Statement of Work_final (with schedule dates).pdf

Statement of Work

H4WM05

Energy dispersive micro-focusing x-ray fluorescence spectrometer (µEDXRF) with large chamber and poly-capillary optics.

1. SCOPE - This Statement of Work (SOW) provides the requirements/specifications for the furnishing, shipping, assembling, installing, verification, calibration, testing, and training of an energy dispersive micro-focusing x- ray fluorescence (µEDXRF) spectrometer with large chamber and poly-capillary optics to provide a small x-ray spot suitable for the nondestructive spectral mapping of large samples and select parts. The µEDXRF instrument shall detect all elements from Magnesium to Uranium with sufficient resolution, sensitivity, accuracy, precision, and reproducibility to satisfy all items in this SOW. The contractor shall provide all labor, tools, equipment, materials, parts, personal protective equipment (PPE), transportation, shipping, and any other incidentals necessary to complete the requirements of this SOW. The contractor shall provide basic operational training for all supplied equipment/software to Tinker AFB personnel following installation by the contact acceptance by government personnel.

The contractor shall provide to the Government Point of Contact (GPOC) and the Contracting Officer, within 30 days of receipt of award, the following estimated milestone dates:

Estimated Delivery Date:

Estimated Installation Date:

Estimated Verification/Calibration Date:

Estimated Training Date:

Estimated Full Operational Capacity Date:

2 REQUIREMENTS/SPECIFICATIONS

2.1 DESIGN - The instrument shall be of the manufacturer’s current design. It shall be a new unit and include any additional features necessary to comply with the requirements specified herein. Additional features which are not specified herein, but are part of the manufacturer’s current design, shall be included in the furnished equipment.

2.2 SAFETY - The instrument shall be equipped with all necessary safety devices per American National Standard for x-ray fluorescence instrumentation for protection against exposure to x-rays. It shall have any other protective devices as necessary to prevent x-ray exposure to the operator, damage to the equipment, or erroneous data input or output. X-ray safety requirements are Less than 1 μSv/hour at 10 cm from the outside surface.

2.3 WARRANTY – The vendor shall provide a complete standard commercial warranty on the instrument and X-ray tube.

2.4 GENERAL SPECIFICATIONS

2.4.1 The instrument shall be an energy dispersive x-ray fluorescence spectrometer with poly-capillary optics suitable for chemical laboratory use.

2.4.2 The instrument shall not contain radioactive material.

2.4.3 The primary excitation source shall be an air-cooled 50 watt Rhodium x-ray tube for production of the x-ray energy.

2.4.4 The x-ray tube voltage shall be controllable from 10-50 kilovolts (1.0kV steps) and the x-ray tube current shall be controllable from 0.02-1.0 mA (0.01 mA steps).

2.4.5 The x-ray beam from the primary excitation shall directly excite the sample. The poly-capillary optics will focus the point source in tube to spot on sample with beam diameter no greater than 15 microns. The excitation shall be of PERPENDICULAR GEOMETRY, allowing circular excitation down to 15μm for the highest resolution. Thus, the beam is normal to the surface for the most accurate hyperspectral imaging. The primary excitation emanating from poly-capillary shall exhibit a depth of field of no less than 15 mm.

2.4.6 The instrument shall include a primary beam filter system that includes at least six filters which are located on a filter wheel located between the Rhodium x-ray tube and poly-capillary.

2.4.7 The instrument shall include at least two peltier-cooled silicon drift detectors (SDDs).

Each detector’s active area shall be ≥ 70 mm2 and include a Beryllium window. Detectors are located above the sample for analysis of elements from Na to U. Each Detector’s Mn Kα resolution shall be 140eV or better, measured at MnK, with 100,000 CPS input.

2.4.8 The spectrometer sample chamber shall allow for a cuboid sample with minimum dimensions of width=x=300 mm, length=y=400 mm, and height =z=200 mm to be entirely mapped such that elemental composition as a function of (x,y) coordinates are obtained at 15-micron-spatial-resolution using a 15-micron-x-ray-spot-size. Therefore, the minimum spectrometer chamber volume shall be width=x=600 mm, length=y=900 mm, and height=z=350 mm. The stage has shall have a weight specification of no less than 10 kg.

motorized stage under computer control of the XYZ coordinates. Stage travel is at least width=x=300 mm, length=y=400 mm, and height=z=300mm. Minimum step size is not greater than 5 μm. Stage precision must be a maximum ± 2 μm XY axes and maximum ±10 μm Z axis.

