Attachment 1-MALDI SOW.pdf
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- Solicitation number
- W911KF-24-Q-0025
About this file
This document contains a statement of work and related solicitation for the procurement of a Matrix-assisted Laser/Desorption Ionization Time-of-Flight Mass Spectrometer. The statement of work outlines the minimum required specifications for the mass spectrometer, including a mass range of 4-500,000u, high resolution and mass accuracy capabilities, and software for instrument control and data analysis. Installation, training, and a one year warranty are also required. The related solicitation was issued by the Department of the Army Materiel Command Contracting Command Detroit Arsenal for the delivery of one such mass spectrometer to Benet Laboratories at Watervliet Arsenal, with responses due under solicitation number W911KF-24-Q-0025 and a period of performance of 10 months from contract award.
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Statement of Work
For
Matrix-assisted Laser/Desorption Ionization Time-of-Flight Mass Spectrometer (MALDI-TOF-MS)
1.0 Background
To facilitate analysis of materials the Government requires a Matrix-assisted Laser/Desorption
Ionization Time-of-Flight Mass Spectrometer (MALDI-TOF-MS).
2.0 Purpose
2.1 This Statement of Work is to define the requirements and deliverables to be used in the selection and procurement of a MALDI-TOF-MS system to be delivered to DEVCOM AC
WSEC Benét Laboratories (Bldg. 115).
3.0 Requirements
3.1 The contractor shall provide MALDI-TOF-MS system with the following required minimum specifications:
3.1.1 The system shall be capable of performing high-resolution mass spectrometric analysis of a variety of materials and compounds, including organic compounds, polymers, and biomolecules.
3.1.1.1 The system shall have a resolving power ≥75,000 (FWHM) for the adrenocorticotropic hormone (ACTH) fragment 18-39 [M+H]+ ion at m/z
2,465.2 or the same minimum resolving power for a molecule of a similar m/z.
3.1.1.2 The system shall have a signal-to-noise ratio ≥50 for 500 amol of angiotensin II [M+H]+ ion at m/z 1046.5 or the same minimum signal-to-noise for a molecule of a similar m/z.
3.1.1.3 The system shall have a mass accuracy of 1 ppm or less for internal calibration and 10 ppm or less for external calibration.
3.1.1.4 The system shall be capable of measuring ions in the mass range between
4-30,000u in standard operating mode, and an extended range of 4-
500,000u for high m/z materials.
3.1.1.5 The system shall include a minimum of one reusable target plate for standard 384 spot analysis.
3.1.2 The system shall be capable of performing TOF/TOF measurements for high energy collision-induced dissociation fragments.
3.1.2.1 The system shall have the ability to select a monoisotopic precursor ion in the mass range of 100-4,000u, with a sensitivity of >2,500.
3.1.2.2 The system shall have a resolving power of >2,000 (FWHM) for
TOF/TOF analysis.
3.1.2.3 The system shall have a mass accuracy of ±0.1 Da for TOF/TOF analysis.
3.1.2.4 The system shall have options to switch between two different collision gases.
3.1.3 The instrument shall include high speed laser control, allowing for laser repetition rates between 10Hz and 1kHz.
3.1.4 The system shall support high-resolution mass spectrometry imaging analysis of samples.
3.1.4.1 The system shall be capable of performing 1D- and 2D- scanning automatic acquisition of mass spectral data.
3.1.4.2 The system shall have an imaging minimum XY position resolution of
10um or less.
3.1.4.3 The system shall support export of 2D imaging data to standard imzML format.
3.1.4.4 The system shall include a minimum of one reusable target plate for imaging analysis on standard glass microscope slides.
3.1.5 The system shall include any required vacuum pumps, chillers, or other ancillary equipment required for operation.
3.1.6 The system shall include a workstation with all required hardware, software, and licenses.
3.1.6.1 The workstation shall include all required components for operation of the system, including but not limited to computer, monitor, and peripherals.
3.1.6.2 Software shall be capable of full instrument control, data analysis, and data archiving. Software in combination with the workstation shall allow for complete stand-alone system operation. Software shall be the most recent release compatible with the system.
3.1.6.2.1 Instrument control software shall provide complete control over all data acquisition parameters, including automatic acquisition, data processing, mass calibration, instrument monitoring, plate recognition, data export functions, and instrument startup/shutdown.
3.1.6.2.2 Analysis software shall allow for mass spectra processing, including elemental composition determination with isotope matching, composition filtering and integrated search of any databases, isotope pattern modeling, mass series calculation, and pattern recognition tools, including principal component analysis.
3.1.6.2.3 Analysis software shall allow for analyzing MS imaging data, including creation and rendering ion images, imaging data binning, ROI analysis, and image arithmetic operation.
3.1.6.2.4 Analysis shall allow for Kendrick mass defect analysis of mass spectral data for enhanced polymer analysis, including calculation of weight average molar mass, number average molar mass, and polydispersity.
3.1.6.2.5 Analysis software shall allow for analysis of homopolymer and copolymer composition analysis and deconvolution, including calculation of Mn, Mw, Mz, PD, DPn, DPw, and
DPz.
3.1.6.2.6 Software shall include NIST20 package with MS Search, MS interpreter, AMDIS, Hybrid Search, and NIST library database for EI.
3.1.6.2.7 Software shall allow for report generation, word processing, and tabulated data viewing and manipulation.
3.1.6.3 Software licenses shall be provided for instrument control and any required analysis modules.
4.0 Installation
4.1 On-site installation shall be performed by the Contractor at AC DEVCOM-Benét
Laboratories located at Watervliet Arsenal, NY, 12189.
5.0 Training
5.1 The contractor shall provide system startup and familiarization for at least three Benét employee on all modes of operation and any required instrument maintenance.
6.0 Warranty
6.1 The Contractor shall offer a standard commercial warranty, including service warranty on labor, parts, and materials for all system and workstation components for a minimum period of one (1) year from the date of installation.
7.0 Written Deliverable
7.1 The Contractor shall provide written certification that the installed instrument meets the quoted specifications in accordance with DI-MISC-81356A.
8.0 General Requirements and Information
8.1 The period of performance of the contract shall commence upon award of the contract and shall be completed upon delivery of the system, which shall occur within 10 months from award of the contract.
8.2 The instrument shall be delivered to:
Cameron Longo
US Army DEVCOM AC WSEC Benét Laboratories
FCCD-ACW-BA
Building 115
Watervliet, NY 12189
Phone (518) 266-5244
Email: cameron.m.longo.civ@army.mil mailto:cameron.m.longo.civ@army.mil
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