Attachment 1 Specifications - Short-Wave Infrared (SWIR) Hyperspectral Imaging System .pdf
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- Solicitation number
- 1232SA26Q0437
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This document is a specifications sheet for a Short-Wave Infrared (SWIR) Hyperspectral Imaging System procurement by the USDA ARS Cereal Crops Research Unit in Madison, Wisconsin.
The USDA ARS seeks a research-grade SWIR hyperspectral imaging system operating in the 900–2500 nm range to support high-throughput screening of barley malt samples for quality assessment. The system will enable rapid, non-destructive analysis of malt composition attributes including protein, moisture, starch structure, β-glucans, and carbohydrate- and nitrogen-related features, replacing time-intensive traditional wet-chemistry assays. The requested system must be a benchtop or laboratory-scale pushbroom (line-scan) hyperspectral platform with integrated illumination, motion control compatibility, and validated calibration workflows. Critical technical specifications include: spectral resolution FWHM of 7.7 mm, spectral range of 1000–2500 nm (minimum), F-number of 1.8, minimum 245 spectral bands with 3.06 nm spectral sampling per pixel, maximum frame rate of 120 fps, and 16-bit data depth. The system must provide approximately 640 spatial pixels or greater, support dark and white reference calibration, include vendor-supported acquisition software with real-time preview and standard hyperspectral data format export, and integrate into the laboratory's existing Resonon Pika XC2 upright stand configuration and Spectron-based data acquisition workflows to minimize additional hardware integration and retraining. All components must be manufactured in the USA with US-based customer service, be compliant with NDAA section 848 and Executive Order 13981, and contain no subcomponents from adversary countries. The required delivery date is 60 days after receipt of order, with standard 12-month warranties acceptable.
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Text version
January 26, 2026
Specifications
Short-Wave Infrared (SWIR) Hyperspectral Imaging System (900–2500 nm) OR
EQUIVALENT
USDA ARS Cereal Crops Research Unit
502 Walnut St.
Madison, WI 53726
GENERAL INFORMATION
1.0 Scope of Work: Ongoing collaborations with barley breeders, maltsters, and cereal chemistry laboratories require rapid, non-destructive, and quantitative assessment of barley malt quality traits using small sample quantities. Traditional wet-chemistry malt quality assays (e.g., β-glucan, protein, FAN, enzymatic activity) are accurate but time- and labor-intensive and limit throughput. Short-wave infrared (SWIR) hyperspectral imaging provides a powerful alternative by enabling simultaneous, spatially resolved spectral measurements associated with malt composition, including protein, moisture, starch structure, β-glucans, and other carbohydrate- and nitrogen-related features. These measurements can be acquired rapidly, non-destructively, and with minimal sample preparation. The proposed system will support high-throughput screening of barley malt samples and the development of chemometric and machine-learning models to predict malt quality attributes relevant to breeding and malting performance.
2.0 Background: The Walling Laboratory routinely screens large numbers of barley lines submitted annually by breeding programs and collaborators. These data are used to identify high-performing lines for advancement and to guide selection decisions in subsequent growing seasons. To expand throughput and reduce analytical bottlenecks, the laboratory seeks to implement a research-grade SWIR hyperspectral imaging platform capable of acquiring calibrated reflectance data across the full SWIR range relevant to organic functional groups in barley malt. A benchtop or laboratory-scale pushbroom SWIR hyperspectral system with integrated illumination, motion control compatibility, and validated calibration workflows is essential to ensure reproducibility, ease of use, and rapid deployment in an active research environment. The system must be capable of integration into the laboratory’s existing hyperspectral imaging infrastructure, including an existing Resonon Pika XC2 upright stand configuration and established Spectron-based data acquisition and analysis workflows, to ensure continuity of operations and minimize additional hardware integration, retraining, and maintenance overhead.
3.0 Technical Specifications:
OPTICAL SPECIFICATIONS
• Spectral Resolution FWHM (mm): 7.7
• Spectral Range (mm): 1000 – 2500
• F-number: 1.8
• Spectral Bands: 245 (minimum)
• Spectral Sampling per Pixel: 3.06 nm
DATA SPECIFICATIONS
• Maximum Frame Rate: 120 fps
• Bit Depth: 16
• Made in the USA
• US Based Customer Service
• NDAA section 848 and Executive Order 13981 compliant
• No control, communication, sensor subcomponents or software that is manufactured or developed in an “adversary country”.
• Spectral range covering at minimum 900–2500 nm, enabling detection of overtone and combination bands associated with proteins, starches, moisture, and β-glucans.
• Spectral sampling suitable for quantitative chemometric analysis across the SWIR region.
• High signal-to-noise performance appropriate for reflectance measurements on heterogeneous granular samples.
• Detector format providing approximately 640 spatial pixels or greater, sufficient for resolving kernel-level and sample-level heterogeneity.
• Pushbroom (line-scan) hyperspectral architecture suitable for laboratory scanning of malt samples.
• Support for dark and white reference calibration and generation of reflectance-corrected hyperspectral data cubes.
• Stable, research-grade illumination designed for SWIR reflectance measurements.
• Vendor-supported acquisition software with real-time image preview, spectral visualization tools, and export of standard hyperspectral data formats compatible with chemometric and machine-learning workflows.
• The system must be capable of integration into the laboratory’s existing upright benchtop hyperspectral imaging stand and established Spectron-based data acquisition and analysis workflow, minimizing the need for additional custom hardware, retraining, or maintenance overhead.
• System design should emphasize turnkey or near-turnkey integration to minimize custom opto-mechanical fabrication and reduce long-term support burden.
4.0 Date Needed
This unit will be needed 60 days ARO.
5.0 Warranty
Standard 12 month warranties are sufficient.
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