2.4.9 System shall have an additional Secondary Collimated X-ray source (50 KW, 1000-μm-spot-size, and Rhodium anode) for bulk analysis.

2.4.10 System shall be capable of being upgraded in the future at Tinker AFB to have an Additional secondary (active area no less than 70 mm²) Silicon Drift Detector with a special window specialized for Light Element analysis that detects elements down to carbon.

2.4.11 The video system will have the capability of scanning on low power a nominal 10X to locate the area of analytical interest and high power no less than 100X to allow accurate viewing of the analytical area. The graphic board and software should allow copying of the view in a graphic format compatible with standard word processing software to allow pasting the view into the laboratory report. High Magnification video path is perpendicular to the sample and coaxial with the X-ray beam.

2.4.12 System shall include both Vacuum System including pump and He-flush capability.

2.4.13 Instrument shall be capable of analyzing all elements within the maximum and minimum limits given in Appendix 1 in both vacuum and Helium environments when using the 15 micron x-ray spot emanating from the poly-capillary optic. There shall be sufficient flux density in the 15-micron x-ray spot to meet the minima for the alloys represented in Appendix 1 for dwell times of 50 ms in mapping applications. The total summed counts per second at 40% dead time of each detector using 50 KV tube voltage shall be no less than 100,000 cps for a pure iron sample.

2.4.14 The software must allow viewing of the sample coupled with positioning of the area of analytical interest by mouse.

2.4.15 The software must allow single point analysis. It should also allow automated multiple points, points on a line, and matrix point sequences to be configured and analyzed.

2.4.16 The software must allow element imaging via spectral mapping.

2.4.17 The software must allow peak identification with energy line markers, automatic and manual background fitting routines, peak subtraction, normalization, and intensity calculations by various deconvolution curve fitting routines. The deconvoluted best fit spectrum should overlay the actual spectrum in order to visibly discern the quality of the calculated best fit spectrum.

2.4.18 The software shall allow for Quantitative analysis using both standardless fundamental parameters and fundamental parameters with standards.

2.4.19 The software shall allow for quantitative analysis using semi-empirical algorithms employing influence coefficient equations.

2.4.20 The instrument computer software shall save results and allow retrieval for later viewing and re-processing.

2.4.21 The instrument computer software shall allow data to be exported to Microsoft applications such as Excel.

2.4.22 The instrument shall provide multiple adjacent camera fields of view to be collected with the elemental images stitched together as a montage in an unattended mode of operation.

2.4.23 The instrument shall provide multiple uncorrelated camera fields of view to be collected in an unattended mode of operation.

2.4.24 The instrument shall provide the ability to reprocess spectral database with new elements identified.

2.4.25 The instrument shall provide the ability to produce Wt% maps with FP quantification.

2.4.26 The instrument shall provide for Precise control of size and location of spectral display regions within the element map. The spectral display regions shall be by point, by line, and by matrix where size and position of matrix can be specified to make absolute spectral comparisons between regions of the map.

2.4.27 The instrument shall provide for Total Sum Spectrum over entire map.

2.4.28 The instrument shall provide for Total Spectral Count Map Image where each map pixel represents the total counts in the spectrum at that map pixel.

2.4.29 The instrument shall collect x-ray spectra at a selected pixel resolution with capability of up to 4,000 x 4,000 over a selected sample region. The spectrum at each map pixel shall be capable of being saved for future data processing.

2.4.30 The instrument shall provide for Elemental maps to be used to steer the stage to a particular location on the sample for further in-depth analysis. After collection, the instrument shall provide a user the capability to recall a particular spectrum or create spectral summations by location in the video and elemental map images.

2.4.31 The instrument shall allow X-ray line profiles to be acquired from any orientation on the sample whereby both intensity and semi-quantitative data can be acquired and graphically displayed on the monitor. The instrument shall provide the capability for line scan data to be displayed separately or overlaid on the video image.

