Questions and answers.docx
DOCX document 15 KB Posted
- Attached to
- Commercial semi-automatic probe stations Federal contract opportunity
- Solicitation number
- NIST-SS26-CHIPS-44
About this file
The document is a Questions and Answers file for a commercial semi-automatic probe station solicitation (NIST-SS26-CHIPS-44). The Q&A provides technical specifications for the instrumentation, including key details such as: using Keysight equipment, accommodating die sizes of 5x5 mm and 10x10 mm, maximum current and voltage limits of 100V/100 mA, and a requirement to specify the noise floor of the probes. The context is a NIST CHIPS R&D Program Office procurement for studying silicon carbide field effect transistors (FETs), focusing on reliability testing of gate oxide characteristics for high-power semiconductor applications in sectors like photovoltaics, power grid, electric vehicles, and energy storage.
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Questions and answers
1. Instrumentation looking to use (Keysight, Keithley, or in-house) Keysight.
1. Minimum Die Size?
5x5 mm and 10x10 mm should both be accommodated.
1. Max Current and Voltage?
100 V / 100 mA.
1. What is the noise floor required?
Noise floor of the probes should be <1 pA; we understand that heated chucks will always add some level of noise to this.
1. Do you require true kelvin capability?
Yes.
File details come from the government source that posted it. Updated .