MRD - ION Source Replacement.pdf
PDF 110 KB Posted
- Solicitation number
- IASS-AFRL-PZLEQ-2026-0020
About this file
This is a Minimum Requirements Document for the replacement of components on a Hitachi NX9000 FIB-SEM (Focused Ion Beam-Scanning Electron Microscope) located in Building 1202 at Eglin Air Force Base, Florida. AFRL/RWTE requires replacement of the LMIS2 ION source, FIB Condenser Lens Assembly, and associated parts, which are consumable items requiring replacement approximately every 4000 hours of use. The equipment supports critical Air Force Research Laboratory functions including site-specific analysis, gas deposition, material ablation, energy dispersive X-ray spectroscopy data collection, SEM imaging, and research and development related to high explosive programs for both AFRL and other federal agencies.
The salient characteristics specify five required parts: BEA-3809 LMIS2 ION Source, AAB-2940 OL Aperture Assembly for V Column, AAB-2941 O-Ring Set, EXCHK-W11102138 R-Condenser Lens Assembly (including BLK), and AAU-0100 Scintillator 7 Type. These are firm requirements, and any proposed "or equal" items must meet the specified characteristics. The EXCHK-W11102138 R-Condenser Lens Assembly operates on an exchange basis, requiring return of the removed assembly to Hitachi. The equipment is currently serviced and maintained by Hitachi High-Tech America under existing contract FA282325C0034.
View the file
Other files
| File | Type | Posted |
|---|---|---|
| SSJ (Redacted).pdf |
On GovTribe
Work with this file
- Download the original file
- Contacts named in this file
- Similar government files
- Ask GovTribe AI about this file
Text version
Minimum Requirements Document
NX9000 FIB-SEM Source Replacement
19 May 2026
Scope: AFRL/RWTE requires the LMIS2 ION source, FIB Condenser Lens Assembly, and associated parts be changed on the Hitachi NX9000 FIB-SEM located in Bldg 1202 at Eglin
AFB FL. The NX9000 FIB-SEM supports AFRL by conducting site-specific analysis, gas deposition, ablation of materials, collect energy dispersive X-ray spectroscopy data, or SEM images and providing critical support to both AFRL projects and other agencies programs related to high explosive research and development. The LMIS 2 ION source, FIB Condenser Lens
Assembly and the associated components are consumable items that must be replaced approximately every 4000 hours of use.
Background: The NX9000 FIB-SEM supports AFRL by conduct site-specific analysis, gas deposition, ablation of materials, collect energy dispersive X-ray spectroscopy data, or SEM images and provides critical data to both AFRL projects and other agencies programs related to high explosive research and development. The LMIS2 ION source uses Gallium to produce a high-brightness, finely focused ion beam and has been depleted. The FIB Condenser Lens assembly requires replacement approximately every 4000 hours of FIB use as the gun parts in the beam path become etched. The NX9000 FIB-SEM is serviced/maintained by Hitachi High-
Tech America through contract FA282325C0034.
Requirements/Salient Characteristics: The following Salient Characteristics are firm requirements and any “or equal” item must meet these characteristics:
PART PRODUCT NAME
• BEA-3809 LMIS2 ION Source
• AAB-2940 OL Aperture Assy for V Column
• AAB-2941 O-Ring Set
• EXCHK-W11102138 R-Condenser Lens Assembly include BLK.
• AAU-0100 Scintillator 7 Type
The EXCHK-W11102138 R-Condenser Lens Assembly is an exchange and the removed one must be returned to Hitachi.
File details come from the government source that posted it. Updated .