Attachment 1 Brand Name or Equal Specifications.pdf
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- Attached to
- Total Reflection X-Ray Fluorescence Spectrometer - USDA ARS Parlier, CA Federal contract opportunity
- Solicitation number
- 12905B23Q0238
About this file
This document contains an attachment specifying brand name or equal requirements for a total reflection x-ray fluorescence spectrometer procurement, along with details of a related federal contract opportunity posted on the Federal Business Opportunities website.
The attachment provides specifications for an x-ray fluorescence spectrometer capable of elemental detection from sodium to americium with detection limits below 10 parts per billion for most elements. Required capabilities include analysis of samples in various formats up to 90 discs or 50 wafers. The Bruker S4 TStar TXRF spectrometer is given as an example meeting requirements. The federal contract opportunity is posted by the USDA Agricultural Research Service seeking this type of spectrometer to be delivered and installed at their facility in Parlier, California, with associated training.
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Other files for this federal contract opportunity
| File | Type | Posted |
|---|---|---|
| Combined Synopsis Solicitation 12905B23Q0238 RFQ.pdf |
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Text version
Brand Name or Equal Bruker S4 TStar TXRF
SJVASC-CPQ needs an x-ray fluorescence spectrometer, for elemental detection and quantitation. The XRF needs to provide accurate and precise measurements of elements from sodium to americium with low detection limits (≤ 10 ppb for most elements). The Bruker S4 TStar total reflection x-ray fluorescence spectrometer is a compact bench top instrument, able to make sub-ppb level measurements for many elements (LOD < 1 pg for Ni) and is simple to operate. We have conducted market research and have concluded the Bruker S4 TStar is an example XRF that will meet our needs.
SPECIFICATIONS: Total Reflection X-Ray Fluorescence Spectrometer
• Element range: Na - Am.
• Detection Limit: < 1 pg for Ni
• Sample capacity: 90, 30 mm discs, or 50 2” wafers, or 30 microscopy slides
• Primary excitation source: 17.5 keV, 50 x 50 µm hot spot, micro focus x-ray tube with
Mo target.
• Secondary excitation source: 35 keV, 50 x 50 µm hot spot, micro focus x-ray tube with
W target.
• X-ray detector: Si drift detector, 60 mm2 active area, energy resolution 145 eV for Mn-K
@ 100 kcps, max. count rate > 100 kcps, dead time < 10 % at 40 kcps,
• Thermo-electrically cooled X-Ray source, no consumption of liquid nitrogen
• Nitrogen purge system
Additional requirements:
• FOB destination shipping
• Installation and training
• Advance user training and sample preparation (2 days on-site)
File details come from the government source that posted it. Updated .