1333ND25QNB640343 MIN SPECS-HPWavemeter.pdf

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High Precision Wavelength Meter Federal contract opportunity
Solicitation number
1333ND25QNB640343
Issued by
Department of Commerce National Institute of Standards and Technology

About this file

This Request for Quote (RFQ) is issued by the National Institute of Standards and Technology (NIST), specifically the Material Measurement Laboratory's Microscopy and Microanalysis Research Group. The RFQ seeks a high-precision wavelength meter for specialized scientific research involving Raman spectroscopy and Brillouin Light Scattering measurements. The required instrument must meet 13 specific minimum specifications, including an accuracy of ≤ 750 MHz, wavelength range of 400-800 nm, measurement speed of ≥ 4 Hz, and features such as an internal calibration source, automatic temperature corrections, and USB interface for computer communication.

The contract line item (CLIN) 0001 calls for a single benchtop wavelength meter instrument capable of measuring continuous-wave lasers with precise wavelength tracking. The equipment is critical for addressing long-term laser line drift in scientific research, where spectral features require exact knowledge of excitation wavelength and stability over time. The wavelength meter will support molecular identification, strain measurements, and quantifying local variations in mechanical properties across various spectroscopic techniques.

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RFQ NO. 1333ND25QNB640343 MINIMUM SPECIFICATIONS

I. BACKGROUND INFORMATION

The National Institute of Standards and Technology, Material Measurement Laboratory, Materials Measurement Science Division, Microscopy and Microanalysis Research Group (MMRG) is involved in numerous projects which require the precise and accurate measurement of laser wavelength. This includes the use of Raman spectroscopy for molecule identification and strain measurements, in addition to Low-Frequency Raman (LFR) spectroscopy and Brillouin Light Scattering (BLS) spectroscopy measurements to quantify local variations in mechanical properties. In particular for LFR/BLS measurements, the spectral features of interest have relatively small frequency shifts relative to the laser line, which necessitates exact knowledge of the excitation wavelength as well as its stability over time. Factors such as an aging laser source or due to environmental influences like temperature lead to a spectral drift of the laser line over time, which requires realignment of optical components to guarantee optimal performance. Thus, a high precision Wavelength Meter is a crucial part of equipment maintenance to effectively address long-term laser line drift.

II. MINIMUM SPECIFICATIONS

Contract Line Item Number (CLIN) 0001:

The Contractor shall provide one (1) High Precision Wavelength Meter that meets the following minimum specifications:

1. Accuracy: ≤ 750 MHz

2. Resolution: ≤ 20 MHz

3. Wavelength range: 400 – 800 nm (or wider)

4. Measurement speed: ≥ 4 Hz

5. Shall be a benchtop wavelength meter instrument.

6. Shall be able to measure continuous-wave (CW) lasers.

7. Shall have an internal calibration source.

8. Shall have automatic temperature corrections.

9. Shall have thermally insulated housing.

10. Shall have < 15 min warm-up time under constant ambient conditions.

11. Shall allow for measurement for a wide range of laser line widths.

12. Shall have a USB interface for computer communication.

13. Shall include software for monitoring and control of the wavemeter.

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