2.4.32 The instrument shall provide μEDXRF-spectral-mapping resulting in 2-dimensional- Intensity-maps which are x-ray energy dispersive spectra where an x-ray fluorescence spectrum originating from x-ray excitation-spot-size-of 5-micron-diameter is saved at each pixel. This spectral Mapping shall result in a true 4K by 4K array of 15-micron-pixcels with full resolution. The generated XRMF spectrum at each 15-micron increment shall be auto deconvoluted with background subtraction for a total of 16,000,000 spectra comprising the 60mm x 60mm area is deconvoluted to give peak intensities for each element of interest (Fe(Kα) = 6.403 KeV, V(Kα) = 4.952 KeV, Ca(Kα) = 3.691 KeV, etc.) at each of the 16,000,000 pixels. Therefore, the mapped 60mm x 60mm region is associated with an x-ray-energy-dispersive-spectrum for each 15 micron pixel. The resulting deconvoluted spectral map for each element of interest shall be displayed using unique color for each element and pseudo-gray scale for total-x-ray-fluorescence-counts of all elements where the displayed element is assigned a specific color (red, blue, green, etc.) with maximum-deconvoluted-peak-intensity at a given pixel being proportional to the intensity of the assigned color for that element. For example, if red is assigned to Fe, then the spectral map for Fe will be bright red at pixels occupied by low alloy steel particles, completely dark for pixels occupied by particles of Ag-plating, and semi-bright for pixels containing particles of A286. Element maps are then able to be combined/mixed/overlayed and magnified so that each 15 micron pixel is visibly discernable.

2.4.33 The instrument shall provide μEDXRF-spectral-mapping capable of discerning and quantifying the particles of a 60 mm x 60 mm filter patch that contains Thousands of particles corresponding to engine alloy classifications: M50, 9310, 4340, 17-4, 310, 347, A286, Inco 718, LA steel, Ag, W carbide, Cr plate, Ni plate, 316 steel, 304 steel, geological materials corresponding to the inorganic components of common dirt (quartz/gypsum/alkali-feldspars/ aluminosilicates), cellulose fibers, and metal-oxide-corrosion products where particles range in size over four orders of magnitude from 1 mil2 to 5000 mil2 using a 50 ms dwell time in a spectral mapping application.

2.4.34 The design of the instrument shall allow it to be field serviceable and field upgradable. This includes any exchange of hardware or additional hardware to be installed that may enhance the capability of the instrument (i.e., adding detectors).

3 ON-SITE INSTRUMENT INSTALLATION VERIFICATION AND TRAINING

3.1 The vendor shall provide on-site installation and verification by demonstration that the instrument is in working order and meets all the requirements of the SOW. Installation and verification shall be accomplished during normal operating hours of Monday – Friday 7:00 am – 3:00 pm.

3.2 The vendor shall include no less than 80 hours of application support via phone, MS TEAMS, and email by an applications specialist during the first year of operation as the user is learning how to use the instrument. The application support shall be provided during normal operating hours of Monday – Friday 7:00 am – 3:00 pm

4 QUALITY ASSURANCE

4.1 QUALITY CONFORMANCE INSPECTION

4.1.1 A quality conformance inspection shall be conducted after installation of the instrument is completed, ensuring calibrations have been tested and verified to be accurate under supervision of government representatives and/or SME’s. Failure of any item to pass any examination or test shall be cause for rejection. The μEDXRF spectrometer and its associated equipment, within this purchase will remain the property of the contractor until all items of this quality conformance inspection have been passed and accepted by the government representative(s).

4.1.2 The installed instrument shall meet all the requirements stated in the SOW, conform to the vendor’s own drawings, specifications, standards, and quality assurance practices.

5 COMPUTER SYSTEM

5.1 The computer system shall be at least a 6th Gen Intel® Core™ i7 6700 Quad-Core Processor (3.20GHz, 4.0Ghz Turbo, 8MB w/ HD Graphics 530) Windows® 10 64-bit Operating System, 500 GB Hard Drive with 34” widescreen monitor.

5.2 The software licensed to be used on the computer shall include Windows 10 operating system with MS Word, MS Excel, and MS PowerPoint.

6 ACCESSORIES

6.1 The supplier will supply any unique supplies required for the operation of the instrument and supply of consumables to allow the operation of the instrument for 60 days. This is to allow the end-user sufficient time to establish a source and acquire suppliers.

