PCM Laser Testing SOW 28 Feb 2025.docx

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Laser Screening and Lot Qualification Testing
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This is a Statement of Work (SOW) for laser screening and lot qualification testing services required by NASA Johnson Space Center, specifically for the Primary Constituent Monitor (PCM) Project on the Habitation and Logistics Outpost (HALO) module of the Gateway lunar architecture. The testing requirements cover three specific laser types: Nanoplus DFB-076083 for oxygen detection (65 units), Vertilas VL-1393-1-SQ-A5 for water vapor detection (51 units), and Vertilas VL-2003-1-SQ-A5 for carbon dioxide detection (51 units).

The SOW outlines requirements for 100% screening of lasers for flight hardware per NASA-STD-8739.11 (draft) and includes Lot Acceptance Testing (LAT) to ensure compliance with specifications. The PCM system will operate for up to 40 days during each Artemis mission to Gateway, monitoring atmospheric conditions before, during, and after crew presence. The technical point of contact is Emily Rabel at NASA Johnson Space Center in Houston, TX. The government will provide two key documents: the PCM Laser Source Control Document and Laser Allocation Direction within one month of award.

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A Statement of Work (SOW) “Laser Screening and Lot Qualification Testing for the Primary Constituent Monitor (PCM) Project” January 14, 2025 NASA Technical Point of Contact:

Emily Rabel NASA Project Manager NASA Johnson Space Center 2101 NASA Parkway Houston, TX 77058 Emily.k.rabel@nasa.gov 281-709-8234

1. INTRODUCTION

This SOW addresses the testing of lasers used to detect oxygen (O2), carbon dioxide (CO2), and water vapor (H2O) in the Habitation and Logistics Outpost (HALO) Primary Constituent Monitor (PCM). HALO is a module within the Gateway architecture and is planned to be crewed during Artemis IV, the first Gateway mission with crew presence in lunar orbit.

HALO requires monitoring of O2, CO2, and H2O. This monitoring is primarily during Crewed activities but PCM will be operating prior to crew ingress and for a period time following crew departure. It is expected PCM will be operational for a maximum of 40 days during each Artemis mission visiting Gateway. The data gathered from PCM will be used in the atmosphere control algorithm to maintain a habitable environment.

The intent of this SOW is to specify the testing required for the O2, CO2, and H2O lasers contained within PCM. Due to the unique nature of laser technology NASA-STD-8739.11 (draft) requires 100% screening of lasers procured for the flight hardware. This screening assures lasers meet the functional and performance requirements imposed on the piece parts. The data collected will be used to select the best performing lasers for the flight hardware. Lasers not utilized in the flight hardware will be either designated as spares or utilized in the lot qualification testing.

In addition to laser screening, this SOW also specifies laser Lot Acceptance Test (LAT, also referred to as Laser Lot Qualification Test) is a series of tests to ensure that the laser lot meets or exceeds requirements. NASA-STD-8739.11 (draft) Table 3 Laser Device Lot Acceptance Test is the base source, though tailoring has been applied.

It is the intent of this SOW to execute the laser screening and laser Lot Acceptance Testing of the following:

Laser Manufacturer
Constituent Detected
Manufacturer

Part Number Procured Quantity

Nanoplus
Oxygen (O2)
DFB-076083
65
Vertilas
Water Vapor (H2O)
VL-1393-1-SQ-A5
51
Vertilas
Carbon Dioxide (CO2)
VL-2003-1-SQ-A5
51

2. GOVERNMENT FURNISHED INFORMATION

The government shall provide the following items to support the execution of this SOW:

No.
Title
Qty
Due
1
Primary Constituent Monitor (PCM) Laser Source Control Document (SCD), CTSD-DSG-020

· Source Control Document

1
< 1 month ARO
2
Laser Allocation Direction

· Project Memo

1 per Laser P/N
<10 days from receipt of Laser Screening Data (Section 3.1.2)

3. REQUIREMENTS

3.1. Task Descriptions

This SOW encompasses several tasks associated with testing of lasers for the PCM. This includes Electro-Optical Performance Test Sequence (Section 3.1.1), Laser Screening Tests (Section 3.1.2), Laser Lot Acceptance Tests (Section 3.1.3), Destructive Physical Analysis (Section 3.1.4), Total Ionizing Dose (Section 3.1.5), and Displacement Damage Dose (Section 3.1.6). Following Laser Screening Tests (Section 3.1.2) a brief (no more than 10 days) pause is expected so NASA and Stakeholders can review the data collected and allocate lasers for subsequent activities. Figure 3.1-1, Figure 3.1-2, and Figure 3.1-3 lays out the flow of activities and allocation for laser for each phase for Nanoplus O2 Laser, Vertilas H2O Laser, and Vertilas CO2 Laser, respectively.

