Question_and_Answer__2_2018-N-67822.docx
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- Field Emissions Scanning Electron Microscope
- Solicitation number
- 2018-N-67822
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Question and Answer #2 Solicitation Number: 2018-N-67822 (Field Emissions Scanning Electron Microscope):
1. Specification 4:
The specification seems quite small for internal chamber dimensions. Could you please clarify if the 80x80x60mm specifications refer to stage movements or sample size?
This refers to the range of stage movements (X: 80mm, Y:80mm, Z:60mm).
2. Specification 9:
Do you have any technical specifications for the Serial Block Face imaging system (e.g. minimum slice thickness)?
The minimum section thickness should be 15-30 nm.
3. Research Item 5:
Could you clarify what you mean by tomography and 3DSEM applications? Do these items refer directly to the serial block-face imaging system/software? Or, are you looking to take a tilt-series of images?
This refers to the 3D reconstruction software for the serial block-face imaging system.
4. Service Plan Options:
Do you require service plan pricing for the optional EDS system and serial block-face imaging system?
No, please only include quotes for optional items (EDS system, serial block-face imaging system, software, etc.).
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