Attachment A - Statement of Work.pdf

Statement of Work

Femto Tools iX05 Femto-Indenter Extreme Brand Name or Equal

1. Objective/Requirements

This requirement is for the acquisition of Femto Tools iX05 Femto-Indenter Extreme Brand Name or Equal for NASA Marshall Space Flight Center (MSFC) to measure near-surface mechanical properties at high lateral resolution.

2. Characteristics, Scope, and Specs

The purpose of this procurement is to acquire a nanoindenter that will allow measure of near-surface mechanical properties at high lateral resolution, to create property maps of material surfaces; these maps are helpful in explaining tribological performance of these materials. A vacuum and low temperature capability will allow measurements at conditions close to those that exist in space and on the lunar surface. This will allow NASA to measure local mechanical properties in real-world conditions such as high temperatures, low temperatures, high strain rates, or in liquid environments.

The contractor shall meet or exceed the following specifications:

QTY DESCRIPTION

1 iX05 Femto-Indenter Extreme Brand Name or Equal

High-resolution High-Speed Operando Nanoindenter for micro-and nano-mechanical testing in force range from 0.1nN to 2N and displacement range from 5pm to 20μm (fine) or 30mm (coarse). Sample stage with 130mm x 130mm range with position noise floor of 0.1 nm. Dedicated vacuum chamber with integrated vibration isolation for high vacuum levels down to 10-4 mbar. Software for nanoindentation, ultra-fast property mapping, CSM, DMA, fatigue testing, vacuum control and data processing/visualization.

Noise floors down to < 500 pN in force and <5 pm in displacement.

1 S200'000-D1 Microforce Sensing Probe (2 units) Brand Name or Equal Microforce Sensing Probe with a force range up to 20 mN Tip option: Diamond tip with a geometry as specified in 1

1 S200'000-D1 Microforce Sensing Probe (2 units) Brand Name or Equal

Microforce Sensing Probe with a force range up to 200 mN

1 S2'000'000-D1 Microforce Sensing Probe (2 units) Brand Name or Equal

Microforce Sensing Probe with a force range up to 2 N

1 ST05 Scratch Testing Module Brand Name or Equal

Scratch Testing Module for the iX05 enabling microscratch, microfriction testing, as well as scanning probe microscopy (SPM) imaging.

1 S20'000-2Axis-D2 Microforce Sensing Probe (2 units) Brand Name or Equal Two-Axis Microforce Sensing Probe with a force range up to 20 mN Tip option: Diamond tip with a geometry as specified in 2

1 LT05 Low-Temperature Module Brand Name or Equal

Low-Temperature Module for the iX05, enabling micro- and nano-mechanical testing at temperatures from room temperature down to -150°C under vacuum, or while controlling the atmosphere in the indenter using inert gas.

1 S200'000-HT-D3 Microforce Sensing Probe (2 units) Brand Name or Equal Microforce Sensing Probe with Tip Heating and a force range up to 200 mN

USD 9'000.00 1.00 USD 9'000.00

Tip option: Diamond tip with a geometry as specified in 3

1 FT-COMP Computer Brand Name or Equal

Model: HP Elite Tower 800 G9 Desktop PC

1 FT-INSTALL Installation and Training Product installation and user training (2 days)

1 Shipping costs (delivery under Incoterms FOB Destination)

1FemtoTools Microforce Sensing Probes Brand Name or Equal (exchangeable MEMS force sensors) for nanoindentation measurements in 3 different load ranges:

In 2 N load range: two sensor units, each equipped with a diamond tip (1 unit Berkovich, 1 unit cube corner)

In 200 mN load range: two sensor units, each equipped with a diamond tip (1 unit Berkovich, 1 unit cube corner)

In 20 mN load range: two sensor units, each equipped with a diamond tip (1 unit Berkovich, 1 unit cube corner)

2FemtoTools Microforce Sensing Probes Brand Name or Equal (exchangeable MEMS force sensors) with 2-axis force sensing during nanoscratch / nanowear experiments:

In 20 mN load range: two sensor units, each equipped with a diamond tip (1 unit Berkovich, 1 unit conospherical with r=2um)

3FemtoTools Microforce Sensing Probes Brand Name or Equal (exchangeable MEMS force sensors) with active tip heating during temperature-dependent measurements:

In 200 mN load range: two sensor units, each equipped with a diamond tip (1 unit Berkovich, 1 unit cube corner)

• Instruments to include a 12 months warranty period

• Remote technical support available to the trained users for the life of the instrument at no additional cost.

• Software suite for system control and data analysis with:

No limit on the number of software copies that can be installed and used simultaneously on user computers, for the whole lifetime of the instrument and at no additional cost, Access to software updates for the life of the instrument at no additional cost.

3. Place of Performance

ATTN: TBD

NASA Marshall Space Flight Center (MSFC)

BLDG 4711

ROOM W113C

Huntsville, AL 35812

4. Period of Performance

Instruments to be delivered 20 Weeks after receipt of order (ARO) Product installation and training shall be completed within 2 days after delivery

5. NASA Technical Point of Contact (TPOC)

TBD