SOW_for_FY20_H0WM04_Energy_Dispersive_Micro-focusing_X-ray_Fluorescence_Spectrometer_with_Polycapillary_Optics_Redacted.pdf

ITEM DESCRIPTION

Energy Dispersive Micro-focusing X-ray Fluorescence Spectrometer with Polycapillary Optics

Analytical Chemistry Section

1. SCOPE. This item description covers an energy dispersive micro-focusing x-ray fluorescence spectrometer with p bholy-capillary optics suitable for the quick and nondestructive analysis of metals and other materials used on jet engines and aircraft.

2. BACKGROUND. The Analytical Chemistry Section, Oklahoma City Air Logistics Center (OC-ALC), Tinker Air Force Base, OK is responsible for the chemical analysis of metals and other materials used in the United States Air Force (USAF) aircraft and jet engines managed at OC-ALC. Alloy families frequently encountered include iron base, nickel base, cobalt base, and aluminum base.

Other materials include plasma spray powders, coatings, trace amounts of impurity, chips from engine lubricating systems, and small particulates retained by filters in aircraft systems. An energy dispersive micro-focusing x-ray spectrometer with capillary optics is required for analysis of these materials.

3. SALIENT CHARACTERISTICS

3.1 DESIGN - The instrument shall be of the manufacturer’s current design. It shall be a new unit and include any additional features necessary to comply with the requirements specified herein.

Additional features which are not specified herein, but are part of the manufacturer’s current design, shall be included in the furnished equipment.

3.2 SAFETY - The instrument shall be equipped with all necessary safety devices per National Electrical Code for protection against electrical shock hazard. It shall have all the necessary interlocks to prevent the accidental exposure of the operator to x-rays. It shall have any other protective devices as necessary to prevent injury to the operator, damage to the equipment, or erroneous data input or output.

3.3 WARRANTY – The complete spectrometer system, software, and interface boards will include an on-site 1 year warranty on all parts and labor to become effective on the day of installation acceptance by the government.

3.4 GENERAL SPECIFICATIONS

3.4.1 The instrument shall be a bench top energy dispersive x-ray fluorescence spectrometer with poly-capillary optics suitable for chemical laboratory use.

3.4.2 The instrument shall not contain radioactive material.

3.4.3 The primary excitation source shall be an air-cooled 50 watt Rhodium x-ray tube for production of the x-ray energy.

3.4.4 The high voltage generator allows the x-ray tube parameters to be controlled by the computer. The x-ray tube voltage shall be controllable from 10-50 kilovolts (1.0kV steps) and the x-ray tube current shall be controllable from 0.02-1.0 mA (0.01 mA steps).

3.4.5 The x-ray beam from the primary excitation shall directly excite the sample. The poly-capillary optics will focus the point source in tube to spot on sample with beam diameter no larger than 30 microns (i.e. 30 µm poly-capillary optic). Polycapillary optic must have working distance ≥ 7 mm. In addition to the poly-capillary optic that is used for small samples, a 1 mm collimator and a 2 mm collimator for are available for larger samples. The polycapillary optic, 1 mm collimator, 2 mm collimator, and high magnification video are each positioned on a motorized turret above the sample in order to seamlessly switch between spot sizes and do analysis with filters at ALL of the spot sizes. There shall exist Co-axial X-ray optic and Sample view for accurate sample positioning and analysis.

3.4.6 The instrument shall include an 8-position primary beam filter system that includes at least six filters which are located on a filter wheel located between the Rhodium x-ray tube and polycapillary. The filters include Al (thin), Ti, Ni, Nb, Rh, and Al (thick).

3.4.7 The detector shall be a peltier-cooled silicon drift detector (SDD). The detector’s active area shall be ≥ 70 mm2 with a Beryllium window. Detector is located above the sample for analysis of elements from Na to U. Detector’s Mn Kα resolution shall be 140eV or better, measured at MnK, with 100,000 CPS input.

3.4.8 The spectrometer sample chamber must accept bulk samples up to at least 270mm (W) X 270 mm

(D) x 100 mm (H). The sample chamber must be equipped with a vacuum pump under computer control and of adequate capacity to evacuate the sample chamber to vacuum analytical conditions in less than five minutes.

3.4.9 The sample chamber will have a motorized stage under computer control of the XYZ coordinates.

Stage travel is at least 100 mm x 100 mm x 100 mm. Minimum step size is not greater than 5 µm.

Stage precision must be a maximum ± 2 µm XY axes and maximum ±10 µm Z axis.

3.4.10 High Magnification video path is perpendicular to the sample and coaxial with the X-ray beam.

3.4.11 The video system will have the capability of scanning on low power (10x) to locate the area of analytical interest and high power (in the range of 70 to 140 X with digital zoom color CCD video).

This would allow accurate viewing of the analytical area. The graphic board and software should allow copying of the view in a graphic format compatible with standard word processing software to allow pasting the view into the laboratory report.

