.1.5) |
| 4 wks |
| NLT 10/29/261 |
| Displaced Damage Dose (Section 3.1.6) |
| 2 wks |
| NLT 10/29/261 |
1Due to Lot Acceptance Testing (Section 3.1.1, Destructive Physical Analysis (Section 3.1.4), Total Ionizing Dose (Section 3.1.5), and Displaced Damage Dose (Section 3.1.6) occurring in parallel testing for DPA, TID, and DDD can occur at any point prior to completion of Lot Acceptance Testing.
Table 3.3-3 Vertilas CO2 Schedule
| Task |
| Duration |
| Estimated Date |
| Delivery of Lasers to NASA |
| -- |
| 5/8/25 |
| Receipt of Lasers at Test Facility |
| -- |
| 5/15/25 |
| Laser Screening (Section 3.1.2) |
| 28 wks |
| 12/4/25 |
| Down selection (includes 2 wks for test facility to provide data and 2 wks for determination of allocation; if the data is received sooner, this can be adjusted accordingly) |
| 2 wks + 2 wks |
| 1/15/25 |
| Lot Acceptance Testing (Section 3.1.1) |
| 41 wks |
| 10/29/26 |
| Destructive Physical Analysis (Section 3.1.4) |
| 4 wks |
| NLT 10/29/261 |
| Total Ionizing Dose (Section 3.1.5) |
| 4 wks |
| NLT 10/29/261 |
| Displaced Damage Dose (Section 3.1.6) |
| 2 wks |
| NLT 10/29/261 |
1Due to Lot Acceptance Testing (Section 3.1.1, Destructive Physical Analysis (Section 3.1.4), Total Ionizing Dose (Section 3.1.5), and Displaced Damage Dose (Section 3.1.6) occurring in parallel testing for DPA, TID, and DDD can occur at any point prior to completion of Lot Acceptance Testing.
3.4. Applicable Documents and Drawings
The Test Facility shall follow the following applicable documents:
| Document Number |
| Document Name |
| Revision/Date |
| CTSD-DSG-020 |
| Primary Constituent Monitor (PCM) Laser Source Control Document (SCD) |
| Draft |
February XX, 2025
| MIL-PRF-19500 |
| General Specification for Semiconductors Devices |
| R |
July 24, 2021
| MIL-STD-883 |
| Test Method Standard Microcircuits |
| L |
September 16, 2019
| MIL-STD-202 |
| Test Method Standard Electronic and Electrical Component Parts |
| H |
April 18, 2015
| GSFC-S-311-M-70D |
| Specification for the Performance of Destructive Physical Analysis (DPA) for Electrical, Electronic, and Electromechanical (EEE) Parts |
| D |
June 29, 2015
4. ACRONYMS
| AMS | Atmospheric Monitoring System |
| DDD | Displacement Damage Dose |
| DFB | Distributed Feedback Lasers |
| DPA | Destructive Physical Analysis |
| ECLSS | Environmental Control and Life Support System |
| GFE | Government Furnished Equipment |
| HALO | Habitation and Logistics Outpost |
| JSC | Johnson Space Center |
| LAT | Lot Acceptance Test |
| NASA | National Aeronautics and Space Administration |
| NTC | Negative Temperature Coefficient |
| PCM | Primary Constituent Monitor |
| PIND | Particle Impact Noise Detection |
| SCD | Source Control Document |
| TDLS | Tunable Laser Diode Spectroscopy |
| TDLAS | Tunable Diode Laser Absorption Spectroscopy |
| TEC | Thermoelectric Cooler |
| TID | Total Ionizing Dose |
| TO | Transistor Outline |
| VCSEL | Vertical Cavity Surface Emitting Laser |
image1.png image2.png