M26-088 Keyence Microscope - Item Description (ID)_Redacted.pdf
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- Keyence Microscope Federal contract opportunity
- Solicitation number
- FA812626Q0011
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This memorandum from the Department of the Air Force's Oklahoma City Air Logistics Complex details a request for procurement of one Keyence VHX-X1 Digital Microscope for the 76th MXSG/MXDTAA at Tinker Air Force Base. The microscope specifications include advanced imaging capabilities such as 4K high-resolution imaging, optical shadow effect mode, automated lighting, 360-degree viewing, and ultra-high-speed image stitching, with magnification ranges from 5x to 2500x.
Key additional requirements include a NIST-certified calibration scale, a 5-year warranty extension package, and four hours of training for four employees at Tinker AFB. The microscope's features are tailored for detailed analysis and inspection, particularly for electronics industry applications, with capabilities for 3D and 2D measurements, automated report generation, elemental and metallurgical analysis, and user-friendly operation. The procurement emphasizes efficiency through automated inspection, lighting adjustments, and focus and image stitching processes.
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Text version
DEPARTMENT OF THE AIR FORCE
OKLAHOMA CITY AIR LOGISTICS COMPLEX (AFMC)
TINKER AIR FORCE BASE, OKLAHOMA
9 October 2025
MEMORANDUM FOR RECORD
FROM:
OCALC/OBCA
3001 Staff Drive T67 Tinker Air Force Base, OK 73145
SUBJECT: Item Description For Keyence VHX-X1 Digital Microscope (Brand Name or Equal)
The 76th MXSG/MXDTAA is requesting utilization of funds for the purchase of one (1) Digital
Microscope.
1. The requested equipment item description / Specifications are outlined below.
a. Quantity of one (1) Digital Microscope.
(1) Imaging and Observation
(a) High-Resolution 4K Imaging: Provides detailed, high-quality images.
(b) Optical Shadow Effect Mode: Enhances surface detail, rivaling SEM clarity.
(c) Automated Lighting (Search Lighting Function): Real-time adjustments to optimize illumination and reveal subtle surface features.
(d) Free-Angle Observation: Offers 360-degree viewing for detailed analysis of complex surfaces.
(e) Ultra-High-Speed Image Stitching: Combines multiple images seamlessly.
(f) Automatic Real-Time Focus Adjustment: Maintains focus on uneven surfaces without manual intervention.
(2) Analysis and Measurement:
(a) 3D and 2D Measurement: Allows on-screen 2D and 3D measurements.
(b) 3D Shape Analysis: Provides analysis of three-dimensional shapes.
(c) Automatic Report Generation: Creates reports automatically based on analysis results.
(d) Automatic Difference Identification: Highlights color variations for quick identification of imperfections.
(e) Elemental Analysis (with optional accessories): Enables identification of elemental composition.
(f) Metallurgical Analysis (with optional accessories): Supports analysis of metallurgical structures.
(g) Image Comparison: Highlights differences in color to quickly identify variations in luminance and hue, ensuring no details are missed.
(3) Automation and Efficiency:
(a) Automated Inspection: Facilitates efficient and automated inspection of large components like wafers.
(b) Automated Lighting Adjustments: Reduces the need for manual lighting adjustments and allows for consistent observation.
(c) Automated Focus and Image Stitching: Automates the focus and image stitching processes.
(d) Automated Wafers and Large Parts Inspection: Specifically designed for automated inspection of wafers and large parts, increasing efficiency for the electronics industry.
(e) User-Friendly Operation: Designed for ease of use, regardless of user experience.
(4) Sample Handling
(a) Large Stage: Accommodates large samples like wafers and other large components.
(b) Automated Wafers and Large Parts Inspection: Specifically designed for automated inspection of wafers and large parts, increasing efficiency for the electronics industry.
(c) Accepts various objective lens Supports a variety of magnification and analysis types.
(5) Software and Integration
(a) Advanced Software: Provides tools for image analysis, measurement, and report generation.
(b) Motorized System: Features a fully motorized system for tilting and rotating samples.
b. Optics and magnification
(1) High-resolution VH lens set providing continuous coverage from 5x to 2500x:
(a) VHX-E00: 5x–20x
(b) VHX-E20: 20x–100x
(c) VHX-E100: 100x–500x
(d) VHX-E500: 500x–2500x
c. Measurement capability
(1) 3D measurement: VHX-H6M 3D Profile Measurement Module enabling 3D measurements with the VHX-X1 system
d. Calibration and traceability
(1) NIST-certified calibration scale: OP-88592
(2) Scale adapter: OP-88594 100 mm adapter for calibration scale
e. Warranty
(1) Warranty extension package: 5-year coverage (VH Warranty Extension Package)
f. Training
(1) Four (4) hours of Training for four (4) Employees at Tinker AFB
2. Point of contact for this memorandum is or email at
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