NOI Attachment 1 - NIST JEOL Equipmetn.docx
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- Solicitation number
- NIST-NOI-20-01248
About this file
This notice of intent is for a sole source contract to provide maintenance and repair services for nine scanning electron microscopes, transmission electron microscopes, and e-beam lithography tools manufactured by Japan Electron Optics Laboratory (JEOL) and used by multiple directorates at the National Institute of Standards and Technology sites in Gaithersburg, Maryland and Boulder, Colorado. The proposed acquisition is for a one-year base period of maintenance/repair/support for all items, with four one-year option periods. Covered expenses include all parts, labor, travel, and per diem. Responses to identify capability to perform the work are due by April 6, 2020. The North American Industry Classification System code for this is 334516.
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Text version
NIST Operating Unit Name
| Instrument Description |
| Model Number |
| Serial Number |
| Covered Product Descriptions |
| NIST Campus |
| Building No. |
| PML/683 |
| Field emission Scanning Electron Microscope (SEM) |
| JSM-7100FT/LV |
| SM01000137 |
HB26832
JSM-7100F FESEM
SM-73012TMP TURBO MOLECULAR PUMP 803080212
SM-71480 5 AXIS MTR DRIVE STAGE TYPE 1A 803034784
SM-54200TTL TTL SYSTEM 372773 803067836
SM-53210RLV RETRACTABLE LV SYSTEM 2 803077246
SM-Z08281TBEI/S SHORT WD RETRACTABLE BE UNIT
SM-74240RTED TRANSMISSION ELECTRON UNIT 356549
SM-54210USD UPPER SE DETECTOR 803067844
SCROLL PUMP EDWARDS NXDS15I A73701983
WATER RECIRCULATOR RO33AHN2R2SK1
7000F CHAMBERSCOPE PCIE CARD PIP CC-A0120-008-PCIE
JUS-FEGBB,BATTERY BACKUP - 96621REV.F
SM-54110LVSED LOW VAC SED 803076291
SCROLL PUMP EDWARDS NXDS15I A73701983
SM-77371PCE COMPUTER ENGLISH
PCD BEAM BLANKER 100V FEG COLUMNS FE-SEM 904-00000, AMT Products are covered by "Return to depot repair."
| Gaithersburg |
| 216/D109 |
| PML/680 |
| E-beam lithography system |
| JBX 6300-FS |
| EB13500710 |
| BX 6300-FS E-beam lithography system |
| Gaithersburg |
| 216/G107 |
| PML/680 |
| E-beam lithography system |
| JBX 6300-FS |
| SB13510008 |
| JBX-6300FS E- BEAM LITHOGRAPHY SYSTEM 353515 |
BX-61090ALD AUTO LOADER 353540
| Gaithersburg |
| 215/A101 |
| EL 731 |
| Field emission SEM |
| 7600F |
| SM17610023 |
HB22578
116043
JSM-7600F
SM-74100 RETRACTABLE INLENS BE UNIT 345539
SM-36120 PROBE CURRENT UNIT
JUS-FEGBB,BATTERY BACKUP – 96621
SM-77350PCE PERSONAL COMPUTER ENGLISH 371734
SM-74260LABE LOW ANGLE BE UNIT 361577
WATER RECIRCULATOR,WATER COOLED,RO33ACHN2R2SK1
RETRACTABLE STEM UNIT
GW IR CHAMBERSCOPE DESIGNATED PORT T43J-7600F-PIP
SM-71500 5 AXIS MOTOR DRIVE STAGE TYPE3 345555
| Gaithersburg |
| 226/B229 |
MML/647[footnoteRef:1] [1: NIST acknowledges that this instrument is approximately 35 years old, and that at some point they may be considered legacy instruments, wherein parts may no longer be available, rendering repairs and service difficult or impossible.]
| Transmission Electron Microscope (TEM) |
| JEM-2000FXII |
| EM133020-21 |
HB16386
JEM-2000FXII TEM
EM-SEG20 SIED ENTRY GONIOMETER
R175HN2R4SK8 Haskris water recirculator
| Boulder |
| 2/1061 |
| MML/642 |
| TEM |
| JEM-3010 |
| SM130008-013 |
| JEM-3010 TEM |
EM-FLC40 FREE LENS CONTROL UNIT
EM-34010 – SCANNING IMAGE OBSERVATION DEVICE
EM-34070 BACK SCATTERED ELECTRON IMAGE UNIT
SEG SIDE ENTRY GONIOMETER,FOR 2010,3010,1220,1210
WATER RECIRCULATOR, WATER COOLED
| Gaithersburg |
| 223/A132 |
| MML/642 |
| Field emission SEM |
| JSM-7100 |
| SM101000-064 |
HB25682
-7100F FESEM 75527 803071060
(2) JU2005801 PUMP, XDS-10 DRYVAC SCROLL,1-200V,1 PHASE, A72601904
JU2013785 7000F CHAMBERSCOPE PCIE CARD PIP CC-A0120-008-PCIE
JU2009153 WATER RECIRCULATOR,
RO33ACHN2R2SK1
JU2012856 SM-77370PCE PERSONAL COMPUTER ENGLISH 374369
293601 SM-36120 PROBE CURRENT UNIT
P13228C JUS-FEGBB, BATTERY BACKUP - 96621REV C
SM-54200TTL TTL SYSTEM 372773 803067836 UED
JU2013565 SM-53210RLV RETRACTABLE LV SYSTEM 2 803077246
JU2008110 SM-74240RTED TRANSMISSION ELECTRON UNIT 356549
JU2014143 UPS, 10KVA ABCDEF10000-22 22100-02R
5 AXIS STAGE
ABSORBED CURRENT METER
| Gaithersburg |
| 223/B133 |
| PML/686*2 |
| Aberration corrected scanning transmission electron microscope |
| JEM-ARM200F |
| EM171000052 |
HB239319
JEM-ARM200F 364819 TEM, ASID Scanning Device, ASID-IAU Image Acquisition Unit for ASID, FLC- Free Lens Control, SEG- Side Entry Goniometer
JUS_FEGBB ,BATTERY BACKUP 96621
HASKRIS WATER RECIRCULATOR R175CHN2R4SK9
EM-20760SCS2U UHR STEM CS CORRECTOR
EM-Z09019TBPUA2 ELECTRON BIPRISM
EM-24660DFI DARFIELD IMAGE OBSV DEVICE 363189
| Boulder |
| 81/1C105 |
| PML/687 |
| E-beam lithography system |
| JBX-6300FS |
| SB1351000150015 |
| JBX-6300FS E-beam lithography system |
| Boulder |
| 81/1B100 |
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