Q A 1 XRAY Diffractometer.doc
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- Versatile Theta/Theta XRay Diffractometer
- Solicitation number
- FA8224-12-R-0063
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| File | Type | Posted |
|---|---|---|
| Purchase Spec_XRD_26JUNE2012_B.doc | DOC document | |
| FA8224-12-R-0063-0006.doc | DOC document | |
| Purchase Spec_XRD_26JUNE2012.doc | DOC document | |
| FA8224-12-R-0063-0005.doc | DOC document | |
| Purchase Spec_XRD_12JUNE2012.doc | DOC document | |
| FA8224-12-R-0063-0004.doc | DOC document | |
| FA8224-12-R-0063-0003.doc | DOC document | |
| FA8224-12-R-0063-0002.doc | DOC document | |
| Q A 2 XRAY Diffractometer.doc | DOC document | |
| Purchase Spec_XRD_4JUNE2012.doc | DOC document | |
| FA8224-12-R-0063-0001.doc | DOC document | |
| Purchase Spec_XRD_31MAY2012.doc | DOC document | |
| 313D.pdf | ||
| 81815.pdf | ||
| Purchase Spec_XRD_27APR2012.doc | DOC document | |
| A001 313C Xray.pdf | ||
| FA8224-12-R-0063.doc | DOC document | |
| A002 ditmss81815 manual xray.pdf |
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Questions and Answers #1
Versatile Theta/Theta Xray Diffractometer
FA8224-12-R-0063
As of 31 May 2012, below are questions the Government has received and have given a response to. Whenever possible, questions are presented as originally asked. Otherwise, the question is presented to capture the main thrust or idea of the question or inquiry.
Q1: 3.1 - System Design: "The XRD system must accommodate samples from 0.1 to 15" in diameter or larger". What is the largest dimensions (x,y,z) of the sample and what type of XRD experiments do you expect to perform with the system? Would every point of the sample need to be analyzed?
A1: The XRD system must accommodate samples from 0.1" to 8" in diameter or larger. This is physically fitting inside the cabinet not the stage size. The analysis only needs to be performed on a small portion of the large samples, not every point. We hope to accommodate a large sample in the cabinet that is about 9,6,4 (x,y,z) inches in size. The majority of samples will be small, maybe 3,3,3 inches or smaller. Section 3.1 of the purchase specification has been revised.
Q2: 3.7.2 - Divergence Slit: Are the slits programmable or fixed?
A2: The divergence slit must be programmable/variable. Section 3.7.2 of the purchase specification has been revised.
Q3: 3.8 - Line Focus to Point Focus conversion: Does the X-ray tube need to be able to be rotated to provide maximum intensity?
A3: If X-ray tube rotation is required for system to meet high resolution requirements, then Yes.
Q4: 3.12 - Crystal Monochromator: Incident beam or diffracted beam monochromator required?
A4: A high resolution incident beam monochromator is required. Section 3.12 of the purchase specification has been revised.
Q5: 3.13 - Detector: Is the requirement of 700k cps per strip or for the detector (All strips combined)?
A5: The detector should be an array detector with a global capability (all strips combined) of 90,000,000 cps or greater. Section 3.13 of the purchase specification has been revised.
Q6: 3.15 - Heat Exchanger: The chiller must operate on 120VAC. The normal supplier (Haskaris) of heat exchangers for PANalytical equipment does not manufacturer a product that will meet this specification. Can an exception be made for a 208-240VAC heat exchanger to be supplied?
A6: A water cooled chiller that operates on 208VAC is acceptable. A 208V line will be installed by USAF. Section 3.15 of the purchase specification has been revised.
Q7: 3.16.2 - Software: Clarification on "Thin Film Analysis" requirement is requested. Does it require X-ray reflectivity, Rocking curve or both?
A7: Thin film analysis will mainly be on polycrystalline materials. Reflectivity is acceptable.
Q8: 3.16.3/.4 - Software: a) Vendor is required to supply a copy of each of the following databases ICDD PDF 4+ (1), PDF4/Organics (1), PDF-4/Minerals (1), and FIZ/NIST Inorganic Crystal Structure Database (ICSD) (1). It is important to note there is significant overlap with FIZ/NIST (ICSD) and ICDD PDF 4+ databases.
b) No counter/ min-max - Request clarification on the definition of this requirement A8:
3.16.3 The database license shall be an unlimited use license that does not have a limit on how many times it can be accessed. Section 3.16.3 of the purchase specification has been revised.
3.16.4 If the data contained in FIZ/NIST Inorganic Crystal Structure Database (ICSD) overlaps by at least 90% of the data contained in the ICDD PDF4+ databases then FIZ/NIST is not required and should not be provided/included.
Q9: Can you please clarify the following. They refer to section 4.4 Lockout/Tagout. 1. Does the Lockout/Tagout (4.4) refer to Maintenance or Servicing on the machine only? 2. When the power is off? a. Is it when the main switch on the SmartLab diffractometer is turned off? b. or is the power off when the power to the instrument, i.e. from the wall, is disconnected or the breaker at the wall is in the “off” position? 3. Does it refer to locking the power when it is off ? 4. Does the Tagout/Lockout also pertain to the chiller? The chiller is typically hard wired to the customer electric in the same fashion as the diffractometer.
A9: Lockout/Tagout is a procedure to make the system safe when maintenance or repair is needed. Any part of the system that has residual energy should be able to get locked out to make the system safe. Also it should prevent the system from being energized accidentally during service. Both the instrument and the chiller will have a standard twist lock plug end going into a wall receptacle. These plug ends can be disconnected and locked out as needed. If necessary a power off lever, that can be locked out, will be installed by USAF personnel.
Q10: How should we send the bid response to Hill AFB? It would be preferable to send the response via email-will that be ok?
A10: Yes, email is acceptable.
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