Attachment 1-Salient Characteristics.pdf

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USAFA Scanning Electron Microscope
Solicitation number
FA700025Q0058
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The document is a Salient Characteristics specification for a Scanning Electron Microscope (SEM) for the United States Air Force Academy. The required SEM must feature a Schottky-type Field Emission Gun with high and low vacuum resolution modes, an accelerating voltage range of 500V to 30kV, and a probe current range of 100 pA to 300 nA. The system requires a motorized 5-axis stage with extensive travel and tilt capabilities, and must include multiple detectors including Secondary Electron, Backscattered Electron, and an Energy Dispersive Spectroscopy detector with a Silicon Drift Detector.

The microscope must have advanced software capabilities, including automated beam alignment, focus adjustments, and image stitching functionality, with a digital image resolution of at least 4096x3072 pixels. Additional requirements include operation on standard laboratory utilities, on-site installation and training by manufacturer-trained personnel, a minimum 1-year warranty, operator manuals in print and digital formats, and perpetual software licenses. The system is designed to provide comprehensive imaging and elemental analysis capabilities for scientific and research applications within the Air Force Academy's laboratory environment.

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SALIENT CHARACTERISTICS:

At a minimum, the equipment must:

• Electron source must be Schottky-type Field Emission Gun

• Resolution in High Vacuum (HV) mode must be ≤ 1.2 nm at ≥20 kV acceleration voltage.

• Resolution in Low Vacuum (LV) mode must be ≤ 2.0 nm at 15-30 kV

• Accelerating voltage operational range: 500 V to ≥ 30 kV.

• Probe current range must include at least 100 pA to ≥300 nA, continuously adjustable.

• Magnification range:

o Minimum magnification ≤ 5x o Maximum magnification ≥ 1,000,000x

• Operational modes must include both High Vacuum (HV) and Low Vacuum (LV) modes.

• Chamber size and stage capabilities:

o Motorized, 5-axis stage with minimum travel range: X ≥ 80 mm, Y ≥ 60 mm, Z ≥

50 mm o Tilt capability: at least -10° to +80° continuously o Rotation capability: continuous 360 degrees

• Automated vacuum sequencing with oil-free vacuum pumps.

Detectors:

• Must include an Everhart-Thornley type Secondary Electron (SE) detector.

• Must include Backscattered Electron (BSE) detector capable of live compositional and topographical imaging.

• Energy Dispersive Spectroscopy (EDS) detector:

o Silicon Drift Detector (SDD) with ≥ 30 mm² active area o Energy resolution ≤130 eV (Mn-Kα)

• Includes all EDS software allowing elemental mapping and quantification.

Software and Computer:

• System must include software with automated optimization of beam alignment, focus, brightness, and contrast adjustments.

• Digital image resolution must support at least 4096x3072 pixels.

• Automated image stitching functionality for capturing large area imaging without user intervention.

Accessories and Operational Considerations:

• System must operate on standard laboratory utilities (e.g., 120V/60Hz or 230V options, clean compressed air, oil-free vacuum pumps).

Include on-site installation, commissioning, training, and orientation by manufacturer-trained personnel.

• Include a minimum 1-year warranty covering parts, labor, and standard repair services.

• Provide operator manuals and documentation in print and digital formats in English.

• Include basic user training course at vendor training facility or on-site within one year from installation.

• All software necessary for operating the SEM and EDS must be a perpetual license.

File details come from the government source that posted it. Updated .