Figure 3.1-1 Nanoplus O2 Laser Distribution

Figure 3.1-2 Vertilas H2O Laser Distribution

Figure 3.1-3 Vertilas CO2 Laser Distribution

3.1.1. Electro-Optical Performance

Table 3.1.1-1 documents the series of tests required for Electro-Optical Performance. These tests will be repeated throughout Laser Screening (section 3.1.2) and Lot Acceptance Testing (3.1.3).

Table 3.1.1-1 Electro-Optical Performance Sequence & Test Method

Sequence
Parameter
Method
Notes
Evaluation Criteria
11
Output Power over ILD
Sweep ILD from 0mA to Max Rated ILD
TLD = 25°C or nominal operating value
<5% variation over testing sequence
21
Laser Diode Voltage over ILD
Sweep ILD from 0mA to Max Rated ILD
May be combined with test (1)
<5% variation over testing sequence
31
Optical Output Power
In mW at nominal operating forward current
May be obtained from test (1) data
<5% variation over testing sequence
41
Threshold Current
In mA at 25°C case temperature
May be obtained from test (1) data
<5% variation over testing sequence
5
AC resistance of Thermo-Electric Cooler
In ohms at 25°C case temperature

<10% variation over testing sequence and within manufacturers specification

6
Thermistor Zero-Power Resistance
MIL-STD-202, Method 203
In ohms at 25°C reference temperature
<3% variation over testing sequence and within manufacturers specification

1Output power, diode voltage, output power, and threshold current deltas may be calculated based on engineering units, rather than mA and mW, provided the same test configuration and equipment is used to acquire both pre and post burn in data.

3.1.2. Laser Screening

Laser Screening tasks are described in table 3.1.2-1 below.

All lasers (QTY 65 Nanoplus O2, QTY 51 Vertilas H2O, QTY 51 Vertilas CO2) will complete these tests.

Table 3.1.2-1 Laser Screening Overview

Sequence1
Screening Test
Method
Notes
6
Electro-Optical Performance
Per Table 3.1.1-1 Electro-Optical Performance Sequence & Test Method
None.
7
Verify Laser Center Wavelength
Per Manufacturer Specifications.
None.
8
Physical Dimensions
MIL-STD-883, Method 2016
None.
9
Temperature Cycling
MIL-STD-883, Method 1010
Unpowered, -40°C to +85°C, 20 cycles.
10
Mechanical Shock
MIL-STD-883, Method 2002
Orientation TBD
11
Particle Impact Noise Detection (PIND)
MIL-STD-883, Method 2020, Condition A
None.
12
Pre-Burn-In Electro-Optical Performance
Per Table 3.1.1-1 Electro-Optical Performance Sequence & Test Method
None.
13
Burn-In
MIL-STD-883, Method 1015, Condition D
Tcase = Max Op Temp °C

ILD = Max Op Current 240hrs

14
Post-Burn-In Electro-Optical Performance
Per Table 3.1.1-1 Electro-Optical Performance Sequence & Test Method
None.
15
Calculate Deltas and Defective Percentage
Evaluation criteria per Table 3.1.1-1 Electro-Optical Performance Sequence & Test Method
None.
16
Hermetic Seal

a. Fine Leak

b. Gross Leak MIL-STD-883, Method 1014

a. Fine Condition - CH or B or A alt.

b. Gross Condition – CH or B3 or C4 Temp limit = +80°C

17
Radiographic
MIL-STD-883, Method 2012
Two views.
18
External Visual
MIL-STD-883, Method 2009
None.
19
Thermistor Insulation Resistance
MIL-STD-202, Method 302
None.
20
Thermistor Resistance Temperature Characteristic
At 25°C, Tmax , Tmin , three points between Tmin and 25°C, three points between 25°C and Tmax
Stabilization time ≥ 10 times the thermal time constant Zero-power resistance at each temperature point.