6.2 Any special tools required for routine maintenance shall be supplied with the instrument.

Appendix 1. Each element listed under each base metal below will be accurately quantified in the given range in relative weight present when using the 15-micron x-ray spot.

Iron-base (Low alloy, Tool, cast, and stainless steels) Si 0.1 - 19 Mn 0.1 - 19 P 0.05 - 2 S 0.05 - 0.4 Cr 0.02 - 32 Mo 0.05 - 9.5 Al 0.02 - 3.0 Co 0.02 - 21 Cu 0.05 - 8 Nb 0.05 - 3.0 Ti 0.05 - 3.0 V 0.01 - 10 W 0.02 – 20 Pb 0.005 - 0.4 Sn 0.1 - 0.3 Mg 0.1 - 0.2 As 0.05 - 0.2 Zr 0.02 - 0.2 Bi 0.05 - 0.04 Ca 0.05 - 0.02 Ce 0.05 - 0.5 Sb 0.02 - 0.2 Te 0.01 - 0.05 Se 0.02 - 0.3 Ta 0.05 - 0.7 Zn 0.05 - 0.04 La 0.01 - 0.2

Aluminum-base Si 0.05 - 20 Fe 0.05 - 12 Cu 0.05 - 10 Mn 0.05 - 0.9 Mg 0.1 - 12 Cr 0.05 - 0.5 Ni 0.05 - 2.8 Zn 0.05-12 Ti 0.05 - 0.3 Ag 0.01 - 1 Bi 0.01 - 0.1 Ca 0.05 - 0.04 Cd 0.005 - 0.5 Ga 0.02- 0.1

La 0.02 - 0.05 P 0.05 - 1 Pb 0.01 - 1.5 Sb 0.01 -0.6 Sn 0.01 - 0.1 V 0.05- 0.1 Zr 0.05- 0.3

Copper-base Zn 0.05 - 45 Pb 0.01 - 17 Sn 0.05 - 14.8 P 0.05-1 Mn 0.05 - 5.5 Ni 0.05 - 34 Si 0.05 - 6.1 Mg 0.1 - 0.18 Cr 0.05 - 2.4 Te 0.01 - 0.15 As 0.01 - 0.4 Sb 0.01 - 1.7 Bi 0.01 - 5.0 Ag 0.02 - 1.6 Co 0.05 - 2.4 Al 0.05 - 12.0 S 0.05 - 0.20

Ni-Fe-Co high temperature alloys Si 0.05 - 4.0 Mn 0.05 - 10 P 0.05 - 0.9 S 0.05 - 0.3 Cr 0.05 - 36 Fe 0.05 - 100 Mo 0.05 - 34 V 0.05 - 3 Cu 0.05 - 41 W 0.05 - 13 Co 0.05-100 Nb 0.05 - 6 Al 0.05 - 6 Ti 0.05 - 6 Zr 0.05 - 0.3 Ta 0.05 - 12.0 Hf 0.05 - 2.0 Re 0.02 - 5

Y 0.05 - 5 Pt 0.02 - 0.5

Titanium-base Al 0.1 - 8 Sn 0.05 - 11 Zr 0.02 - 6 Mo 0.05 - 16 V 0.05 - 5.6 Si 0.05 - 1 Mn 0.02 - 7 Cr 0.05 - 4 Ni 0.05 - 0.6 Fe 0.05 - 3 Cu 0.05 - 2.5 Nb 0.05 - 7 Pd 0.02 - 0.2 Y 0.05 - 0.05 Ta 0.05 - 0.2 Ru 0.02 - 0.2

Pb-base Sn 0.1 - 64.4 Ag 0.05 - 3.4 Sb 0.1 - 17 Bi 0.1 - 54 Cd 0.05 - 0.5 As 0.03 - 1.5 Au 0.02 - 0.3 Ca 0.1 - 0.16 Cu 0.1 - 0.6 Fe 0.05 - 0.03 In 0.05 - 0.3 Ni 0.05 - 0.02 P 0.05 - 0.02 S 0.05 - 0.03 Se 0.05- 0.03 Te 0.05 - 0.09 Zn 0.05 - 0.06 Pd 0.05 - 0.008

2.4 GENERAL SPECIFICATIONS