3.4.12 System shall include both Vacuum System including pump and He-flush capability.

3.4.13 A user manual shall be provided with the instrument. The user manual shall include at least the following information – safety notices, instrument description, instrument specifications, operating instructions, maintenance and servicing, software description and detailed software operating instructions, calibration/standardization procedures, and troubleshooting.

3.5 ANALYTICAL SOFTWARE

3.5.1 The software must allow viewing of the sample coupled with positioning of the area of analytical interest by mouse.

3.5.2 The software must allow single point analysis. It should also allow automated multiple points, points on a line and matrix point sequences to be configured and analyzed.

3.5.3 The software must allow element imaging via spectral mapping.

3.5.4 The software must allow peak identification with energy line markers, automatic and manual background fitting routines, peak subtraction, normalization, and intensity calculations by various deconvolution curve fitting routines. The deconvoluted best fit spectrum should overlay the actual spectrum in order to visibly discern the quality of the calculated best fit spectrum.

3.5.5 Allow for Quantitative analysis using both standardless fundamental parameters and fundamental parameters with standards.

3.5.6 Allow for quantitative analysis using semi-empirical Lucas-Tooth-Pyne type model using multiple standards.

3.5.7 The instrument computer software shall save results and allow retrieval for later viewing and re-processing.

3.5.8 The instrument computer software shall allow data to be exported to Microsoft applications such as

Excel.

3.5.9 Multiple adjacent camera fields of view can be collected with the elemental images stitched together in an unattended mode of operation.

3.5.10 Multiple uncorrelated camera fields of view can be collected in an unattended mode of operation.

3.5.11 Ability to Reprocess spectral database with new elements identified.

3.5.12 Ability to produce Wt% maps with FP quantification.

3.5.13 Precise control of size and location of spectral display regions within the element map. The spectral display regions shall be by point, by line, and by matrix where size and position of matrix can be specified to make absolute spectral comparisons between regions of the map.

3.5.14 Total Sum Spectrum over entire map is available.

3.5.15 Total Spectral Count Map Image where Each map pixel represents the total counts in the spectrum at that map pixel.

3.5.16 Collect x-ray spectra at a selected pixel resolution with capability of up to 1024 x 800 over a selected sample region. The spectrum at each map pixel is saved for future data processing.

3.5.17 Elemental maps can be used to steer the stage to a particular location on the sample for further in-depth analysis. After collection, a user can recall a particular spectrum or create spectral summations by location in the video and elemental map images.

3.5.18 Shall allow X-ray line profiles to be acquired from any orientation on the sample whereby both intensity and semi-quantitative data can be acquired and graphically displayed on the monitor.

The linescan data can be displayed separately or overlaid on the video image.

3.6 COMPUTER SYSTEM

3.6.1 The computer shall be at least an Intel G850 processor (2.93 GHz, 3MB CACHE, 2 CORES), 500 GB Hard Drive, 64-bit Operating System, 4 GB RAM, with 22” widescreen monitor.

3.6.2 The software licensed to be used on the computer shall include Windows 10 operating system with MS word, MS Excel, and MS Powerpoint.

3.7 ACCESSORIES

3.7.1 The supplier will supply any unique supplies required for the operation of the instrument and supply of consumables to allow the operation of the instrument for 60 days. This is to allow the end-user sufficient time to establish a source and acquire suppliers.

3.7.2 Any special tools required for routine maintenance shall be supplied with the instrument.

3.8 ON-SITE INSTRUMENT VERIFICATION AND TRAINING

3.8.1 The vendor shall provide on-site verification by demonstration that the instrument is in working order and meets the salient characteristics of this item description.

3.8.2 The vendor shall provide a minimum of one day on-site training in the use of the instrument. This training will cover all aspects of operating the spectrometer, quantitative analysis programs, and element imaging via spectral mapping.

4 QUALITY ASSURANCE

4.1 QUALITY CONFORMANCE INSPECTION

4.1.1 The instrument shall meet the salient characteristics of this item description, conform to the vendor’s own drawings, specifications, standards, and quality assurance practices.

4.1.2 After installation, instrument verification, and training are completed at Tinker Air Force Base, a Government representative shall perform quality conformance inspections on a fully assembled and fully operational spectrometer. Until accepted by the Government, the vendor shall be responsible for deficiencies and installation costs.

4.1.3 Demonstrate in the presence of a government representative that the system meets or exceeds those specifications set forth in Section 3.

4.1.4 Demonstrate in the presence of a government representative that the instrument can accurately analyze and discriminate between various 300 series stainless steel certified reference materials (CRMs) for the elements of Fe, Ni, Cr, Mo, Mn, Si, S, P, Mo, Nb, Ti, and Se.

4.1.5 Demonstrate that the instrument can locate visually on screen a 30 micron particle and accurately analyze this 30 micrometer particle which may be low alloy steel, stainless steel, cobalt base, nickel base, aluminum base, or titanium base.