Resistance curve to specification within tolerance limits at each temperature point.

1Laser Screening per CTSD-DSG-020 consists of tasks executed at the laser manufacturer (sequence number 1-5) followed by tasks executed at the laser screening facility (tasks 6-20).

3.1.3. Laser Lot Acceptance Test (LAT)

Laser Lot Acceptance Test (LAT) consists of a series of tests performed to accept the laser lot. This includes additional inspections beyond initial screening, environmental tests, and life testing.

A subset of lasers (QTY 22 Nanoplus O2, QTY 11 Vertilas H2O, QTY 11 Vertilas CO2) will complete these tests. Following testing, the used lasers will be returned to NASA; lasers used in LAT will not be used for flight/qual applications.

Lasers allocated to each test will be determined following review of the data collected during Laser Screening (Section 3.1.2); NASA, Stakeholders, and Laser testing facility will participate in the final decision of laser allocation. In the event of a single failure during Subgroup 5 testing prior to 5000 hr, it may be permissible to repeat Subgroup 5 testing on QTY 5 spare lasers; NASA and Stakeholders will be consulted prior to executing this option to confirm that is the desired response to a failure. NOTE: The contractor shall not proceed with this optional service until authorized to do so by the contracting officer via a signed modification.

Table 3.1.3-1 Laser Lot Acceptance Test Sequence

Sub-group
Process
Method
Quantity

Qty Nanoplus Quantity Qty Vertilas (each)

Subgroup 2 Testing

2
External Visual
MIL-STD-883, Method 2009
22
11
2
Electro-Optical Performance
Per Table 3.1.1-1 Electro-Optical Performance Sequence & Test Method
22
11
2
Random Vibration
MIL-STD-883, Method 2026, Condition F
22
11
2
Temperature Cycling
MIL-STD-883, Method 1010

Unpowered, -20°C to +80°C, 100 cycles

22
11
2
Constan Acceleration or Mechanical Shock
MIL-STD-883, Method 2001, 3000g’s

MIL-STD-883, Method 2002, Condition A, Direction Y1 only

22
11
2
PIND
MIL-STD-883, Method 2020, Condition A
22
11
2
Radiographic
MIL-STD-883, Method 2012, 2 Views
22
11
2
Hermetic Seal

a. Fine Leak

b. Gross Leak MIL-STD-883, Method 1014

a. Fine Condition - CH or B or A alt.

b. Gross Condition – CH or B3 or C4

22
11
2
Electro-Optical Performance
Per Table 3.1.1-1 Electro-Optical Performance Sequence & Test Method
22
11

Subgroup 4 Testing

4
Low Temperature Storage
-20°C, Duration 72 hours
22
1
4
Electro-Optical Performance
Per Table 3.1.1-1 Electro-Optical Performance Sequence & Test Method
22
11

Subgroup 5 Testing

5
Steady State Life Test
MIL-STD-883, Method 1005

Max operating current (Max operating Tcase – 5)°C Duration 5000 hours

221
111
5
Electro-Optical Performance
Per Table 3.1.1-1 Electro-Optical Performance Sequence & Test Method, every 500 operating hours
22 1
111

1 If there is a single failure in Subgroup 5 testing, a group of 5 previously screened lasers may be retested provided the lasers have not been subjected to other tests in this table.

3.1.4. Destructive Physical Analysis (DPA)

Destructive Physical Analysis will be performed to collect workmanship information on the lasers. DPA can include external examination, radiographic examination, hermetic seal tests, Particle Impact Noise Detection (PIND), internal examination, bond strength, die shear, and material composition by x-ray fluorescent spectrometer. A final list of tests will be proposed by the executing test facility. Following testing, the disassembled lasers will be returned to NASA; lasers used in DPA will not be used for flight/qual applications.

A subset of lasers (QTY 5 Nanoplus O2, QTY 5 Vertilas H2O, QTY 5 Vertilas CO2) will complete these tests. Lasers allocated to each test will be determined following review of the data collected during Laser Screening (Section 3.1.2); NASA, Stakeholders, and Laser testing facility will participate in the final decision of laser allocation.

3.1.5. Total Ionizing Dose (TID)

Total Ionizing Dose will be performed to collect data on each laser part number and its ability to withstand the radiation environment expected throughout the hardware’s lifetime. The test facility and NASA Radiation SMEs will collaborate on the appropriate test dosage prior to executing TID. Following testing, the used lasers will be returned to NASA; lasers used in TID will not be used for flight/qual applications.

A subset of lasers (QTY 6 Nanoplus O2, QTY 6 Vertilas H2O, QTY6 Vertilas CO2) will complete these tests. Laser allocated to each test will be determined following review of the data collected during Laser Screening (Section 3.1.2); NASA, Stakeholders, and Laser testing facility will participate in the final decision of laser allocation.

3.1.6. Displacement Damage Dose (DDD)

Displacement Damage Dose will be performed to collect data on each laser part number and its ability to withstand the radiation environment expected throughout the hardware’s lifetime. The test facility and NASA Radiation SMEs will collaborate on the appropriate test dosage prior to executing DDD. Following testing, the used lasers will be returned to NASA; lasers used in DDD will not be used for flight/qual applications.

A subset of lasers (QTY 6 Nanoplus O2, QTY 6 Vertilas H2O, QTY6 Vertilas CO2) will complete these tests. Laser allocated to each test will be determined following review of the data collected during Laser Screening (Section 3.1.2); NASA, Stakeholders, and Laser testing facility will participate in the final decision of laser allocation.

3.2. Description of Deliverables

The Test Facility shall deliver data as described below.

Table 3.2-1 Data Deliverables

No.
Title
Qty
Due
1
Destructive Physical Analysis (DPA) proposal for NASA review/concurrence
1
30 days ARO
2
Total Ionizing Dose (TID) proposal for NASA review/concurrence
1
30 days ARO
3
Displaced Damage Dose (DDD) proposal for NASA review/concurrence
1
30 days ARO
4
Test Data – Following Laser Screening (Section 3.1.2)
1 report per laser tested
See Note 1

NLT 10 days after completion of testing

5
Test Data – Following Laser Acceptance Testing (Section 3.1.3)
1 report per laser tested
See Note 1

NLT 10 days after completion of testing

6
Test Status – Status on Laser Acceptance Testing (Section 3.1.3) Subgroup 5.
A/R
Bi-weekly while Subgroup 5 5000 hr test is occurring
7
Test Data – Following Destructive Physical Analysis (Section 3.1.4)
1 report per laser tested
10 days after completion of testing
8
Test Data – Following Total Ionizing Dose (Section 3.1.5)
1 report per laser tested
10 days after completion of testing
9
Test Data – Following Displaced Damage Dose (Section 3.1.6)
1 report per laser tested
10 days after completion of testing

1 Depending on execution of testing, it is acceptable for this data to be supplied piecemeal or as one complete package. This could include delivery of data as batches of lasers are complete, testing on a single part number is complete, or all laser screening is complete. The first two scenarios are preferred.

3.3. Schedule

Key Schedule Assumptions are shown in Table 3.3-1 (Nanoplus O2), Table 3.3-2 (Vertilas H2O), and Table 3.3-3 (Vertilas CO2) below. Each Laser is reflected individually to account for potential delays of one laser vender or laser type not holding up the others.

Table 3.3-1 Nanoplus O2 Schedule

Task
Duration
Estimated Date
Delivery of Lasers to NASA
--
5/20/25
Receipt of Lasers at Test Facility
--
5/27/25
Laser Screening (Section 3.1.2)
28 wks
12/16/25
Down selection (includes 2 wks for test facility to provide data and 2 wks for determination of allocation; if the data is received sooner, this can be adjusted accordingly)
2 wks + 2 wks
1/27/25
Lot Acceptance Testing (Section 3.1.1)
41 wks
11/10/26
Destructive Physical Analysis (Section 3.1.4)
4 wks
NLT 2/24/261
Total Ionizing Dose (Section 3.1.5)
4 wks
NLT 2/24/261
Displaced Damage Dose (Section 3.1.6)
2 wks
NLT 2/24/261

1Due to Lot Acceptance Testing (Section 3.1.1, Destructive Physical Analysis (Section 3.1.4), Total Ionizing Dose (Section 3.1.5), and Displaced Damage Dose (Section 3.1.6) occurring in parallel testing for DPA, TID, and DDD can occur at any point prior to completion of Lot Acceptance Testing.

Table 3.3-2 Vertilas H2O Schedule

Task
Duration
Estimated Date
Delivery of Lasers to NASA
--
5/8/25
Receipt of Lasers at Test Facility
--
5/15/25
Laser Screening (Section 3.1.2)
28 wks
12/4/25
Down selection (includes 2 wks for test facility to provide data and 2 wks for determination of allocation; if the data is received sooner, this can be adjusted accordingly)
2 wks + 2 wks
1/15/25
Lot Acceptance Testing (Section 3.1.1)
41 wks
10/29/26
Destructive Physical Analysis (Section 3.1.4)
4 wks
NLT 10/29/261
Total Ionizing Dose (Section 3.1.5)
4 wks
NLT 10/29/261
Displaced Damage Dose (Section 3.1.6)
2 wks
NLT 10/29/261

1Due to Lot Acceptance Testing (Section 3.1.1, Destructive Physical Analysis (Section 3.1.4), Total Ionizing Dose (Section 3.1.5), and Displaced Damage Dose (Section 3.1.6) occurring in parallel testing for DPA, TID, and DDD can occur at any point prior to completion of Lot Acceptance Testing.

Table 3.3-3 Vertilas CO2 Schedule

Task
Duration
Estimated Date
Delivery of Lasers to NASA
--
5/8/25
Receipt of Lasers at Test Facility
--
5/15/25
Laser Screening (Section 3.1.2)
28 wks
12/4/25
Down selection (includes 2 wks for test facility to provide data and 2 wks for determination of allocation; if the data is received sooner, this can be adjusted accordingly)
2 wks + 2 wks
1/15/25
Lot Acceptance Testing (Section 3.1.1)
41 wks
10/29/26
Destructive Physical Analysis (Section 3.1.4)
4 wks
NLT 10/29/261
Total Ionizing Dose (Section 3.1.5)
4 wks
NLT 10/29/261
Displaced Damage Dose (Section 3.1.6)
2 wks
NLT 10/29/261

1Due to Lot Acceptance Testing (Section 3.1.1, Destructive Physical Analysis (Section 3.1.4), Total Ionizing Dose (Section 3.1.5), and Displaced Damage Dose (Section 3.1.6) occurring in parallel testing for DPA, TID, and DDD can occur at any point prior to completion of Lot Acceptance Testing.

3.4. Applicable Documents and Drawings

The Test Facility shall follow the following applicable documents:

Document Number
Document Name
Revision/Date
CTSD-DSG-020
Primary Constituent Monitor (PCM) Laser Source Control Document (SCD)
Draft

February XX, 2025

MIL-PRF-19500
General Specification for Semiconductors Devices
R

July 24, 2021

MIL-STD-883
Test Method Standard Microcircuits
L

September 16, 2019

MIL-STD-202
Test Method Standard Electronic and Electrical Component Parts
H

April 18, 2015

GSFC-S-311-M-70D
Specification for the Performance of Destructive Physical Analysis (DPA) for Electrical, Electronic, and Electromechanical (EEE) Parts
D

June 29, 2015

4. ACRONYMS

AMSAtmospheric Monitoring System
DDDDisplacement Damage Dose
DFBDistributed Feedback Lasers
DPADestructive Physical Analysis
ECLSSEnvironmental Control and Life Support System
GFEGovernment Furnished Equipment
HALOHabitation and Logistics Outpost
JSCJohnson Space Center
LATLot Acceptance Test
NASANational Aeronautics and Space Administration
NTCNegative Temperature Coefficient
PCMPrimary Constituent Monitor
PINDParticle Impact Noise Detection
SCDSource Control Document
TDLSTunable Laser Diode Spectroscopy
TDLASTunable Diode Laser Absorption Spectroscopy
TECThermoelectric Cooler
TIDTotal Ionizing Dose
TOTransistor Outline
VCSELVertical Cavity Surface Emitting Laser

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